Composition for base, and directed self-assembly lithography method
A composition for a base of a directed self-assembling film includes a compound including an oxo acid group, and a solvent. The compound is preferably represented by formula (1). A represents an organic group having 10 or more carbon atoms and having a valency of n. B represents an oxo acid group. n is an integer of 1 to 200. In a case where n is 2 or greater, a plurality of Bs are identical or different. A B) n (1)
1. A directed self-assembly lithography method comprising:
subjecting a substrate to a base treatment using a composition, the substrate comprising a silicon atom or being coated with a metal-containing film provided on a surface of the substrate;
overlaying a directed self-assembling film comprising a plurality of phases on the substrate subjected to the base treatment; and
removing at least a part of the plurality of phases of the directed self-assembling film,
wherein the composition comprises:
a compound comprising an oxo acid group which is a phosphoric acid group, a phosphono group, a sulfo group, a sulfuric acid group, a carboxy group, or a combination thereof; and
a solvent,
wherein the compound is represented by formula (1):
A B) n (1)
wherein, in the formula (1), A represents an organic group having 10 or more carbon atoms and having a valency of n; B represents the oxo acid group; and n is an integer of 1 to 200, wherein in a case where n is 2 or greater, a plurality of Bs are identical or different, and
wherein when n is 1, A represents a polymer or a chain organic group, and the oxo acid group binds to an end of a main chain of the polymer or the chain organic group, and when n is an integer of 2 to 200, the compound is a copolymer comprising a first monomer unit which comprises the oxo acid group and a second monomer unit other than the first monomer unit, and an amount of the first monomer unit with respect to a total of monomer units in the copolymer is from 0.01 to 20 mol %.
2. The directed self-assembly lithography method according to claim 1 , further comprising:
forming a prepattern on the substrate subjected to the base treatment,
wherein the directed self-assembling film is overlaid after forming the prepattern.
3. The directed self-assembly lithography method according to claim 1 , wherein the composition further comprises an acid generating agent.
4. The directed self-assembly lithography method according to claim 1 , wherein in the formula (1), n is 1.
5. The directed self-assembly lithography method according to claim 1 , wherein in the formula (1), n is an integer of 2 to 200.
6. The directed self-assembly lithography method according to claim 1 , wherein the substrate comprises the silicon atom.
7. The directed self-assembly lithography method according to claim 1 , wherein the substrate is coated with the metal-containing film.
8. The directed self-assembly lithography method according to claim 1 , wherein, in the formula (1), A represents a substituted or unsubstituted chain hydrocarbon group having 10 to 30 carbon atoms and having a valency of n, or a substituted or unsubstituted hetero atom-containing group that comprises a hetero atom between two adjacent carbon atoms of the chain hydrocarbon group having 10 to 30 carbon atoms.
9. The directed self-assembly lithography method according to claim 1 , wherein, in the formula (1), A represents a substituted or unsubstituted alicyclic hydrocarbon group having 10 to 30 carbon atoms and having a valency of n, or a substituted or unsubstituted hetero atom-containing group that comprises a hetero atom between two adjacent carbon atoms of the alicyclic hydrocarbon group having 10 to 30 carbon atoms.
10. The directed self-assembly lithography method according to claim 1 , wherein, in the formula (1), A represents a substituted or unsubstituted aromatic hydrocarbon group having 10 to 30 carbon atoms and having a valency of n, or a substituted or unsubstituted hetero atom-containing group that comprises a hetero atom between two adjacent carbon atoms of the aromatic hydrocarbon group having 10 to 30 carbon atoms.
11. The directed self-assembly lithography method according to claim 1 , wherein an upper limit of a polystyrene equivalent weight average molecular weight (Mw) of the compound as determined by gel permeation chromatography is 30,000.
12. The directed self-assembly lithography method according to claim 1 , wherein an upper limit of a polystyrene equivalent weight average molecular weight (Mw) of the compound as determined by gel permeation chromatography is 15,000.
13. The directed self-assembly lithography method according to claim 1 , wherein a content of the compound in a total solid content of the composition is no less than 70% by mass.
14. The directed self-assembly lithography method according to claim 1 , wherein a content of the compound in a total solid content of the composition is no less than 85% by mass.
15. The directed self-assembly lithography method according to claim 1 , wherein n is 1, and the organic group is obtained by polymerizing a vinyl monomer in a presence of a chain transfer agent and a radical polymerization initiator in a solvent, wherein the chain transfer agent comprises a compound having the oxo acid group and a mercapto group at an end of the compound.