Systems and methods for statistical measurement control of spectrophotometric data

1. A computer implemented data processing method, comprising:

obtaining from a coating analysis device multiple measurements of spectral reflectance data from a coated surface having a target coating thereon;

a computer system performing, using a processor, a statistical outlier test on the multiple measurements of spectral reflectance data, wherein the statistical outlier test comprises:

calculating a statistical analysis of the multiple measurements of spectral reflectance data at each respective angle and wavelength combination within each measurement,

determining a total number of potential statistical outliers associated with the multiple measurements of spectral reflectance data at each respective angle and wavelength combination for each respective measurement, and

when the total number of potential statistical outliers for a particular measurement exceeds a tolerance, generating final spectral reflectance data by excluding data from the particular measurement;

removing, using the processor, at least a portion of the spectral reflectance data within the final spectral reflectance data that falls outside of a pre-defined acceptable tolerance range; and

calculating, using the processor, a characteristic of the target coating based at least in part on the final spectral reflectance data.

2. The method of claim 1 , wherein the statistical outlier test is the Grubb's test for outliers.

3. The method of claim 1 , wherein calculating a characteristic of the target coating includes at least one of generating colorimetric data (L*, a*, b*, C*, h*), generating tristimulus data (X, Y, Z), generating absorption and scattering data (K, S), calculating opacity, calculating jetness, calculating pigment strength, generating color formulations, generating a color match quality indicator, generating a color adjustment, and generating spectral reflectance curve comparisons.

4. The method of claim 1 , further comprising measuring the coated surface with a spectrophotometer to obtain the multiple measurements spectral reflectance data.

5. A non-transitory computer readable medium including data processing software for causing a processor to:

obtain, from a coating analysis device, multiple measurements of spectral reflectance data from a coated surface having a target coating thereon;

perform, using the processor, a statistical outlier test on the multiple measurements of spectral reflectance data, wherein the statistical outlier test comprises:

calculating a statistical analysis of the multiple measurements of spectral reflectance spectral reflectance data at each respective angle and wavelength combination within each measurement,

determining a total number of potential statistical outliers associated with the multiple measurements of spectral reflectance data at each respective angle and wavelength combination for each respective measurement, and

generating final spectral reflectance data by excluding measurements that are associated with a total number of potential statistical outliers that exceeds a particular threshold; and

calculate a characteristic of the target coating based at least in part on the final spectral reflectance data.

6. The computer readable medium of claim 5 , wherein the computer readable medium includes software for causing the processor to remove at least one of the outlier data points to produce the final spectral reflectance data using the Grubb's test for outliers.

7. A system, comprising:

a user interface; and

a processor in communication with the user interface and programmed to:

obtain, from a coating analysis device, multiple measurements of spectral reflectance data from a coated surface having a target coating thereon;

perform, using the processor, a statistical outlier test on the multiple measurements of spectral reflectance data, wherein the statistical outlier test comprises:

calculating a statistical analysis of the multiple measurements of spectral reflectance data at each respective angle and wavelength combination within each measurement,

determining a total number of potential statistical outliers associated with the multiple measurements of spectral reflectance data for each respective measurement, and

when the total number of potential statistical outliers for a particular measurement exceeds a tolerance, generating final spectral reflectance data by excluding data from the particular measurement; and

calculate a characteristic of the target coating based at least in part on the final spectral reflectance data.

8. The system of claim 7 , further comprising a database in communication with the processor.

9. The system of claim 7 , further comprising a display in communication with the processor.

10. The system of claim 7 , further comprising a spectrophotometer in communication with the processor.

11. The system of claim 7 , wherein the processor is programmed to determine whether the data includes any outlier data points using the Grubb's outlier test.