IP Library › Granted Patent US 9,331,125
Granted Patent B2
US 9,331,125 · App. 14/555,889 · Granted May 3, 2016

Solid-state imaging device using plasmon resonator filter

Inventors: Takashi Miyazaki (Kawasaki, JP); Ikuo Fujiwara (Yokohama, JP); Hideyuki Funaki (Shinagawa, JP)
Assignee: Kabushiki Kaisha Toshiba
H01L27/307H01L27/14621H01L27/14629H01L27/14632H01L27/14647H01L31/03762
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Quick Facts
Patent No.
US 9,331,125
App. No.
14/555,889
Granted
May 3, 2016
Kind
B2
Abstract

According to one embodiment, a solid-state imaging device includes: a first inorganic photoelectric converter; a semiconductor substrate that includes a light-receiving face to which light is to be incident and a circuit-formed surface on which a circuit including a readout circuit is formed, the light-receiving face facing the first inorganic photoelectric converter, the semiconductor substrate including a second inorganic photoelectric converter thereinside; and a first part including a microstructure arranged between the first inorganic photoelectric converter and the second inorganic photoelectric converter.

Claims (20)

1. A solid-state imaging device comprising:

a first inorganic photoelectric converter configured to include a blue-light absorbing layer that absorbs blue light, wherein an absorption factor of the blue-light absorbing layer is represented by α B [nm −1 ] and a thickness of the blue-light absorbing layer is represented by d B [nm], a relationship represented by 0.21<α B ·d B ˜<2.3 is satisfied;

a semiconductor substrate that includes: a light-receiving face to which light is to be incident, the light having a first wavelength component is blue light, and the light having a second wavelength component is red light; and a circuit-formed surface on which a circuit comprising a readout circuit is formed, the light-receiving face facing the first inorganic photoelectric converter, the semiconductor substrate including a second inorganic photoelectric converter thereinside, the second inorganic photoelectric converter being configured to include a red-light absorbing layer that absorbs the red light, wherein an absorption factor of the red-light absorbing layer is represented by α R [nm −1 ] and a thickness of the red-light absorbing layer is represented by d R [nm], a relationship represented by 1.4<α R ·d R <2.6 is satisfied;

a first part comprising a microstructure arranged between the first inorganic photoelectric converter and the second inorganic photoelectric converter, the microstructure being configured to include a plurality of dots which are arranged in an array configuration, each dot having a symmetric shape on a plane surface in a plan view, each dot having a width in a range of 20 to 300 nm and having a thickness in a range of 10 to 300 nm in the microstructure, the dots adjacent to each other being distanced at a distance in a range of 20 to 250 nm; and

a silicon oxide layer provided between the blue-light absorbing layer and the microstructure, wherein a refractive index of the silicon oxide layer is represented by n and a thickness of the silicon oxide layer is represented by d [nm], a relationship represented by 100<n·d<125 is satisfied.

2. The solid-state imaging device according to claim 1 , wherein

of the light that is incident to the light-receiving face side, light that has a first wavelength component and is to be absorbed by the first inorganic photoelectric converter is reflected by the microstructure, light that has a second wavelength component and is to be absorbed by the second inorganic photoelectric converter passes through the microstructure.

3. The solid-state imaging device according to claim 1 , wherein

the blue-light absorbing layer contains amorphous silicon.

4. The solid-state imaging device according to claim 1 , further comprising:

an organic photoelectric converter formed on a surface of the semiconductor substrate which is close to the light-receiving face, the organic photoelectric converter comprising an organic photoelectric conversion layer that absorbs light having a third wavelength component.

5. The solid-state imaging device according to claim 4 , wherein

the light having the third wavelength component is green light,

the organic photoelectric converter is provided on a position that overlaps a position on which the first inorganic photoelectric converter and the second inorganic photoelectric converter are formed.

6. The solid-state imaging device according to claim 1 , further comprising:

a second part that is provided adjacent to the first part and includes the second inorganic photoelectric converter;

a first color filter that is provided to face the first inorganic photoelectric converter of the first part and absorbs light having a first wavelength component and light having a second wavelength component; and

a second color filter that is provided to face the second inorganic photoelectric converter of the second part and absorbs light having a third wavelength component.

7. The solid-state imaging device according to claim 1 , wherein

each of the first inorganic photoelectric converter and the second inorganic photoelectric converter is independently connected to the readout circuit.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 28, 2014
From: MIYAZAKI, TAKASHI; FUJIWARA, IKUO; FUNAKI, HIDEYUKI
To: KABUSHIKI KAISHA TOSHIBA
Reel/Frame 034277/0016 →
Priority Claims (1)
JP 2014-056222 · Mar 19, 2014 · national
Continuity (1)
Related Publication 20150270314A1 · Sep 24, 2015