Broadband terahertz generation of metamaterials
Provided are systems and methods to generate single-cycle THz pulses from a few tens of nanometers thin layer of split ring resonators (SRRs) via optical rectification of femtosecond laser pulses. The emitted THz radiation, with a spectrum ranging from about 0.1 to 4 THz, arises exclusively from pumping the magnetic-dipole resonance of SRRs around 200 THz. This resonant enhancement, together with pump polarization dependence and power scaling of the THz emission, underpins the nonlinearity from optically induced circulating currents in SRRs, with a huge effective nonlinear susceptibility of 0.8×10 −16 m 2 /V that far exceeds surface nonlinearities of both thin films and bulk organic/inorganic crystals and sheet nonlinearities of non-centrosymmetric materials such as ZnTe.
1. A terahertz (THz) emitter comprising:
an array of split-ring resonators (SRRs) configured to produce emissions of electromagnetic radiation (EMR) in the THz spectrum between about 0.1 THz and about 10 THz upon energization by pulses of EMR having a wavelength of between about 1.1 μm to about 2.6 μm.
2. The THz emitter of claim 1 , wherein the array of SRRs is configured to produce emissions of EMR upon energization by pulses of EMR that last between about 100 and about 200 femtoseconds (fs).
3. The THz emitter of claim 1 , wherein the array of SRRs is configured to produce emissions of EMR in the THz spectrum that have a bandwidth of at least 4 THz.
4. The THz emitter of claim 1 , wherein the SRRs are configured to exhibit a nonlinear susceptibility between about 10 −17 and about 10 16 m 2 /V.
5. The THz emitter of claim 1 , wherein the SRRs are comprised of gold.
6. The THz emitter of claim 1 , wherein each SRR has two substantially parallel arm regions joined by a base region that is substantially perpendicular to the parallel arm regions such that a gap is created between the parallel arm regions.
7. The THz emitter of claim 6 , wherein the parallel arm regions have a width of approximately 79 nm and the perpendicular base region has a length of approximately 220 nm.
8. The THz emitter of claim 7 , wherein each SRR is at most approximately 40 nm thick.
9. The Thz emitter of claim 1 , wherein the SRRs are arranged in a single layer within the array.
10. The THz emitter of claim 1 , wherein the array of SRRs is configured to produce emissions of EMR upon energization by pulses of EMR having a wavelength of between about 1.3 μm to about 1.8 μm.
11. The THz emitter of claim 1 , wherein the array of SRRs is formed on a layer of indium-tin-oxide.
12. The THz emitter of claim 11 , wherein the layer of indium-tin-oxide is deposited on a quartz substrate.
13. The THz emitter of claim 1 , wherein the array of SRRs is configured to produce emissions of EMR upon energization by pulses of EMR that last for about 140 fs.
14. A method of producing electromagnetic radiation (EMR) in the terahertz (THz) spectrum between about 0.1 THz and about 10 THz, the method comprising the steps of:
providing an array of split ring resonators (SRRs), wherein the SRRs have a magnetic dipole resonance;
providing an electromagnetic radiation (EMR) source, wherein electromagnetic radiation (EMR) from the EMR source has a wavelength within +/−25% of the magnetic dipole resonance of the SRR; and
pulsing the EMR from the EMR source on the array of SRRs in pulses that last between about 100 and about 200 femtoseconds (fs).
15. The method of claim 14 , wherein the SRRs are arranged in a single layer within the array.
16. The method of claim 14 , wherein the SRRs are comprised of gold and wherein each SRR has two substantially parallel arm regions joined by a base region that is substantially perpendicular to the parallel arm regions such that a gap is created between the parallel arm regions.
17. The method of claim 14 , wherein the EMR from the EMR source has a wavelength of between about 1.3 μm to about 1.8 μm.
18. The method of claim 14 , wherein the SRRs exhibit a nonlinear susceptibility between about 10 −17 and about 10 −16 m 2 /V.
19. The method of claim 14 , wherein each SRR is at most approximately 40 nm thick.