IP Library Granted Patent US 9,595,823
Granted Patent B2
US 9,595,823 · App. 14/163,806 · Granted Mar 14, 2017

Low power circuit for transistor electrical overstress protection in high voltage applications

Inventor: Chee Hong Aw (Klang, MY)
Assignee: Intel Corporation
H02H3/20
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Quick Facts
Patent No.
US 9,595,823
App. No.
14/163,806
Granted
Mar 14, 2017
Kind
B2
Abstract

Described is an apparatus which comprises a pass-gate; and a control unit to control gate terminal of the pass-gate according to first availability of first or second power supplies, the control unit including: a voltage detector to detect the second power supply; and a supply switching circuit to generate a local supply for controlling the gate terminal of the pass-gate according to an output of the voltage detector.

Claims (47)

1. An apparatus comprising:

a pass-gate; and

a control unit to control a gate terminal of the pass-gate according to a first availability of first or second power supplies, the control unit including:

a voltage detector to detect the second power supply; and

a supply switching circuit to generate a local supply for controlling the gate terminal of the pass-gate according to an output of the voltage detector, wherein the voltage detector comprises

an input stage to receive the second power supply, the input stage controllable by a bias voltage, and

a voltage divider to generate the bias voltage according to an output of the input stage and the first power supply.

2. The apparatus of claim 1 , wherein the voltage detector comprises a hysteresis circuit to receive the output of the input stage, the hysteresis circuit to generate the output of the voltage detector.

3. The apparatus of claim 2 , wherein the hysteresis circuit comprises a Schmitt Triggered device.

4. The apparatus of claim 2 , wherein the hysteresis circuit is powered by the bias voltage.

5. The apparatus of claim 1 , wherein the voltage divider comprises a plurality of diode connected devices.

6. The apparatus of claim 5 , wherein the voltage divider comprises a switch to receive an output of the input stage.

7. The apparatus of claim 1 , wherein the supply switching circuit comprises:

a first circuit powered by the first power supply; and

a second circuit powered by a second power supply, wherein an output of the voltage detector to enable one of the first or second circuits.

8. The apparatus of claim 1 , wherein the first power supply is higher than the second power supply.

9. The apparatus of claim 1 , wherein the pass-gate is operable to protect a driver from electrical over stress.

10. An apparatus comprising:

a first power supply;

a second power supply, the second power supply being lower than the first power supply;

a voltage detector to detect the second power supply; and

a supply switching circuit coupled to the first and second power supplies, the supply switching circuit to generate a local supply for providing electrical overstress protection to another circuit according to an output of the voltage detector, wherein the voltage detector comprises

an input stage to receive the second power supply, the input stage controllable by a bias voltage; and

a voltage divider to generate the bias voltage according to an output of the input stage and the first power supply.

11. The apparatus of claim 10 , wherein the voltage detector comprises:

a hysteresis circuit to receive the output of the input stage, the hysteresis circuit to generate the output of the voltage detector.

12. The apparatus of claim 11 , wherein the hysteresis circuit comprises a Schmitt Triggered device, and wherein the hysteresis circuit is powered by the bias voltage.

13. The apparatus of claim 10 , wherein the supply switching circuit comprises:

a first circuit powered by the first power supply; and

a second circuit powered by a second power supply, wherein an output of the voltage detector to enable one of the first or second circuits.

14. A system comprising:

a memory unit;

a processor coupled to the memory unit, the processor to receive one of first or second power supplies, the processor having an electrical overstress protection circuit comprising:

a voltage detector to detect the second power supply; and

a supply switching circuit coupled to the first and second power supplies, the supply switching circuit to generate a local supply for providing electrical overstress protection to another circuit according to an output of the voltage detector, wherein the voltage detector comprises

an input stage to receive the second power supply, the input stage controllable by a bias voltage; and

a voltage divider to generate the bias voltage according to an output of the input stage and the first power supply; and

a wireless interface for allowing the processor to communicate with another device.

15. The system of claim 14 , wherein the system comprises:

a pass-gate controllable by the local supply; and

a USB compliant driver having an input coupled to the pass-gate.

16. The system of claim 15 further comprises a display unit.

17. The system of claim 14 , wherein the voltage detector comprises:

a hysteresis circuit to receive the output of the input stage, the hysteresis circuit to generate the output of the voltage detector.

18. The system of claim 17 , wherein the supply switching circuit comprises:

a first circuit powered by the first power supply; and

a second circuit powered by a second power supply, wherein an output of the voltage detector to enable one of the first or second circuits.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 15, 2022
From: INTEL CORPORATION
To: TAHOE RESEARCH, LTD.
Reel/Frame 061175/0176 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 5, 2014
From: AW, CHEE HONG
To: INTEL CORPORATION
Reel/Frame 032150/0201 →
Continuity (1)
Related Publication 20150214723A1 · Jul 30, 2015