Method for permanent connection of two metal surfaces

1. A process for the production of a permanent, electrically conductive connection between a first metal surface of a first substrate and a second metal surface of a second substrate wherein said process does not include a soldering process, said process comprising the following steps:

positioning the first substrate and the second substrate such that the first metal surface of the first substrate and the second metal surface of the second substrate are spaced apart from each other,

conditioning at least one of the first metal surface and the second metal surface by producing at least one layer that is near at least one of the first metal surface and the second metal surface with voids formed therein, said voids produced by implanting gas ions into at least one of the first metal surface and the second metal surface,

after at least one of said first metal surface and said second metal surface are conditioned, orienting said first substrate and said second substrate such that said first metal surface and said second metal surface are oriented toward one another, and

connecting the first metal surface and the second metal surface together through substitution diffusion between similar metal ions and/or metal atoms of the two metal surfaces, said substitution diffusion being enabled by said producing of said voids,

wherein, during the conditioning, orienting and connecting steps, a process temperature is less than 300° C.

2. The process according to claim 1 , wherein the first metal surface and/or the second metal surface has (have) a layer thickness S<5 nm.

3. The process according to claims 1 or 2 , wherein hydrogen is implanted to avoid oxidation.

4. The process according to claims 1 or 2 , wherein the conditioning step comprises the optimization of the surface roughness of at least one of the metal surfaces.

5. The process according to claim 3 , wherein the conditioning step comprises the optimization of the surface roughness of at least one of the metal surfaces.

6. A method for the production of a permanent, electrically conductive connection between a first metal surface of a first substrate and a second metal surface of a second substrate wherein said process does not include a soldering process, said method comprising the steps of:

(a) positioning the first substrate and the second substrate such that the first metal surface of the first substrate and the second metal surface of the second substrate are spaced apart from each other,

(b) conditioning at least one of the first metal surface and the second metal surface by producing voids that are disposed beneath at least one of the first metal surface and the second metal surface, said voids produced by implanting gas ions into at least one of the first metal surface and the second metal surface or by application of metallic nanoparticles to at least one of the first metal surface and the second metal surface,

(c) after at least one of said first metal surface and said second metal surface are conditioned, orienting said first substrate and said second substrate such that said first metal surface and said second metal surface are oriented toward each other, and

(d) connecting the first metal surface and the second metal surface together through substitution diffusion between similar metal ions and/or metal atoms of the two metal surfaces, said substitution diffusion being enabled by said producing of said voids,

wherein, during the conditioning, orienting and connecting steps, a process temperature is less than 300° C.

7. The method according to claim 6 , wherein the first metal surface and/or the second metal surface has (have) a layer thickness S<5 nm.

8. The method according to claims 6 or 7 , wherein hydrogen is implanted to avoid oxidation.

9. The method according to claims 6 or 7 , wherein the conditioning step comprises the optimization of the surface roughness of at least one of the metal surfaces.

10. The process according to claim 1 , wherein the conditioning step comprises the optimization of the surface roughness of at least one of the metal surfaces to be less than 20 nm.

11. The method according to claim 9 , wherein the surface roughness of at least one of the metal surfaces is optimized to be less than 20 nm.