IP Library Granted Patent US 9,552,761
Granted Patent B2
US 9,552,761 · App. 14/714,395 · Granted Jan 24, 2017

Semiconductor device

Inventors: Hajime Kimura (Kanagawa, JP); Atsushi Umezaki (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
G09G3/2096G09G3/3677G09G2300/0426G09G2300/0814G09G2300/0819G09G2320/0209G09G2320/0223
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Quick Facts
Patent No.
US 9,552,761
App. No.
14/714,395
Granted
Jan 24, 2017
Kind
B2
Abstract

A semiconductor device where delay or distortion of a signal output to a gate signal line in a selection period is reduced is provided. The semiconductor device includes a gate signal line, a first and second gate driver circuits which output a selection signal and a non-selection signal to the gate signal line, and pixels electrically connected to the gate signal line and supplied with the two signals. In a period during which the gate signal line is selected, both the first and second gate driver circuits output the selection signal to the gate signal line. In a period during which the gate signal line is not selected, one of the first and second gate driver circuits outputs the non-selection signal to the gate signal line, and the other gate driver circuit outputs neither the selection signal nor the non-selection signal to the gate signal line.

Claims (35)

1. A semiconductor device comprising:

a gate signal line;

a first gate driver circuit comprising first to sixth transistors; and

a second gate driver circuit comprising seventh to twelfth transistors,

wherein the gate signal line is electrically connected to a first terminal of the first transistor and a first terminal of the second transistor,

wherein a gate of the first transistor is electrically connected to a first terminal of the third transistor and a first terminal of the fourth transistor,

wherein a gate of the second transistor is directly connected to a first terminal of the fifth transistor and a first terminal of the sixth transistor,

wherein a second terminal of the sixth transistor is directly connected to the gate of the first transistor,

wherein the gate signal line is directly connected to a first terminal of the seventh transistor and a first terminal of the eighth transistor,

wherein a gate of the seventh transistor is electrically connected to a first terminal of the ninth transistor and a first terminal of the tenth transistor,

wherein a gate of the eighth transistor is directly connected to a first terminal of the eleventh transistor and a first terminal of the twelfth transistor, and

wherein a second terminal of the twelfth transistor is directly connected to the gate of the seventh transistor.

2. The semiconductor device according to claim 1 , wherein the third transistor is diode-connected.

3. The semiconductor device according to claim 1 , wherein the fourth transistor is diode-connected.

4. The semiconductor device according to claim 1 , wherein the fifth transistor is diode-connected.

5. The semiconductor device according to claim 1 , wherein the sixth transistor is diode-connected.

6. The semiconductor device according to claim 1 , further comprising a pixel portion including a plurality of pixels between the first gate driver circuit and the second gate driver circuit.

7. The semiconductor device according to claim 1 , wherein the first gate driver circuit and the second gate driver circuit are provided on the same side of a pixel portion.

8. The semiconductor device according to claim 1 , wherein each of the first to twelfth transistors comprises an oxide semiconductor layer in which a channel formation region is formed.

9. A semiconductor device comprising:

a gate signal line; and

first to twelfth transistors,

wherein the gate signal line is electrically connected to a first terminal of the first transistor and a first terminal of the second transistor,

wherein a gate of the first transistor is electrically connected to a first terminal of the third transistor and a first terminal of the fourth transistor,

wherein a gate of the second transistor is directly connected to a first terminal of the fifth transistor and a first terminal of the sixth transistor,

wherein a second terminal of the sixth transistor is directly connected to the gate of the first transistor,

wherein the gate signal line is directly connected to a first terminal of the seventh transistor and a first terminal of the eighth transistor,

wherein a gate of the seventh transistor is electrically connected to a first terminal of the ninth transistor and a first terminal of the tenth transistor,

wherein a gate of the eighth transistor is directly connected to a first terminal of the eleventh transistor and a first terminal of the twelfth transistor, and

wherein a second terminal of the twelfth transistor is directly connected to the gate of the seventh transistor.

10. The semiconductor device according to claim 9 , wherein the third transistor is diode-connected.

11. The semiconductor device according to claim 9 , wherein the fourth transistor is diode-connected.

12. The semiconductor device according to claim 9 , wherein the fifth transistor is diode-connected.

13. The semiconductor device according to claim 9 , wherein the sixth transistor is diode-connected.

14. The semiconductor device according to claim 9 , wherein each of the first to twelfth transistors comprises an oxide semiconductor layer in which a channel formation region is formed.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 30, 2015
From: KIMURA, HAJIME; UMEZAKI, ATSUSHI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 035935/0629 →
Priority Claims (1)
JP 2010-201621 · Sep 9, 2010 · national
Continuity (2)
Continuation 13225856 · Sep 6, 2011
Related Publication 20150339971A1 · Nov 26, 2015