Manually operated small envelope scanner system

1. A scanner system for an image inspection of an object, the scanner system comprising:

an inspection probe; and

a first non-contact linear encoder, the first non-contact linear encoder comprising:

a first scale, and

a first sensor configured to read the first scale,

wherein the first sensor is positioned to face the first scale and maintain a continuous non-contact interface between the first sensor and the first scale, and

wherein the first sensor is configured to move with respect to the first scale;

wherein the first sensor is associated with the inspection probe so that a continuous alignment between the first sensor and the inspection probe is maintained for a duration of the image inspection.

2. The scanner system according to claim 1 , wherein the first non-contact linear encoder is a magnetic non-contact linear encoder or an optical non-contact linear encoder.

3. A scanner system for image inspection of an object, the scanner system comprising:

an inspection probe;

a first non-contact linear encoder comprising:

a first sensor, and

a first scale,

the first sensor being positioned to maintain a continuous non-contact interface between the first sensor and the first scale and to maintain a continuous alignment of the first sensor with the inspection probe;

a first track;

a first carriage; and

a probe mount, wherein:

the first scale is affixed to the first track, the first sensor is affixed to the first carriage, and the first carriage is connected to and moveable along the first track to maintain the continuous non-contact interface between the first sensor and the first scale, and

the probe mount is connected to the first carriage and connected to the inspection probe to maintain the continuous alignment of the first sensor with the inspection probe.

4. The scanner system according to claim 1 , further comprising a second non-contact linear encoder, comprising:

a second scale, and

a second sensor configured to read the second scale,

wherein the second sensor is positioned to face the second scale and maintain a continuous non-contact interface between the second sensor and the second scale, and

wherein the second sensor is configured to move with respect to the second scale;

wherein the second sensor is associated with the first sensor so that a continuous alignment between the second sensor and the first sensor is maintained for the duration of the image inspection.

5. The scanner system according to claim 1 , wherein the inspection probe is a phased array ultrasonic inspection probe or a conventional ultrasonic inspection probe or an eddy current inspection probe.

6. The scanner system according to claim 3 , wherein:

the object is a pipe having a longitudinal axis and a weld having a weld toe;

the first track is positioned on top of the weld; and

the probe mount extends a maximum distance of 2.125 inches from the weld toe along the longitudinal axis of the pipe.

7. The scanner system according to claim 3 , further comprising:

first and second connecting members; and

first, second, and third grooves, wherein:

the first connecting member fits within the first groove and the second connecting member fits within the second groove to connect the first carriage to the first track, and

the first scale is positioned within the third groove.

8. The scanner system according to claim 4 , wherein:

the first non-contact linear encoder is a magnetic non-contact linear encoder or an optical non-contact linear encoder; and

the second non-contact linear encoder is a magnetic non-contact linear encoder or an optical non-contact linear encoder.

9. The scanner system according to claim 3 , further comprising:

a second track;

a second carriage; and

a second non-contact linear encoder, the second non-contact linear encoder comprising:

a second sensor, and

a second scale, wherein:

the second scale is affixed to the second track, the second sensor is affixed to the second carriage, and the second carriage is connected to and moveable along the second track to maintain a continuous non-contact interface between the second sensor and the second scale, and

the first track is affixed to the second carriage and aligned perpendicular to the second track to maintain an alignment of the second sensor with the first sensor.

10. The scanner system according to claim 3 , wherein the probe mount comprises:

a probe mount base;

a probe mount pivot;

first and second probe mount links; and

first and second probe mount yokes, wherein:

the probe mount base is affixed to the first carriage,

the probe mount pivot is affixed to the probe mount base,

the first and second probe mount links are connected to the probe mount pivot,

the first probe mount yoke is connected to the first probe mount link,

the second probe mount yoke is connected to the second probe mount link, and

the first and second probe mount yokes are connected to the inspection probe.

11. The scanner system according to claim 9 , wherein the probe mount comprises:

a probe mount base;

a probe mount pivot having a first side and a second side;

first and second probe mount links; and

first and second probe mount yokes, wherein:

the probe mount base is affixed to the first carriage,

the probe mount pivot is affixed to the probe mount base,

the first and second probe mount links are connected to the probe mount pivot,

the first probe mount yoke is connected to the first probe mount link,

the second probe mount yoke is connected to the second probe mount link, and

the first and second probe mount yokes are connected to the inspection probe.

12. The scanner system according to claim 9 , further comprising:

first, second, third, and fourth connecting members; and

first, second, third, fourth, fifth, and sixth grooves, wherein:

the first connecting member fits within the first groove and the second connecting member fits within the second groove to connect the first carriage to the first track,

the third connecting member fits within the fourth groove and the fourth connecting member fits within the fifth groove to connect the second carriage to the second track,

the first scale is positioned within the third groove, and

the second scale is positioned within the sixth groove.

13. The scanner system according to claim 7 , wherein:

the first track has first, second, and third surfaces,

the first carriage comprises:

a first right half carriage, and

a first left half carriage,

the first connecting member is located on the first right half carriage,

the second connecting member is located on the first left half carriage,

the first groove is located on the first surface,

the second groove is located on the second surface, and

the third groove is located on the third surface.

14. The scanner system according to claim 12 , wherein:

the first track has first, second, and third surfaces,

the second track has fourth, fifth, and sixth surfaces,

the first carriage comprises:

a first right half carriage, and

a first left half carriage,

the second carriage comprises:

a second right half carriage, and

a second left half carriage,

the first connecting member is located on the first right half carriage,

the second connecting member is located on the first left half carriage,

the third connecting member is located on the second right half carriage,

the fourth connecting member is located on the second left half carriage,

the first groove is located on the first surface,

the second groove is located on the second surface,

the third groove is located on the third surface,

the fourth groove is located on the fourth surface,

the fifth groove is located on the fifth surface, and

the sixth groove is located on the sixth surface.

15. A method for image inspection of an object using a scanner system having an inspection probe and a first non-contact linear encoder having a first sensor facing and configured to read a first scale, the method comprising:

moving the inspection probe on the object; and

generating a signal representative of a position of the inspection probe on the object by moving the first sensor along the first scale while

maintaining a continuous non-contact interface between the first sensor and the first scale and

maintaining a continuous alignment of the first sensor with the inspection probe while the first sensor is moving along the first scale and the inspection probe is moving on the object.

16. A method for image inspection of an object using a scanner system having an inspection probe and first and second non-contact linear encoders, the first non-contact linear encoder having a first sensor and a first scale and the second non-contact linear encoder having a second sensor and a second scale, the method comprising:

generating a signal representative of a position of the inspection probe on a first axis by moving the first sensor along the first scale on the first axis while maintaining a continuous non-contact interface between the first sensor and the first scale and maintaining a continuous alignment of the first sensor with the inspection probe; and

generating a signal representative of a position of the inspection probe on a second axis by moving the second sensor along the second scale on the second axis while maintaining a continuous non-contact interface between the second sensor and the second scale and maintaining a continuous alignment of the second sensor with the first sensor.

17. The scanner system according to claim 1 , further comprising:

a first track;

a first carriage; and

a probe mount, wherein:

the first scale is affixed to the first track, the first sensor is affixed to the first carriage, and the first carriage is connected to and moveable along the first track to maintain the continuous non-contact interface between the first sensor and the first scale, and

the probe mount is connected to the first carriage and connected to the inspection probe to maintain the continuous alignment of the first sensor with the inspection probe.

18. The scanner system according to claim 17 , wherein:

the object is a pipe having a longitudinal axis and a weld having a weld toe;

the first track is positioned on top of the weld; and

the probe mount extends a maximum distance of 2.125 inches from the weld toe along the longitudinal axis of the pipe.

19. The scanner system according to claim 17 , further comprising:

first and second connecting members; and

first, second, and third grooves, wherein:

the first connecting member fits within the first groove and the second connecting member fits within the second groove to connect the first carriage to the first track, and

the first scale is positioned within the third groove.

20. The scanner system according to claim 19 , wherein:

the first non-contact linear encoder is a magnetic non-contact linear encoder or an optical non-contact linear encoder; and

a second non-contact linear encoder is a magnetic non-contact linear encoder or an optical non-contact linear encoder.