IP Library › Granted Patent US 9,671,333
Granted Patent B2
US 9,671,333 · App. 14/718,400 · Granted Jun 6, 2017

Laser gas analyzer

Inventors: Takaaki Hirata (Tokyo, JP); Yasuhiko Mitsumoto (Tokyo, JP); Masaya Ooyama (Tokyo, JP); Nobuhiko Kanbara (Tokyo, JP); Naoyuki Fujimura (Tokyo, JP); Minoru Maeda (Tokyo, JP); Tadashi Sugiyama (Tokyo, JP); Alan Cowie (Friendswood, TX); Jie Zhu (Pearland, TX)
Assignee: YOKOGAWA ELECTRIC CORPORATION
G01N21/39G01N21/3103G01N21/3504G01N21/359G01N33/0027G01N2021/399G01N2201/0612
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Quick Facts
Patent No.
US 9,671,333
App. No.
14/718,400
Granted
Jun 6, 2017
Kind
B2
Abstract

A laser gas analyzer includes a wavelength-variable laser having a wide wavelength-variable width, a light-split module configured to split an output light of the wavelength-variable laser into a measurement light and a reference light, a first gas cell into which gases to be measured are introduced, and the measurement light is made to be incident, and a data processor configured to obtain an absorption spectrum of each of the gases to be measured based on a reference signal related to the reference light and an absorption signal related to an output light of the first gas cell, and to obtain concentrations of the respective gases to be measured.

Claims (11)

1. A laser gas analyzer, comprising:

a MEMS-vertical cavity surface emitting laser;

a light-split module configured to split an output light of the MEMS-vertical cavity surface emitting laser into a measurement light and a reference light;

a measurement gas cell, which receives gasses to be measured, is configured such that the measurement light is made incident to the measurement gas cell;

a first receiver is configured such that the measurement light that passed through the measurement gas cell is made incident to the first receiver;

a second receiver is configured such that the reference light is made incident to the second receiver; and

a data processor configured to obtain concentrations of the gases to be measured based on an absorption signal of the gases to be measured obtained from the first receiver and a reference signal of the MEMS-vertical cavity surface emitting laser obtained from the second receiver.

2. The laser gas analyzer according to claim 1 , wherein the gases to be measured are hydrocarbon gases.

3. The laser gas analyzer according to claim 1 , wherein the light source can oscillate in a wavelength range of 1620 nm to 1750 nm.

4. The laser gas analyzer according to claim 1 , wherein the light source can oscillate in a wavelength range of 1620 nm to 1640 nm.

5. The laser gas analyzer according to claim 1 , wherein the light source can oscillate in a wavelength range of 1670 nm to 1700 nm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 21, 2015
From: HIRATA, TAKAAKI; MITSUMOTO, YASUHIKO; OOYAMA, MASAYA; KANBARA, NOBUHIKO; FUJIMURA, NAOYUKI; MAEDA, MINORU; SUGIYAMA, TADASHI; COWIE, ALAN; ZHU, JIE
To: YOKOGAWA ELECTRIC CORPORATION
Reel/Frame 035691/0718 →
Priority Claims (1)
JP 2011-258910 · Nov 28, 2011 · national
Continuity (3)
Continuation 14643628 · Mar 10, 2015
Continuation 13687456 · Nov 28, 2012
Related Publication 20150260646A1 · Sep 17, 2015