Method and apparatus for quantitative measurement of surface accuracy of an area
A method for quantitative measurement of surface accuracy of an area is provided. This comprises directing a monochromatic flat light wave towards a predefined surface area, recording an image of the reflected light with a camera and lens system focused on said surface area, and deducing surface accuracy parameters from the recorded image. The method is characterized in that said surface accuracy parameters are determined by obtaining a Fourier transform of the recorded image. Then, fitting predetermined Fourier components to a Fourier spectrum of said Fourier transform, wherein said Fourier components are determined along the major and across the minor elongation axes of the Fourier transform as at least a large Gaussian component, and a peak of the spectrum. Followed by, determining surface accuracy parameters of said surface area from said Fourier components.
1. A method for quantitative measurement of surface accuracy parameters of an area, comprising:
directing a monochromatic flat light wave towards a predefined surface area;
recording an image of the reflected light with a camera and lens system focused on said surface area;
deducing surface accuracy parameters from the recorded image;
wherein said surface accuracy parameters are determined as follows:
obtaining a two-dimensional spatial spectrum of the surface area geometry by a Fourier transform of the recorded image;
fitting predetermined Fourier components in a major axis cut along the major elongation axis of an elliptical Gaussian noise distribution in the two-dimensional spatial spectrum;
fitting predetermined Fourier components in a minor axis cut across the minor elongation axis of the elliptical Gaussian noise distribution in the two-dimensional spatial spectrum;
determining surface accuracy parameters of said surface area from said Fourier components.
2. The method of claim 1 , wherein said monochromatic flat light wave is directed perpendicularly or at an angle less than 6 degrees towards said surface area.
3. The method of claim 1 , wherein said camera and lens system is arranged perpendicularly or at an angle less than 6 degrees towards said surface area.
4. The method of claim 1 , wherein the difference in angle between said reflected light and the optical axis of said camera and lens system is less than 6 degrees.
5. The method of claim 1 , wherein the focus pixel area is less than 100 wavelengths in diameter.
6. The method of claim 1 , wherein the surface observing imaging area is larger than 4000 wavelengths in diameter.
7. The method of claim 1 , wherein the light is at optical or infrared wavelengths of 300-1500 nanometers.
8. An apparatus for quantitative measurement of surface accuracy of an area, said apparatus comprising:
a source of light for producing a beam of light directed along an optical path;
a beam expander arranged along the optical path downstream from the light source;
a positioning means for positioning a material in the optical path downstream from the beam expander;
an imaging detector, arranged along the optical path downstream from the material, for detecting the reflected beam;
wherein said apparatus further comprise a processor configured to determine surface accuracy parameters as follows:
obtain a two-dimensional spatial spectrum of the surface area geometry by a Fourier transform of the recorded image;
fit predetermined Fourier components in a major axis cut along the major elongation axis of an elliptical Gaussian noise distribution in the two-dimensional spatial spectrum
fit predetermined Fourier components in a minor axis cut across the minor elongation axis of the elliptical Gaussian noise distribution in the two-dimensional spatial spectrum; and
determine surface accuracy parameters of said surface area from said Fourier components.