Data independent periodic calibration using per-pin VREF correction technique for single-ended signaling

1. A method comprising:

receiving an external reference voltage (Vref) on a first pin of a device comprising a single-ended receiver coupled to receive a data signal from a single-ended transmitter via a channel, wherein the single-ended receiver comprises a first voltage generation circuit to set a first internal Vref;

calibrating a model voltage generation circuit using the external Vref during an initial calibration of the single-ended receiver, the model voltage generation circuit to set a model reference voltage;

tracking an offset value for voltage-temperature (VT) drift in the model reference voltage using the model voltage generation circuit; and

applying the offset value to the first voltage generation circuit to calibrate the first internal Vref during a periodic calibration of the single-ended receiver.

2. The method of claim 1 , further comprising, during the periodic calibration of the single-ended receiver, applying the offset value to a second voltage generation circuit to calibrate a second internal Vref.

3. The method of claim 1 , wherein the model voltage generation circuit is a model digital-to-analog converter (DAC) and the first voltage generation circuit is a first internal DAC, and wherein the tracking the offset and applying the offset comprises:

determining a first difference between a first error code of the model DAC determined during initial calibration and a second error code of the model DAC determined during the periodic calibration; and

applying the first difference to the first internal DAC to calibrate the first internal Vref during the periodic calibration.

4. The method of claim 3 , wherein the tracking the offset and applying the offset further comprises:

determining a second difference between the second error code determined during the periodic calibration and a third error code of the model DAC determined during a subsequent periodic calibration; and

applying the second difference to the first internal DAC to calibrate the first internal Vref during the subsequent periodic calibration.

5. A method comprising:

performing an initial calibration of a reference voltage (Vref) generated by a first voltage generation circuit in a single-ended receiver, wherein the performing comprises calibrating the Vref using an external Vref from an external Vref pin and data received from a single-ended transmitter on a channel;

performing a periodic calibration of the Vref without using additional data on the channel, wherein the performing the periodic calibration comprises:

calibrating a model voltage generation circuit using the external Vref; and

applying an offset of the model voltage generation circuit to the single-ended receiver to calibrate the Vref generated by the first voltage generation circuit.

6. The method of claim 5 , wherein the model voltage generation circuit is a model digital-to-analog converter (DAC) and the first voltage generation circuit is a first internal DAC, and wherein performing the periodic calibration comprises:

determining a first difference between a first error code of the model DAC determined during the performing the initial calibration and a second error code of the model DAC determined during the performing the periodic calibration; and

applying the first difference to the first internal DAC to calibrate the Vref during the periodic calibration.

7. The method of claim 5 , wherein the single-ended receiver is a dynamic random access memory (DRAM) device and the single-ended transmitter is a memory controller.

8. The method of claim 5 , wherein the single-ended receiver is a memory controller and the single-ended transmitter is a dynamic random access memory (DRAM) device.

9. A single-ended receiver comprising:

a first voltage generation circuit to generate a first internal reference voltage (Vref);

a first internal voltage generation circuit to set the first internal Vref;

an amplifier to receive the first internal reference voltage and a signal on a channel from a single-ended transmitter; and

a reference voltage calibration controller comprising a model voltage generation circuit configurable to set a model reference voltage, wherein the reference voltage calibration controller is configurable to calibrate the model voltage generation circuit using an external Vref during an initial calibration of the single-ended receiver, track an offset value for voltage-temperature (VT) drift in the model reference voltage using the model voltage generation circuit, and apply the offset value to the first internal voltage generation circuit to calibrate the first internal Vref during a periodic calibration of the single-ended receiver.

10. The single-ended receiver of claim 9 , further comprising:

a filter coupled to a pin to receive the signal received from a single-ended transmitter via a channel;

a multiplexer coupled to the filter and to the pin; and

logic circuitry coupled to an output of the amplifier, the logic circuitry is configurable to calibrate the single-ended receiver in the initial calibration using the external Vref and a signal pattern received on the pin via the channel and to calibrate the single-ended receiver in the periodic calibration using the external Vref and the model voltage generation circuit, and wherein the signal pattern is not received on the pin during the periodic calibration.

11. The single-ended receiver of claim 9 , wherein the single-ended receiver resides in a memory device.

12. The single-ended receiver of claim 9 , wherein the single-ended receiver resides in a dynamic random access memory (DRAM) device.

13. The single-ended receiver of claim 9 , wherein the single-ended receiver resides in a memory controller.

14. The single-ended receiver of claim 9 , wherein the reference voltage calibration controller is configurable to apply the offset value to a second internal voltage generation circuit of a second single-ended receiver to calibrate a second internal Vref.

15. The single-ended receiver of claim 9 , wherein the first voltage generation circuit is calibrated during the initial calibration using a clock pattern on a second pin via the channel.

16. The single-ended receiver of claim 15 , wherein the first voltage generation circuit is calibrated by:

receiving the clock pattern on the second pin coupled to the channel;

filtering the clock pattern received on the second pin; and

comparing the filtered clock pattern to the first internal Vref to set the first internal Vref.

17. The single-ended receiver of claim 9 , wherein the reference voltage calibration controller is configurable to apply the offset value to a second voltage generation circuit to calibrate a second internal Vref.

18. The single-ended receiver of claim 17 , wherein the reference voltage calibration controller is configurable to apply a first difference to a second internal digital-to-analog converter (DAC) of the second voltage generation circuit to calibrate the second internal Vref during the periodic calibration.

19. The single-ended receiver of claim 17 , wherein the reference voltage calibration controller is configurable to track the offset and apply the offset by:

determining a second difference between a second error code of a model digital-to-analog converter (DAC) determined during the periodic calibration and a third error code of the model DAC determined during a subsequent periodic calibration; and

applying the second difference to a second internal DAC of the second voltage generation circuit to calibrate the second internal Vref during the subsequent periodic calibration.

20. The single-ended receiver of claim 9 , wherein the single-ended receiver is coupled to a pin to receive signals on the channel from another device comprising the single-ended transmitter.