IP Library › Granted Patent US 9,337,651
Granted Patent B2
US 9,337,651 · App. 14/259,511 · Granted May 10, 2016

Electrostatic discharge protection circuit

Inventor: Yeong-Sheng Lee (Fremont, CA)
Assignee: VIA ALLIANCE SEMICONDUCTOR CO., LTD.
H02H9/04H01L27/0285H02H9/046
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Quick Facts
Patent No.
US 9,337,651
App. No.
14/259,511
Granted
May 10, 2016
Kind
B2
Abstract

An electrostatic discharge (ESD) protection circuit includes a first n-type transistor, a discharge acceleration circuit and a discharge time circuit. The first n-type transistor has a first terminal coupled to a supply voltage, a second terminal coupled to a reference voltage, and a gate, wherein the first n-type transistor couples the supply voltage to the reference voltage during an ESD event at an I/O pad. The discharge acceleration circuit is coupled to the gate of the first n-type transistor to the I/O pad during the ESD event and coupled to the gate of the first n-type transistor to the reference voltage when there is no ESD event. The discharge time circuit, coupled to the discharge acceleration circuit and the supply voltage, controls a discharge time of the first n-type transistor of coupling the supply voltage to the reference voltage during the ESD event at the I/O pad.

Claims (23)

1. An electrostatic discharge (ESD) protection circuit, comprising:

a first n-type transistor, having a first terminal coupled to a supply voltage, a second terminal coupled to a reference voltage, and a gate, wherein the first n-type transistor couples the supply voltage to the reference voltage during an ESD event at an I/O pad;

a discharge acceleration circuit, coupling the gate of the first n-type transistor to the I/O pad during the ESD event and coupling the gate of the first n-type transistor to the reference voltage when there is no ESD event; and

a discharge time circuit, coupled to the discharge acceleration circuit and the supply voltage, controlling a discharge time of the first n-type transistor of coupling the supply voltage to the reference voltage during the ESD event at the I/O pad,

wherein the supply voltage is coupled to the I/O pad,

wherein a voltage potential of the I/O pad is higher than the supply voltage or lower than the reference voltage during the ESD event,

wherein the discharge acceleration circuit comprises:

a first p-type transistor, having a first terminal coupled to the I/O pad, a second terminal coupled to the gate of the first n-type transistor, and a gate directly connected to the supply voltage; and

a second n-type transistor, having a first terminal coupled to the discharge time circuit, a second terminal coupled to the gate of the first n-type transistor, and a gate directly connected to the supply voltage.

2. The electrostatic discharge (ESD) protection circuit of claim 1 , further comprising a first diode having an anode coupled to the I/O pad and a cathode coupled to the supply voltage.

3. The electrostatic discharge (ESD) protection circuit of claim 2 , further comprising a third p-type transistor having a first terminal coupled to the supply voltage, a second terminal coupled to the I/O pad, and a gate coupled to the supply voltage, wherein a voltage drop between the first and second terminals of the third p-type transistor is smaller than a voltage drop between the anode and the cathode of the first diode during the ESD event.

4. The electrostatic discharge (ESD) protection circuit of claim 1 , further comprising a fourth n-type transistor having a first terminal coupled to the I/O pad, a second terminal coupled to an internal circuit, and a gate coupled to the supply voltage, wherein a voltage at the second terminal of the fourth n-type transistor coupled to the internal circuit does not exceed the supply voltage during the ESD event.

5. The electrostatic discharge (ESD) protection circuit of claim 1 , wherein the discharge time circuit comprises:

a resistor, having a first terminal coupled to the supply voltage and a second terminal;

a capacitor, having a first terminal coupled to the second terminal of the resistor and a second terminal coupled to the reference voltage; and

an inverter, having an input terminal coupled to the second terminal of the resistor and an output terminal coupled to the discharge acceleration circuit.

6. The electrostatic discharge (ESD) protection circuit of claim 5 , wherein the inverter comprises:

a second p-type transistor, having a first terminal acting as the output terminal of the inverter, a second terminal coupled to the supply voltage, and a gate acting as the input terminal of the inverter; and

a third n-type transistor having a first terminal coupled to the first terminal of the second p-type transistor, a second terminal coupled to the reference voltage, and a gate coupled to the gate of the second p-type transistor.

7. The electrostatic discharge (ESD) protection circuit of claim 1 , wherein the discharge time circuit comprises:

a capacitor, having a first terminal coupled to the supply voltage and a second terminal coupled to the discharge acceleration circuit; and

a resistor, having a first terminal coupled to the second terminal of the capacitor and a second terminal coupled to the reference voltage.

8. The electrostatic discharge (ESD) protection circuit of claim 1 , further comprising a second diode having an anode coupled to the reference voltage and a cathode coupled to the I/O pad.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2014
From: LEE, YEONG-SHENG
To: VIA ALLIANCE SEMICONDUCTOR CO., LTD.
Reel/Frame 032743/0244 →
Continuity (1)
Related Publication 20150311700A1 · Oct 29, 2015