IP Library Granted Patent US 9,659,969
Granted Patent B2
US 9,659,969 · App. 14/640,393 · Granted May 23, 2017

Display device

Inventors: Shunpei Yamazaki (Setagaya, JP); Kengo Akimoto (Atsugi, JP); Atsushi Umezaki (Atsugi, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1225G02F1/13624H01L27/124H01L27/3276H01L29/7869
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Quick Facts
Patent No.
US 9,659,969
App. No.
14/640,393
Granted
May 23, 2017
Kind
B2
Abstract

With an increase in the definition of a display device, the number of pixels is increased, and thus the numbers of gate lines and signal lines are increased. Due to the increase in the numbers of gate lines and signal lines, it is difficult to mount an IC chip having a driver circuit for driving the gate and signal lines by bonding or the like, which causes an increase in manufacturing costs. A pixel portion and a driver circuit for driving the pixel portion are formed over one substrate. At least a part of the driver circuit is formed using an inverted staggered thin film transistor in which an oxide semiconductor is used. The driver circuit as well as the pixel portion is provided over the same substrate, whereby manufacturing costs are reduced.

Claims (36)

1. A semiconductor device comprising:

a pixel portion; and

a driver circuit for a gate signal comprising a first transistor and a second transistor,

wherein each of the first transistor and the second transistor comprises an oxide semiconductor layer,

wherein one of a source wiring and a drain wiring of the first transistor is electrically connected to a first potential,

wherein one of a source wiring and a drain wiring of the second transistor is electrically connected to a second potential,

wherein another of the source wiring and the drain wiring of the first transistor is electrically connected to another of the source wiring and the drain wiring of the second transistor,

wherein a gate electrode of the first transistor is electrically connected to the one of the source wiring and the drain wiring of the first transistor,

wherein the first potential is larger than the second potential, and

wherein in a channel length direction, a length of the oxide semiconductor layer of the first transistor is smaller than a length of the gate electrode of the first transistor.

2. The semiconductor device according to claim 1 , wherein the oxide semiconductor layer comprises indium, gallium, and zinc.

3. The semiconductor device according to claim 1 , wherein the other of the source wiring and the drain wiring of the first transistor and the other of the source wiring and the drain wiring of the second transistor are provided as a continuous layer.

4. The semiconductor device according to claim 1 , wherein each of the first transistor and the second transistor is an n-channel thin film transistor.

5. The semiconductor device according to claim 1 , wherein the pixel portion comprises the oxide semiconductor layer.

6. The semiconductor device according to claim 1 , wherein the pixel portion and the driver circuit are provided over a same substrate.

7. The semiconductor device according to claim 1 , wherein the pixel portion comprises a liquid crystal layer.

8. The semiconductor device according to claim 1 , wherein the pixel portion comprises an electroluminescent layer.

9. The semiconductor device according to claim 1 , further comprising an operation button, a speaker, and a microphone.

10. A semiconductor device comprising:

a pixel portion comprising a first transistor; and

a driver circuit comprising a second transistor and a third transistor,

wherein each of the first transistor, the second transistor, and the third transistor comprises an oxide semiconductor layer,

wherein one of a source wiring and a drain wiring of the second transistor is electrically connected to a first potential,

wherein one of a source wiring and a drain wiring of the third transistor is electrically connected to a second potential,

wherein another of the source wiring and the drain wiring of the second transistor is electrically connected to another of the source wiring and the drain wiring of the third transistor,

wherein a gate electrode of the second transistor is electrically connected to the one of the source wiring and the drain wiring of the second transistor,

wherein the first potential is larger than the second potential, and

wherein in a channel length direction, a length of the oxide semiconductor layer of the second transistor is smaller than a length of the gate electrode of the second transistor.

11. The semiconductor device according to claim 10 , wherein the oxide semiconductor layer comprises indium, gallium, and zinc.

12. The semiconductor device according to claim 10 , wherein the other of the source wiring and the drain wiring of the second transistor and the other of the source wiring and the drain wiring of the third transistor are provided as a continuous layer.

13. The semiconductor device according to claim 10 , wherein each of the first transistor, the second transistor, and the third transistor is an n-channel thin film transistor.

14. The semiconductor device according to claim 10 , wherein the pixel portion comprises the oxide semiconductor layer.

15. The semiconductor device according to claim 10 , wherein the pixel portion and the driver circuit are provided over a same substrate.

16. The semiconductor device according to claim 10 , wherein the pixel portion comprises a liquid crystal layer.

17. The semiconductor device according to claim 10 , wherein the pixel portion comprises an electroluminescent layer.

18. The semiconductor device according to claim 10 , further comprising an operation button, a speaker, and a microphone.

Priority Claims (1)
JP 2008-258992 · Oct 3, 2008 · national
Continuity (3)
Continuation 13651750 · Oct 15, 2012
Continuation 12570481 · Sep 30, 2009
Related Publication 20150179676A1 · Jun 25, 2015