IP Library › Granted Patent US 9,653,486
Granted Patent B2
US 9,653,486 · App. 14/492,644 · Granted May 16, 2017

Analog/digital circuit including back gate transistor structure

Inventor: Yoshiyuki Kurokawa (Sagamihara, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1225H01L29/7869H01L29/78648H01L29/78696
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Quick Facts
Patent No.
US 9,653,486
App. No.
14/492,644
Granted
May 16, 2017
Kind
B2
Abstract

To provide a semiconductor device with low power consumption. In transistors electrically connected to function as a comparator circuit, back gates are provided in the transistors functioning as current sources, and the transistors functioning as the current sources can be switched between conduction and non-conduction in accordance with a control signal supplied to the back gates. The control signal makes the transistor conductive in a period during which the comparator circuit operates and non-conductive in the other period. A semiconductor layer to be a channel formation region of the transistor included in the semiconductor device includes an oxide semiconductor.

Claims (92)

1. A semiconductor device comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a sixth transistor,

wherein a gate of the first transistor, a gate of the third transistor, a gate of the fifth transistor, a second terminal of the third transistor, and a first terminal of the fourth transistor are electrically connected to one another,

wherein a second terminal of the first transistor, a first terminal of the second transistor, and a gate of the fourth transistor are electrically connected to one another,

wherein a second terminal of the fifth transistor and a first terminal of the sixth transistor are electrically connected to one another,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises a back gate electrode,

wherein a first terminal of the first transistor, a first terminal of the third transistor, and a first terminal of the fifth transistor are electrically connected to a first power supply line, and

wherein a second terminal of the second transistor, a second terminal of the fourth transistor, and a second terminal of the sixth transistor are directly connected to a second power supply line.

2. The semiconductor device according to claim 1 ,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises an oxide semiconductor layer comprising a channel formation region.

3. The semiconductor device according to claim 1 , further comprising a seventh transistor and an eighth transistor,

wherein a gate of the seventh transistor, a second terminal of the seventh transistor, and a first terminal of the eighth transistor are electrically connected to an output terminal,

wherein the second terminal of the fifth transistor, the first terminal of the sixth transistor, and a gate of the eighth transistor are electrically connected to one another, and

wherein the seventh transistor comprises a back gate electrode.

4. The semiconductor device according to claim 3 ,

wherein each of the first transistor, the third transistor, the fifth transistor, and the seventh transistor comprises an oxide semiconductor layer comprising a channel formation region.

5. The semiconductor device according to claim 3 ,

wherein a first terminal of the seventh transistor is electrically connected to the first power supply line, and

wherein a second terminal of the eighth transistor is electrically connected to the second power supply line.

6. The semiconductor device according to claim 3 ,

wherein the first to eighth transistors have the same polarity.

7. A semiconductor device comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a sixth transistor,

wherein a gate of the first transistor, a gate of the third transistor, a gate of the fifth transistor, a second terminal of the third transistor, and a first terminal of the fourth transistor are electrically connected to one another,

wherein a second terminal of the first transistor, a first terminal of the second transistor, and a gate of the fourth transistor are electrically connected to one another,

wherein a second terminal of the fifth transistor and a first terminal of the sixth transistor are electrically connected to one another,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises a back gate electrode,

wherein a first terminal of the first transistor, a first terminal of the third transistor, and a first terminal of the fifth transistor are electrically connected to a first power supply line,

wherein a second terminal of the second transistor, a second terminal of the fourth transistor, and a second terminal of the sixth transistor are directly connected to a second power supply line,

wherein a first signal is supplied to a gate of the second transistor,

wherein a second signal is supplied to a gate of the sixth transistor,

wherein a signal is output from the first terminal of the sixth transistor, and

wherein the signal is determined by comparing the first signal and the second signal.

8. The semiconductor device according to claim 7 ,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises an oxide semiconductor layer comprising a channel formation region.

9. The semiconductor device according to claim 7 , further comprising a seventh transistor and an eighth transistor,

wherein a gate of the seventh transistor, a second terminal of the seventh transistor, and a first terminal of the eighth transistor are electrically connected to an output terminal,

wherein the second terminal of the fifth transistor, the first terminal of the sixth transistor, and a gate of the eighth transistor are electrically connected to one another,

wherein the seventh transistor comprises a back gate electrode,

wherein an output signal is output from the output terminal, and

wherein the output signal is determined by comparing the first signal and the second signal.

10. The semiconductor device according to claim 9 ,

wherein each of the first transistor, the third transistor, the fifth transistor, and the seventh transistor comprises an oxide semiconductor layer comprising a channel formation region.

11. The semiconductor device according to claim 9 ,

wherein a first terminal of the fifth transistor, and a first terminal of the seventh transistor is electrically connected to the first power supply line, and

wherein a second terminal of the eighth transistor is electrically connected to the second power supply line.

12. The semiconductor device according to claim 9 ,

wherein the first to eighth transistors have the same polarity.

13. A semiconductor device comprising:

a first transistor;

a second transistor;

a third transistor;

a fourth transistor;

a fifth transistor; and

a sixth transistor,

wherein a gate of the first transistor, a gate of the third transistor, a gate of the fifth transistor, a second terminal of the third transistor, and a first terminal of the fourth transistor are electrically connected to one another,

wherein a second terminal of the first transistor, a first terminal of the second transistor, and a gate of the fourth transistor are electrically connected to one another,

wherein a second terminal of the fifth transistor and a first terminal of the sixth transistor are electrically connected to one another,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises a back gate electrode,

wherein a first terminal of the first transistor, a first terminal of the third transistor, and a first terminal of the fifth transistor are electrically connected to a first power supply line,

wherein a second terminal of the second transistor, a second terminal of the fourth transistor, and a second terminal of the sixth transistor are directly connected to a second power supply line,

wherein a first signal is supplied to a gate of the second transistor,

wherein a second signal is supplied to a gate of the sixth transistor,

wherein a signal is output from the first terminal of the sixth transistor,

wherein the signal is determined by comparing the first signal and the second signal, and

wherein a control signal is supplied to the back gate electrode of each of the first transistor, the third transistor, and the fifth transistor to make the first transistor, the third transistor, and the fifth transistor conductive in a period during which the signal is output and make the first transistor, the third transistor, and the fifth transistor non-conductive in the other period.

14. The semiconductor device according to claim 13 ,

wherein each of the first transistor, the third transistor, and the fifth transistor comprises an oxide semiconductor layer comprising a channel formation region.

15. The semiconductor device according to claim 13 , further comprising a seventh transistor and an eighth transistor,

wherein a gate of the seventh transistor, a second terminal of the seventh transistor, and a first terminal of the eighth transistor are electrically connected to an output terminal,

wherein the second terminal of the fifth transistor, the first terminal of the sixth transistor, and a gate of the eighth transistor are electrically connected to one another,

wherein the seventh transistor comprises a back gate electrode,

wherein an output signal is output from the output terminal,

wherein the output signal is determined by comparing the first signal and the second signal, and

wherein the control signal is supplied to the back gate electrode of each of the first transistor, the third transistor, the fifth transistor, and the seventh transistor to make the first transistor, the third transistor, the fifth transistor, and the seventh transistor conductive in the period during which the output signal is output and make the first transistor, the third transistor, the fifth transistor, and the seventh transistor non-conductive in the other period.

16. The semiconductor device according to claim 15 ,

wherein each of the first transistor, the third transistor, the fifth transistor, and the seventh transistor comprises an oxide semiconductor layer comprising a channel formation region.

17. The semiconductor device according to claim 15 ,

wherein a first terminal of the seventh transistor is electrically connected to the first power supply line, and

wherein a second terminal of the eighth transistor is electrically connected to the second power supply line.

18. The semiconductor device according to claim 15 ,

wherein the first to eighth transistors have the same polarity.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2014
From: KUROKAWA, YOSHIYUKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 033789/0917 →
Priority Claims (1)
JP 2013-200707 · Sep 27, 2013 · national
Continuity (1)
Related Publication 20150091003A1 · Apr 2, 2015