IP Library Granted Patent US 9,648,741
Granted Patent B2
US 9,648,741 · App. 14/940,520 · Granted May 9, 2017

Electronic device and method for manufacturing electronic device

Inventor: Yoriko Mizushima (Setagaya, JP)
Assignee: FUJITSU LIMITED
H05K1/115H05K1/0271H05K3/4038H05K2201/068H05K2201/09845
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Quick Facts
Patent No.
US 9,648,741
App. No.
14/940,520
Granted
May 9, 2017
Kind
B2
Abstract

An electronic device includes; a first substrate; a second substrate Located facing the first substrate; a resin layer formed between the first substrate and the second substrate and having a first thermal expansion coefficient; a conductor via penetrating the first substrate and the resin layer; a barrier film covering a side surface of the conductor via; a first film formed between the resin layer and the barrier film and having viscoelasticity; and a second film formed between the first film and the barrier film and having a second thermal expansion coefficient lower than the first thermal expansion coefficient.

Claims (39)

1. An electronic device comprising;

a first substrate;

a second substrate Located facing the first substrate;

a resin layer formed between the first substrate and the second substrate and having a first thermal expansion coefficient;

a conductor via penetrating the first substrate and the resin layer;

a barrier film covering a side surface of the conductor via;

a first film formed between the resin layer and the barrier film and having viscoelasticity; and

a second film formed between the first film and the barrier film and having a second thermal expansion coefficient lower than the first thermal expansion coefficient.

2. The electronic device according to claim 1 ,

wherein the first film is a rubber elastic body.

3. The electronic device according to claim 1 ,

wherein the firstfilm has an elastic modulus which varies in a range of 0.01 GPa to 0.1 GPa.

4. The electronic device according to claim 1 ,

wherein the firstfilm has a glass transition point lowerthan a temperature applied in manufacturing and use of the electronic device.

5. The electronic device according to claim 1 ,

wherein the second thermal expansion coefficient of the secondfilm is higher than a third thermal expansion coefficient of the conductor via.

6. The electronic device according to claim 1 ,

wherein the secondfilm has an elastic modulus of 3 GPa or more.

7. The electronic device according to claim 1 ,

wherein the secondfilm has a glass transition point equal to or higher than a temperature applied in manufacturing and use of the electronic device.

8. The electronic device according to claim 1 ,

wherein the secondfilm does not have a glass transition point.

9. The electronic device according to claim 1 ,

wherein the firstfilm is interposed between a first end portion on a side of the first substrate of the secondfilm and the first substrate and between a second end portion on a side of the second substrate of the secondfilm and the second substrate.

10. A method for manufacturing an electronic device comprising:

stacking a first substrate and a second substrate with a resin layer having a first thermal expansion coefficient interposed between the first substrate and the second substrate;

forming a first hole penetrating the first substrate;

forming a second hole communicating with the first hole and having an opening diameter wider than an opening diameter of the first hole in the resin layer;

forming a first film having viscoelasticity on an inner wall of the second hole;

forming a second film having a second thermal expansion coefficient lower than the first thermal expansion coefficient on an inner wall of the first film;

forming a barrier film on an inner wall of the second film and onan inner wall of the first hole; and

forming a conductor via in the first hole and the second hole after the formation of the barrier film.

11. A method for manufacturing an electronic device comprising:

protruding an end portion of a conductor via and an end portion of a barrier film covering a side surface of the conductor via on a first surface side of a first substrate;

covering the end portion of the conductor via and the end portion of the barrier film protrudingfrom the first surface with a secondfilm having a second thermal expansion coefficient;

covering the secondfilm with a firstfilm having viscoelasticity;

forming a resin layer having a first thermal expansion coefficient higher than the second thermal expansion coefficient on the first substrate;

exposing the end surface of the conductorvia from the resin layer, the first film, and the second filmby removing part of the resin layer, the first film, and the second film; and

connecting a second substrate to the first surface of the first substrate.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 13, 2015
From: MIZUSHIMA, YORIKO
To: FUJITSU LIMITED
Reel/Frame 037034/0837 →
Priority Claims (1)
JP 2014-253137 · Dec 15, 2014 · national
Continuity (1)
Related Publication 20160174375A1 · Jun 16, 2016