IP Library Granted Patent US 9,401,231
Granted Patent B2
US 9,401,231 · App. 13/249,864 · Granted Jul 26, 2016

Method for producing highly conformal transparent conducting oxides

Inventors: Jeffrey W. Elam (Elmhurst, IL); Anil U. Mane (Downers Grove, IL)
Assignee: UCHICAGO ARGONNE, LLC
H01B1/06C23C16/407C23C16/45525C23C16/45553
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Quick Facts
Patent No.
US 9,401,231
App. No.
13/249,864
Granted
Jul 26, 2016
Kind
B2
Abstract

A method for forming a transparent conducting oxide product layer. The method includes use of precursors, such as tetrakis-(dimethylamino) tin and trimethyl indium, and selected use of dopants, such as SnO and ZnO for obtaining desired optical, electrical and structural properties for a highly conformal layer coating on a substrate. Ozone was also input as a reactive gas which enabled rapid production of the desired product layer.

Claims (14)

1. A method of forming a transparent conducting oxide layer having a desired set of properties, comprising the steps of:

providing an atomic layer deposition system;

providing a substrate disposed in the atomic layer deposition system;

inputting a precursor consisting essentially of trimethyl indium to the atomic layer deposition system;

inputting ozone to the atomic layer deposition system;

depositing In 2 O 3 ;

depositing a dopant using a precursor selected from the group consisting of tetrakis-(dimethylamino) tin and diethyl zinc; and

forming a deposited layer on the substrate comprising In 2 O 3 and the dopant, wherein the deposited layer has the desired set of properties;

where temperature is controlled during deposition in a temperature range between 100° C. to 150° C. and the deposited layer is formed at a growth rate greater than 0.4 Å/cycle.

2. The method as defined in claim 1 wherein the precursor and the ozone are input in a pulsed manner.

3. The method as defined in claim 2 further including pulses of a gas in a purging step.

4. The method as defined in claim 1 wherein the dopant is selected from the group of SnO and ZnO.

5. The method as defined in claim 4 wherein depositing the dopant comprises inputting tetrakis-(dimethylamino) tin and inputting ozone to the atomic layer deposition system for depositing the dopant.

6. The method as defined in claim 1 wherein the deposited layer has a structure selected from the group of amorphous, crystalline and mixtures thereof.

Assignments (2)
CONFIRMATORY LICENSE Recorded Mar 15, 2012
From: UCHICAGO ARGONNE, LLC
To: ENERGY, UNITED STATE DEPARTMENT OF
Reel/Frame 027882/0753 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 12, 2012
From: ELAM, JEFFREY W.; MANE, ANIL U.
To: UCHICAGO ARGONNE, LLC
Reel/Frame 027524/0964 →
Continuity (1)
Related Publication 20130082219A1 · Apr 4, 2013