Method of forming ceramic wire, system of forming the same, and superconductor wire using the same
Provided is a method of forming a ceramic wire. In the method, a ceramic precursor film is deposited on a wire substrate. Then, the wire substrate on which the ceramic precursor film is deposited is treated by heating. For treating the wire substrate by heating, a temperature of the wire substrate and/or an oxygen partial pressure of the wire substrate are controlled such that the ceramic precursor film is in a liquid state and an epitaxy ceramic film is formed from the liquid ceramic precursor film on the wire substrate.
1. A method of forming a ceramic wire, comprising:
depositing a ceramic precursor film on a wire substrate; and
heat-treating the wire substrate on which the ceramic precursor film is deposited, comprising:
increasing a temperature of the wire substrate and subsequently increasing an oxygen partial pressure of a processing chamber in which the wire substrate is provided, such that the ceramic precursor film is in a liquid state; and
then decreasing the temperature of the wire substrate to form an epitaxy ceramic film from the liquid ceramic precursor film on the wire substrate,
wherein the processing chamber comprises a first container, a second container and a third container, which are adjacent in the order named, the heat-treating of the wire substrate is sequentially performed in the first container, the second container and the third container which continuously pass the wire substrate,
wherein a temperature in the second container is higher than a temperature in the first container and a temperature in the third container,
wherein an oxygen partial pressure in the first container is lower than an oxygen partial pressure in the third container, and an oxygen partial pressure in the second container is higher than the oxygen partial pressure in the first container and lower than the oxygen partial pressure in the third container, and
wherein the oxygen partial pressure in the second container increases with distance from a first portion adjacent to the first container to a second portion of the second container adjacent to the third container.
2. The method of claim 1 , wherein the depositing of the ceramic precursor film and the heat-treating of the wire substrate are respectively performed in spaces which are separated from each other.
3. The method of claim 1 , wherein the temperature in the first container and the temperature in the third container decrease with distance from the second container.
4. The method of claim 1 , wherein the temperature in the second container is greater than 800° C. and the oxygen partial pressure in the second container varies in a range of about 5×10 2 Torr to about 3×10 −1 Torr.
5. The method of claim 1 , wherein the heat-treating of the wire substrate is performed in the processing chamber which continuously passes the wire substrate, and a temperature in the processing chamber decreases with distance from a center portion of the processing chamber.
6. The method of claim 1 , wherein the depositing of the ceramic precursor film comprises providing one of rare earth (RE) elements, barium (Ba) and copper (Cu).
7. The method of claim 1 , wherein the ceramic precursor film is formed by a co-evaporation method or a metal organic deposition method.