Semiconductor device
To suppress a decrease in on-state current in a semiconductor device including an oxide semiconductor. A semiconductor device includes an insulating film containing silicon, an oxide semiconductor film over the insulating film, a gate insulating film containing silicon over the oxide semiconductor film, a gate electrode which is over the gate insulating film and overlaps with at least the oxide semiconductor film, and a source electrode and a drain electrode which are electrically connected to the oxide semiconductor film. In the semiconductor device, the oxide semiconductor film which overlaps with at least the gate electrode includes a region in which a concentration of silicon distributed from an interface with the insulating film is lower than or equal to 1.1 at. %. In addition, a concentration of silicon contained in a remaining portion of the oxide semiconductor film except the region is lower than the concentration of silicon contained in the region.
1. A semiconductor device comprising:
a substrate;
a first insulating film over the substrate;
an oxide semiconductor film over the first insulating film;
a gate insulating film over the oxide semiconductor film;
a gate electrode which is over the gate insulating film and overlaps with the oxide semiconductor film;
a second insulating film over the gate electrode; and
a source electrode and a drain electrode which are electrically connected to the oxide semiconductor film via the second insulating film,
wherein the first insulating film contains silicon and oxygen; and
wherein the oxide semiconductor film which overlaps with at least the gate electrode includes a region in which a concentration of silicon distributed from an interface between the oxide semiconductor film and the first insulating film toward the oxide semiconductor film is lower than or equal to 1.1 at. %.
2. The semiconductor device according to claim 1 ,
wherein the region is present in a range of 5 nm or less in a film thickness direction from the interface with the first insulating film, and
wherein a concentration of silicon contained in a remaining portion of the oxide semiconductor film except the region is lower than the concentration of silicon contained in the region.
3. The semiconductor device according to claim 1 ,
wherein a concentration of silicon contained in the region is lower than or equal to 0.1 at. %.
4. The semiconductor device according to claim 1 ,
wherein the first insulating film contains carbon, and
wherein a concentration of carbon in the region is lower than or equal to 1.0×10 20 atoms/cm 3 .
5. The semiconductor device according to claim 1 ,
wherein the oxide semiconductor film has crystallinity.
6. The semiconductor device according to claim 1 ,
wherein the oxide semiconductor film comprises a crystal portion, and
wherein a c-axis in the crystal portion is aligned in a direction substantially parallel to a normal vector of a surface of the first insulating film.
7. The semiconductor device according to claim 1 ,
wherein the oxide semiconductor film comprises a low-resistance region.
8. The electronic device according to claim 7 ,
wherein the low-resistance region comprises an impurity ion, and
wherein the impurity ion is selected from the group of phosphorus, arsenic, and antimony, boron, aluminum, nitrogen, argon, helium, neon, indium, fluorine, chlorine, titanium, and zinc.
9. An electronic device comprising:
a semiconductor device comprising:
a substrate;
a first insulating film over the substrate;
an oxide semiconductor film over the first insulating film;
a gate insulating film over the oxide semiconductor film;
a gate electrode which is over the gate insulating film and overlaps with the oxide semiconductor film;
a second insulating film over the gate electrode; and
a source electrode and a drain electrode which are electrically connected to the oxide semiconductor film via the second insulating film,
wherein the first insulating film contains silicon and oxygen, and
wherein the oxide semiconductor film which overlaps with at least the gate electrode includes a region in which a concentration of silicon distributed from an interface between the oxide semiconductor film and the first insulating film toward the oxide semiconductor film is lower than or equal to 1.1 at. %.
10. The electronic device according to claim 9 ,
wherein a third insulating film over the second insulating film comprises an organic resin.
11. The electronic device according to claim 9 ,
wherein the gate insulating film contains silicon and oxygen.
12. The electronic device according to claim 9 further comprising a display portion,
wherein a surface of the display portion is flat.
13. The electronic device according to claim 9 ,
wherein the electronic device is a television.
14. The electronic device according to claim 9 ,
wherein the oxide semiconductor film comprises a low-resistance region.
15. The electronic device according to claim 14 ,
wherein the low-resistance region comprises an impurity ion, and
wherein the impurity ion is selected from the group of phosphorus, arsenic, and antimony, boron, aluminum, nitrogen, argon, helium, neon, indium, fluorine, chlorine, titanium, and zinc.
16. A semiconductor device comprising:
a substrate;
a first insulating film over the substrate;
an oxide semiconductor film over the first insulating film;
a gate insulating film over the oxide semiconductor film;
a gate electrode which is over the gate insulating film and overlaps with the oxide semiconductor film;
a second insulating film comprising an organic resin over the gate electrode; and
a source electrode and a drain electrode which are electrically connected to the oxide semiconductor film via the second insulating film,
wherein the first insulating film contains silicon and oxygen; and
wherein the oxide semiconductor film which overlaps with at least the gate electrode includes a region in which a concentration of silicon distributed from an interface between the oxide semiconductor film and the first insulating film toward the oxide semiconductor film is lower than or equal to 1.1 at, %.
17. The electronic device according to claim 16 ,
wherein the oxide semiconductor film comprises a low-resistance region.
18. The electronic device according to claim 17 ,
wherein the low-resistance region comprises an impurity ion, and
wherein the impurity ion is selected from the group of phosphorus, arsenic, and antimony, boron, aluminum, nitrogen, argon, helium, neon, indium, fluorine, chlorine, titanium, and zinc.