Wide-field microscope illumination system and wide-field illumination method

1. A widefield microscope illumination system having:

a microscope objective that comprises an optical objective axis;

an illumination light source that sends widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined annular or annular-segment-shaped illumination light entry area having a large offset between the illumination light entry area and the optical objective axis;

a spatially resolving light detector that detects detected light sent from an illuminated sample through the microscope objective along a detected light beam path; and

an automatic illumination light beam path manipulation device, controlled by a control system, which is arranged in front of the microscope objective in relation to the direction of the illumination light beam path, and by means of which illumination light beam path manipulation device the illumination axes are automatically movable at time intervals to a plurality of different illumination light entry sites within the predetermined annular or annular-segment-shaped illumination light entry area.

2. The widefield microscope illumination system according to claim 1 , wherein the illumination axes always extend parallel to the objective axis.

3. The microscope illumination system according to claim 1 , wherein the microscope illumination system is a constituent of a TIRF illumination system.

4. The microscope illumination system according to claim 1 , wherein the illumination light beam path manipulation device comprises an optomechanical system, acousto-optical modulators (AOMs), or electro-optical modulators (EOMs), which establish an adjustable beam offset and thus an illumination light entry site that is adjustable with respect to the optical objective axis.

5. The microscope illumination system according to claim 1 , wherein the control system is configured such that it automatically controls, according to a predefined pattern, a permitted adjustable beam offset in the region of the predetermined illumination light entry area for the illumination light into the objective, all the illumination light entry sites permitted by the control system being located within this predetermined illumination light entry area.

6. The microscope illumination system according to claim 1 , wherein the control system comprises a random generator that controls a permitted adjustable beam offset in the region of the predetermined illumination light entry area for the illumination light into the objective, all the illumination light entry sites permitted by the control system being located within this predetermined illumination light entry area.

7. The microscope illumination system according to claim 1 , wherein a control interface by means of which a control instruction adjusting the predetermined illumination light entry area can be entered.

8. The microscope illumination system according to claim 1 , wherein a measurement device that monitors the transmittance of the objective and sends a control signal to the control system when the transmittance falls below a predetermined threshold value.

9. A widefield illumination method for illuminating samples viewed with a microscope, the microscope comprising:

a microscope objective that comprises an optical objective axis; and

an illumination light source that sends widefield illumination light along illumination beam paths having corresponding illumination axes along which the illumination light penetrates into the microscope objective through illumination light entry sites located within a predetermined annular or annular-segment-shaped illumination light entry area having a large offset between the illumination light entry area and the optical objective axis,

the illumination method being equipped with repeated, automatic, parallel adjustment of the illumination axis relative to the optical objective axis at time intervals, such that a lateral offset of the illumination axis relative to the objective axis is automatically adjusted, so that the illumination light entry site is adjusted within the predetermined illumination light entry area at time intervals such that the objective is protected from damage by illumination light.

10. The illumination method according to claim 9 , wherein a parallel orientation of the illumination axes relative to the objective axis, and by maintenance of that parallelism upon automatic adjustment of the lateral offset of the illumination axis relative to the objective axis.

11. The illumination method according to claim 9 , wherein a random selection of the respective illumination light entry sites of the illumination light within the predefined illumination light entry area, and by maintenance of those respective illumination light entry sites over the respective time intervals until the respective next illumination light entry site within the predefined illumination light entry sites is randomly selected.

12. The illumination method according to claim 9 , wherein selection of the respective illumination light entry sites of the illumination light within the predefined illumination light entry area according to a predefined pattern, and by maintenance of those respective illumination light entry sites over the respective time intervals until the respective next illumination light entry site is selected within the predefined illumination light entry sites according to the predefined pattern.

13. The illumination method according to claims 9 , wherein a measurement of the optical transmittance of the objective for the respective illumination light entry sites, and adjustment of the time intervals in accordance with a change over time in optical transmittance for the respective illumination light entry site.