IP Library › Granted Patent US 9,537,471
Granted Patent B2
US 9,537,471 · App. 14/617,885 · Granted Jan 3, 2017

Three dimensional logic circuit

Inventor: Pratyush Kamal (San Diego, CA)
Assignee: QUALCOMM Incorporated
H03K3/356182G11C19/28G11C19/34H01L27/0688H03K3/012H03K3/35606H03K3/35625
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,537,471
App. No.
14/617,885
Granted
Jan 3, 2017
Kind
B2
Abstract

A 3D multi-bit flip-flop may include a two tier structure. The two tier structure may include a first tier containing a common clock circuit for the multi-bit flip-flop as well as the clock driven portions of the individual flip-flops and a second tier containing a common scan circuit for the multi-bit flip-flop as well as the non-clock driven portions of the individual flip-flops. Alternatively, the first tier may include the common clock circuit as well as a portion of the individual flip-flops and the second tier may include the common scan circuit as well as the other portion of the individual flip-flops.

Claims (29)

1. An integrated circuit, comprising:

a multi-bit flip-flop circuit with a plurality of single bit flip-flop circuits, each single bit flip-flop circuit of the plurality of single bit flip-flop circuits comprises a clocked portion driven by a clock signal and a non-clocked portion;

a common clock circuit, each of the clocked portions of the plurality of single bit flip-flop circuits being connected to the common clock circuit;

a common scan circuit, each of the non-clocked portions of the plurality of single bit flip-flop circuits are connected to the common scan circuit;

wherein the clocked portions of the plurality of single bit flip-flop circuits are in a first tier and each of the clocked portions comprises a master latch component, a slave latch component, and a plurality of transmission gates; and

wherein the non-clocked portions of the plurality of single bit flip-flop circuits are in a second tier positioned above the first tier and each of the non-clocked portions comprises a data input, an inverted data input, a scan input, and a plurality of input/output transistors.

2. The integrated circuit of claim 1 , wherein the multi-bit flip-flop circuit is a four bit flip-flop circuit.

3. The integrated circuit of claim 2 , wherein the plurality of single bit flip-flop circuits comprises a first single bit flip-flop circuit directly coupled to the common clock circuit, a second single bit flip-flop circuit coupled to the first single bit flip-flop circuit, a third single bit flip-flop circuit coupled to the second single bit flip-flop circuit, and a fourth single bit flip-flop circuit coupled to the third single bit flip-flop circuit and directly coupled to the common clock circuit.

4. The integrated circuit of claim 3 , wherein the first single bit flip-flop circuit and the fourth single bit flip-flop circuit are directly coupled to the common scan circuit.

5. The integrated circuit of claim 4 , wherein the first single bit flip-flop circuit has an inverted output directly coupled to the common scan circuit.

6. The integrated circuit of claim 5 , wherein an inverted input of the first single bit flip-flop circuit is directly coupled to an inverted output of the second single bit flip-flop circuit.

7. The integrated circuit of claim 6 , wherein an inverted input of the second single bit flip-flop circuit is directly coupled to an inverted output of the third single bit flip-flop circuit.

8. The integrated circuit of claim 7 , wherein an inverted input of the third single bit flip-flop circuit is directly coupled to an inverted output of the fourth single bit flip-flop circuit.

9. The integrated circuit of claim 8 , further comprising routing pathways coupling the first tier to the second tier.

10. An integrated circuit, comprising:

a multi-bit flip-flop circuit with a first plurality of flip-flop circuits and a second plurality of flip-flop circuits, wherein the first plurality of flip-flop circuits are positioned in a first tier and the second plurality of flip-flop circuits are positioned in a second tier above the first tier;

a common clock circuit positioned in the first tier and connected to each of the first plurality of flip-flop circuits and each of the second plurality of flip-flop circuits;

a common scan circuit positioned in the second tier and connected to each of the first plurality of flip-flop circuits and each of the second plurality of flip-flop circuits;

wherein each of the first plurality of flip-flop circuits and each of the second plurality of flip-flop circuits comprises a clocked portion and a non-clocked portion;

wherein each clocked portion comprises a master latch component, a slave latch component, and a plurality of transmission gates; and

wherein each non-clocked portion comprises a data input, an inverted data input, a scan input, and a plurality of input/output transistors.

11. The integrated circuit of claim 10 , wherein the multi-bit flip-flop circuit is a four bit flip-flop circuit, the first plurality of flip-flop circuits comprises a second single bit flip-flop circuit and a fourth single bit flip-flop circuit, and the second plurality of flip-flop circuits comprises a first single bit flip-flop circuit and a third single bit flip-flop circuit.

12. The integrated circuit of claim 11 , wherein the first single bit flip-flop circuit is directly coupled to the common clock circuit, the second single bit flip-flop circuit is coupled to the first single bit flip-flop circuit, the third single bit flip-flop circuit is coupled to the second single bit flip-flop circuit, and the fourth single bit flip-flop circuit is coupled to the third single bit flip-flop circuit and directly coupled to the common clock circuit.

13. The integrated circuit of claim 12 , wherein the first single bit flip-flop circuit and the fourth single bit flip-flop circuit are directly coupled to the common scan circuit.

14. The integrated circuit of claim 13 , wherein the first single bit flip-flop circuit has an inverted output directly coupled to the common scan circuit.

15. The integrated circuit of claim 14 , wherein an inverted input of the first single bit flip-flop circuit is directly coupled to an inverted output of the second single bit flip-flop circuit.

16. The integrated circuit of claim 15 , wherein an inverted input of the second single bit flip-flop circuit is directly coupled to an inverted output of the third single bit flip-flop circuit.

17. The integrated circuit of claim 16 , wherein an inverted input of the third single bit flip-flop circuit is directly coupled to an inverted output of the fourth single bit flip-flop circuit.

18. The integrated circuit of claim 17 , further comprising routing pathways coupling the first tier to the second tier.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 20, 2015
From: KAMAL, PRATYUSH
To: QUALCOMM INCORPORATED
Reel/Frame 035452/0780 →
Continuity (1)
Related Publication 20160233853A1 · Aug 11, 2016