IP Library › Granted Patent US 9,601,325
Granted Patent B2
US 9,601,325 · App. 14/741,734 · Granted Mar 21, 2017

Aromatic resins for underlayers

Inventors: Emad Aqad (Northborough, MA); Mingqi Li (Shrewsbury, MA); Shintaro Yamada (Shrewsbury, MA); Sung Wook Cho (Gyeonggi-do, KR)
Assignees: Rohm and Haas Electronic Materials LLC; Rohm and Haas Electronic Materials Korea Ltd.
H01L21/02118C08G65/4012C09D171/00G03F7/091G03F7/094G03F7/40
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Quick Facts
Patent No.
US 9,601,325
App. No.
14/741,734
Granted
Mar 21, 2017
Kind
B2
Abstract

Aromatic resin polymers and compositions containing them are useful as underlayers in semiconductor manufacturing processes.

Claims (13)

1. A method of forming a patterned layer comprising disposing on a substrate a layer of a composition comprising a polymer comprising one or more repeat units of formula (1):

wherein Ar 1 , Ar 2 , Ar 3 and Ar 4 independently represent an optionally substituted divalent aryl moiety; A is a chemical bond, O, —C(O)O—, —C(O)NR—, or a C 1-60 divalent hydrocarbyl group; Z represents H, an optionally substituted C 1-30 alkyl moiety, an optionally substituted C 2-30 alkenyl moiety, an optionally substituted C 2-30 alkynyl moiety, an optionally substituted C 7-30 aralkyl moiety, or an optionally substituted C 6-20 aryl moiety; R represents a H or a C 1-30 hydrocarbyl moiety; and m is 0 or 1; and an organic solvent; removing organic solvent to form a polymeric underlayer; disposing a silicon-containing layer on the polymeric underlayer; disposing a layer of a photoresist on the silicon-containing layer; exposing the photoresist layer to actinic radiation through a mask; developing the exposed photoresist layer to form a resist pattern; and

transferring the pattern to the silicon-containing layer and to the polymeric underlayer to expose portions of the substrate.

2. The method of claim 1 wherein the polymer comprises one or more repeat units chosen from

3. The method of claim 1 wherein the composition further comprises an acid or a thermal acid generator.

4. The method of claim 1 wherein A is chosen from a chemical bond, O or a C 1-60 divalent hydrocarbyl group.

5. The method of claim 4 wherein A is chosen from a chemical bond, O or —C(R 4 ) 2 —, where each R 4 is independently H, C 1-10 alkyl, or C 1-10 fluoroalkyl.

6. The method of claim 1 wherein Z is chosen from H, an unsubstituted aryl moiety, or a hydroxy-substituted aryl moiety.

7. The method of claim 1 wherein the polymer comprises two or more different repeat units of formula (1).

8. The method of claim 1 further comprising the steps of patterning the substrate; and then removing the patterned polymeric underlayer.

9. The method of claim 1 wherein Ar 1 =Ar 2 .

10. A composition comprising a polymer chosen from

wherein x and y represent the number of each repeat units and are integers independently selected from 1 to 499, and wherein x+y=2 to 500; and a organic solvent.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2017
From: AQAD, EMAD; LI, MINGQI; YAMADA, SHINTARO
To: ROHM AND HAAS ELECTRONIC MATERIALS LLC
Reel/Frame 040995/0919 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jan 18, 2017
From: CHO, SUNG WOOK
To: ROHM AND HAAS ELECTRONIC MATERIALS KOREA LTD
Reel/Frame 040995/0936 →
Continuity (2)
Provisional Application 62016118 · Jun 24, 2014
Related Publication 20150368504A1 · Dec 24, 2015