Interposer and semiconductor device including the same
There is provided an interposer for cooling an electronic component. The interposer includes: a substrate body having a hollow cooling channel therein, wherein a cooling medium flows through the cooling channel, the cooling channel including: a plurality of main cooling channels extending in a certain direction and separated from each other; an inflow channel which is communicated with one end of the respective main cooling channels; and an outflow channel which is communicated with the other end of the respective main cooling channels, and a plurality of through electrode groups each comprising a plurality of through electrodes arranged in a line. Each of the though electrodes is formed through the substrate body to reach the first and second surfaces of the substrate body. The respective through electrode groups are partitioned by at least corresponding one of the main cooling channels.
1. An interposer for cooling an electronic component, comprising:
a substrate body comprising a first surface on which the electronic component is to be mounted and a second surface opposite to the first surface, the substrate body having a hollow cooling channel therein, wherein a cooling medium flows through the cooling channel, the cooling channel comprising:
a plurality of main cooling channels extending in a certain direction and separated from each other;
an inflow channel which is directly communicated with one end of each of the plurality of main cooling channels; and
an outflow channel which is directly communicated with the other end of each of the plurality of main cooling channels, and
a plurality of through electrode groups each comprising a plurality of through electrodes arranged in a line, wherein each of the though electrodes is formed through the substrate body to reach the first and second surfaces of the substrate body, and is to be electrically connected to the electronic component, and wherein the respective through electrode groups are partitioned by at least corresponding one of the main cooling channels.
2. The interposer of claim 1 ,
wherein the substrate body is provided with an inlet through which the cooling medium flows in the cooling channel, and
a cross-section area of the inflow channel in the certain direction is determined in accordance with a distance from the inlet.
3. The interposer of claim 1 ,
wherein the substrate body is provided with an outlet through which the cooling medium flows out the cooling channel, and
a cross-section area of the outflow channel in the certain direction is determined in accordance with a distance from the outlet.
4. The interposer of claim 1 , wherein
an insulating film is formed on an inner wall surface of the substrate body, which defines each of the through holes in which the corresponding through electrode is formed, whereas no insulating film is formed on an inner wall surface of the substrate body which defines the cooling channel.
5. The interposer of claim 1 , wherein
an insulating film is formed both on an inner wall surface of the substrate body, which defines each of the through holes in which the corresponding through electrode is formed, and on an inner wall surface of the substrate body which defines the cooling channel.
6. The interposer of claim 1 , further comprising:
a connector connected to a pipe arrangement for circulating the cooling medium in the cooling channel.
7. A semiconductor device comprising:
the interposer of claim 1 ;
a wiring board on which the interposer is mounted; and
the electronic component which is mounted on the interposer.
8. The interposer of claim 1 , wherein
first electrode pads are provided on the first surface of the substrate body and connected to the through electrodes, and
second electrode pads are provided on the second surface of the substrate body and connected to the through electrodes.
9. The interposer of claim 1 , wherein the substrate body comprises the first surface on which the electronic component is to be mounted and the second surface on which another electronic component is to be mounted.
10. The interposer of claim 2 ,
wherein a width dimension of the inflow channel in the certain direction is determined in accordance with the distance from the inlet.
11. The interposer of claim 2 , wherein the cross-section area of the inflow channel in the certain direction is increased as the distance from the inlet is increased.
12. The interposer of claim 3 ,
wherein a width dimension of the outflow channel in the certain direction is determined in accordance with the distance from the outlet.
13. The interposer of claim 3 , wherein the cross-section area of the outflow channel in the certain direction is increased as the distance from the outlet is increased.
14. The interposer of claim 4 , wherein the substrate body is a silicon substrate.
15. The interposer of claim 5 , wherein the substrate body is a silicon substrate.
16. The semiconductor device of claim 7 , further comprising:
an underfill resin provided between the interposer and the wiring board and containing a filler therein.
17. A semiconductor device comprising:
the interposer of claim 9 ;
a wiring board on which the interposer is mounted;
the electronic component which is mounted on the first surface of the substrate body of the interposer; and
the another electronic component which is mounted on the second surface of the substrate body of the interposer.
18. The interposer of claim 14 , wherein the insulating film is a silicon oxide film.
19. The interposer of claim 15 , wherein the insulating film is a silicon oxide film.