IP Library Granted Patent US 9,674,470
Granted Patent B2
US 9,674,470 · App. 14/679,172 · Granted Jun 6, 2017

Semiconductor device, method for driving semiconductor device, and method for driving electronic device

Inventors: Yoshiyuki Kurokawa (Kanagawa, JP); Hideki Uochi (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H04N5/3741H01L27/1225H01L27/1464H01L27/14632H01L27/14641H01L27/14643H01L27/14645H01L27/14687H01L29/7869H01L31/105H01L27/14621
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Quick Facts
Patent No.
US 9,674,470
App. No.
14/679,172
Granted
Jun 6, 2017
Kind
B2
Abstract

To provide a solid-state imaging device with short image-capturing duration. A first photodiode in a pixel in an n-th row and an m-th column is connected to a second photodiode in a pixel in an (n+1)-th row and the m-th column through a transistor. The first photodiode and the second photodiode receive light concurrently, the potential in accordance with the amount of received light is held in a pixel in the n-th row and the m-th column, and the potential in accordance with the amount of received light is held in a pixel in the (n+1)-th row and the m-th column without performing a reset operation. Then, each potential is read out. Under a large amount of light, either the first photodiode or the second photodiode is used.

Claims (46)

1. A method for driving a semiconductor device including a first circuit, a second circuit, and a sixth transistor, comprising first to fourth steps,

wherein the first circuit includes a first photoelectric conversion element, a first transistor, a second transistor, and a third transistor,

wherein the second circuit includes a second photoelectric conversion element, a fourth transistor, and a fifth transistor,

wherein the first photoelectric conversion element is electrically connected to one of a source and a drain of the first transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,

wherein the other of the source and the drain of the second transistor is electrically connected to a first node,

wherein a gate of the third transistor is electrically connected to the first node,

wherein the second photoelectric conversion element is electrically connected to one of a source and a drain of the fourth transistor,

wherein the other of the source and the drain of the fourth transistor is electrically connected to a second node,

wherein a gate of the fifth transistor is electrically connected to the second node,

wherein one of a source and a drain of the sixth transistor is electrically connected to the one of the source and the drain of the second transistor,

wherein the other of the source and the drain of the sixth transistor is electrically connected to the one of the source and the drain of the fourth transistor,

wherein in the first step, the first transistor and the fourth transistor are each in an off state,

wherein in the first step, the second transistor and the sixth transistor are each in an on state,

wherein in the first step, a first potential corresponding to the amount of light received by the second photoelectric conversion element is written into the first node,

wherein in the second step, the first transistor and the second transistor are each in an off state,

wherein in the second step, the fourth transistor and the sixth transistor are each in an on state,

wherein in the second step, a second potential corresponding to the amount of light received by the second photoelectric conversion element is written into the second node,

wherein in the third step, data corresponding to the first potential is read out through the third transistor,

wherein in the fourth step, data corresponding to the second potential is read out through the fifth transistor, and

wherein the third step and the fourth step are performed after the first step and the second step are completed.

2. The method for driving the semiconductor device according to claim 1 , wherein the first transistor includes an oxide semiconductor.

3. The method for driving the semiconductor device according to claim 1 , wherein the second transistor and the fourth transistor each include an oxide semiconductor.

4. The method for driving the semiconductor device according to claim 1 , wherein the sixth transistor includes an oxide semiconductor.

5. The method for driving the semiconductor device according to claim 1 , wherein the first to sixth transistors are each an n-channel transistor.

6. The method for driving the semiconductor device according to claim 1 , wherein the first to sixth transistors are each a p-channel transistor.

7. The method for driving the semiconductor device according to claim 1 , wherein the first photoelectric conversion element and the second photoelectric conversion element are each a pin junction.

8. A method for driving an electronic device including a lens, a display portion, and the semiconductor device, wherein the semiconductor device uses the method for driving the semiconductor device according to claim 1 .

9. A semiconductor device comprising:

a first circuit;

a second circuit; and

a sixth transistor,

wherein the first circuit includes a first photoelectric conversion element, a first transistor, a second transistor, and a third transistor,

wherein the second circuit includes a second photoelectric conversion element, a fourth transistor, and a fifth transistor,

wherein the first photoelectric conversion element is electrically connected to one of a source and a drain of the first transistor,

wherein the other of the source and the drain of the first transistor is electrically connected to one of a source and a drain of the second transistor,

wherein the other of the source and the drain of the second transistor is electrically connected to a gate of the third transistor,

wherein the second photoelectric conversion element is electrically connected to one of a source and a drain of the fourth transistor,

wherein the other of the source and the drain of the fourth transistor is electrically connected to a gate of the fifth transistor,

wherein one of a source and a drain of the sixth transistor is electrically connected to the one of the source and the drain of the second transistor, and

wherein the other of the source and the drain of the fifth transistor is electrically connected to the one of the source and the drain of the fourth transistor.

10. The semiconductor device according to claim 9 , wherein the first to fifth transistors each include an oxide semiconductor.

11. The semiconductor device according to claim 9 , wherein the sixth transistor includes an oxide semiconductor.

12. The semiconductor device according to claim 9 , wherein the first to sixth transistors are each an n-channel transistor.

13. The semiconductor device according to claim 9 , wherein the first to sixth transistors are each a p-channel transistor.

14. The semiconductor device according to claim 9 , wherein the first photoelectric conversion element and the second photoelectric conversion element are each a pin junction.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 19, 2015
From: KUROKAWA, YOSHIYUKI; UOCHI, HIDEKI
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 035869/0929 →
Priority Claims (6)
JP 2014-082063 · Apr 11, 2014 · national
JP 2014-093786 · Apr 30, 2014 · national
JP 2014-101672 · May 15, 2014 · national
JP 2014-181468 · Sep 5, 2014 · national
JP 2014-211511 · Oct 16, 2014 · national
JP 2015-010893 · Jan 23, 2015 · national
Continuity (1)
Related Publication 20150296162A1 · Oct 15, 2015