Semiconductor integrated circuit and power-supply voltage adaptive control system
A semiconductor integrated circuit has N input terminals; N output terminals; a plurality of flip-flops (FFs) including N FFs and R redundant FFs; a selector section configured to select N selected FFs from the plurality of FFs depending on reconfiguration information and to switch data flow such that data input to the N input terminals are respectively output to the N output terminals by the N selected FFs; and an error detection section. In a test mode, the N FFs form a scan chain and a scan data is input to the scan chain. The error detection section detects an error FF included in the N FFs based on scan input/output data respectively input/output to/from the N FFs in the test mode and further generates the reconfiguration information such that the detected error FF is excluded from the N selected FFs.
1. A semiconductor integrated circuit comprising:
a plurality of input terminals;
a plurality of output terminals;
a plurality of flip-flop circuits;
a memory circuit configured to store configuration information to configure connection relationship between said input terminals and said flip-flop circuits and connection relationship between said output terminals and said flip-flop circuits;
a first selector circuit configured to switch connection between said input terminals and said flip-flop circuits based on said configuration information from said memory circuit;
a second selector circuit configured to switch connection between said output terminals and said flip-flop circuits based on said configuration information from said memory circuit;
a third selector circuit configured to select an output of said flip-flop; and
a counter circuit configured to receive said selected output from said third selector, count a number of toggle times of said output of said flip-flop circuits, and output the count value to a control device.
2. The semiconductor integrated circuit according to claim 1 ,
wherein said memory circuit is configured to receive said configuration information based on said count value from said control device.
3. The semiconductor integrated circuit according to claim 1 ,
wherein said memory circuit is a latch circuit.