Successive approximation register analog-to-digital converter with single-ended measurement

1. A circuit comprising:

a comparator including a first input, a second input, and an output; and

a successive approximation register (SAR) circuit coupled to the output of the comparator, the first input, and the second input, the SAR circuit configured to program one or more capacitors to selectively apply a bias signal to the first input and to provide a single-ended measurement of a voltage at the second input.

2. The circuit of claim 1 , further comprising a sample circuit including:

a first output coupled to the first input; and

a second output coupled to the second input.

3. The circuit of claim 2 , wherein the sample circuit comprises:

a first capacitor;

a first switch coupled between the first capacitor and the first output;

a second capacitor; and

a second switch coupled between the second capacitor and the second output.

4. The circuit of claim 1 , wherein:

the first input comprises a positive input; and

the second input comprises a negative input.

5. The circuit of claim 4 , wherein the SAR circuit programs the one or more capacitors to selectively bias the first input in a negative input single-ended measurement mode.

6. The circuit of claim 4 , wherein the SAR circuit is configured to program the one or more capacitors to selectively bias the second input to provide a single-ended measurement of a voltage at the first input.

7. The circuit of claim 1 , wherein the SAR circuit is configured to program one or more capacitors to selectively bias the first input and the second input to provide a differential measurement of voltages at the first input and the second input.

8. A method comprising:

in a first mode:

programming a first plurality of capacitors of a feedback digital-to-analog converter (DAC) of a successive approximation register (SAR) coupled to a first input of a comparator to apply a bias signal to the first input;

receiving a voltage at a second input of the comparator; and

comparing the voltage at the second input to the bias signal at the first input using the comparator to produce a digital output signal corresponding to a single-ended measurement of the voltage.

9. The method of claim 8 , wherein the first mode comprises a negative input single-ended measurement mode.

10. The method of claim 8 , further comprising:

in a second mode:

programming a second plurality of capacitors of the feedback DAC coupled to the second input of the comparator;

receiving a voltage at the first input of the comparator; and

comparing the voltage at the first input to a signal at the second input using the comparator to produce a digital output signal corresponding to a single-ended measurement of the voltage.

11. The method of claim 10 , wherein the second mode comprises a positive input single-ended measurement mode.

12. The method of claim 8 , further comprising:

in a third mode:

programming the first plurality of capacitors of the feedback DAC coupled to the first input of the comparator;

programming a second plurality of capacitors of the feedback DAC coupled to the second input of the comparator;

receiving a first voltage at the first input and a second voltage at the second input of the comparator; and

comparing the first voltage to the second voltage using the comparator to produce a digital output signal corresponding to a differential measurement.

13. The method of claim 8 , wherein programming the first plurality of capacitors extends a measurement range of the comparator to encompass a measurement range that is approximately equal to a measurement range of a differential measurement.

14. A circuit comprising:

a comparator including a first input, a second input, and an output;

a feedback digital-to-analog converter (DAC) including a first plurality of capacitors coupled to the first input of the comparator and including a second plurality of capacitors coupled to the second input of the comparator the second input coupled to the first input; and

a successive approximation register (SAR) circuit coupled to the output of the comparator, the SAR circuit configured to program one or more capacitors of the feedback digital-to-analog converter (DAC) to apply a bias signal to a selected one of the first input and the second input to selectively provide a single-ended measurement mode by measuring an input signal at the other of the first input and the second input.

15. The circuit of claim 14 , wherein, in a negative input single-ended measurement mode, the SAR circuit is configured to program one or more capacitors of the feedback DAC to bias the first input, and the comparator provides a digital signal corresponding to a measurement of a voltage on the second input.

16. The circuit of claim 14 , wherein, in a positive input single-ended measurement mode, the SAR circuit is configured to program one or more capacitors of the feedback DAC to bias the second input, and the comparator provides a digital signal corresponding to a measurement of a voltage on the first input.

17. The circuit of claim 14 , wherein, in a differential measurement mode, the SAR circuit is configured to program one or more capacitors of the feedback DAC to bias the first input and the second input.

18. The circuit of claim 14 , in the single-ended measurement mode, the SAR circuit programs the one or more capacitors to extend a measurement range of the comparator to encompass a measurement range that is approximately equal to a measurement range of a differential measurement.

19. The circuit of claim 14 , wherein the comparator produces a digital signal on the output that corresponds to a measurement of a voltage on at least one of the first input and the second input.

20. The circuit of claim 14 , further comprising a sample circuit including:

a first output coupled to the first input; and

a second output coupled to the second input.