Single junction bi-directional electrostatic discharge (ESD) protection circuit
In an embodiment, an ESD protection circuit may include a silicon-controlled rectifier (SCR) and a diode sharing a PN junction and forming a bi-directional ESD circuit. The single PN junction may reduce the capacitive load on the pin, which may allow the high speed circuit to meet its performance goals. In an embodiment, a floating P-well contact may be placed between two neighboring SCRs, to control triggering of the SCRs.
1. An integrated circuit comprising:
a conductor coupled to a pin on a package of the integrated circuit;
a voltage rail; and
an electrostatic discharge (ESD) protection circuit coupled between the conductor and the voltage rail wherein the ESD protection circuit comprises:
a diode having a first anode coupled to the voltage rail and a first cathode coupled to the pin; and
a silicon-controlled rectifier (SCR) having a second cathode coupled to the voltage rail and a second anode coupled to the pin, wherein the second anode and the first cathode share a PN junction in a semiconductor substrate on which the integrated circuit is fabricated.
2. The integrated circuit as recited in claim 1 wherein the diode is configured to conduct current in response to a first ESD event from the voltage rail to the pin.
3. The integrated circuit as recited in claim 1 wherein the SCR is configured to conduct current in response to a second ESD event from the pin to the voltage rail.
4. The integrated circuit as recited in claim 3 wherein the voltage rail is a ground voltage rail.
5. The integrated circuit as recited in claim 1 wherein the second cathode is coupled to a floating P-well contact for triggering.
6. The integrated circuit as recited in claim 5 further comprising another SCR for another pin, wherein the other SCR is coupled to the floating P-well contact.
7. The integrated circuit as recited in claim 6 further comprising a trigger diode coupled to the floating P-well contact, wherein the trigger diode is configured to trigger the SCR and the other SCR in response an ESD event.
8. The integrated circuit as recited in claim 5 wherein the floating P-well contact does not interfere with a current path of the SCR.
9. An electrostatic discharge (ESD) protection circuit comprising:
a reverse-biased diode configured to handle a first ESD event between a voltage rail and a pin in an integrated circuit; and
a forward-biased silicon-controlled rectifier (SCR) configured to handle a second ESD event between the voltage rail and the pin, wherein a first direction of current flow in the first ESD event is opposite a second direction of current flow in the second ESD event, wherein a first node of the reverse-biased diode and a second node of the forward-biased SCR share a PN junction in a semiconductor substrate on which the ESD protection circuit is formed.
10. The ESD protection circuit as recited in claim 9 further comprising a floating P-well contact coupled to a third node of the forward-biased SCR.
11. The ESD protection circuit as recited in claim 9 wherein the voltage rail is a ground voltage rail.
12. The ESD protection circuit as recited in claim 11 wherein the first node is a cathode and the second node is an anode.
13. A method comprising:
triggering a diode in response to a first electrostatic discharge (ESD) event from a voltage rail to a pin on an integrated circuit package, wherein the diode has a first anode coupled to the voltage rail and a first cathode coupled to the pin; and
triggering a silicon-controlled rectifier (SCR) in response to a second ESD event from the pin to the voltage rail, wherein the SCR has a second cathode coupled to the voltage rail and a second anode coupled to the pin, wherein the voltage rail is a ground voltage rail and wherein the second anode and the first cathode share a PN junction in a semiconductor substrate on which the integrated circuit is fabricated.
14. The method as recited in claim 13 wherein the second cathode is coupled to a floating P-well contact, and wherein the integrated circuit further comprises a trigger diode coupled to the floating P-well contact, wherein triggering the SCR is performed by the trigger diode in response to the second ESD event.
15. The method as recited in claim 13 further comprising:
reverse-biasing the diode; and
forward-biasing the SCR.