Semiconductor memory device including dummy memory cells and memory system including the same

1. A semiconductor memory device, comprising:

a memory cell array including a plurality of cell strings arranged in a row direction and a column direction, wherein the cell strings include a first plurality of normal memory cells, a second plurality of dummy memory cells, drain select transistors, and source select transistors in a stacked configuration over a substrate;

a first plurality of normal word lines electrically coupled to the first plurality of normal memory cells; and

a second plurality of dummy word lines electrically coupled to the second plurality of dummy memory cells,

wherein the second plurality of dummy memory cells include a second plurality of drain dummy memory cells electrically coupled to bit lines through the drain select transistors, and a second plurality of source dummy memory cells electrically coupled to a common source line through the source select transistors,

wherein the first plurality of normal memory cells are electrically coupled between the drain dummy memory cells and the source dummy memory cells, and

wherein a first bad memory cell included in a first cell string among the cell strings and coupled to a first normal word line is replaced with a first dummy memory cell included in the first cell string and coupled to a first dummy word line, and a second bad memory cell included in the first cell string and coupled to a second normal word line is replaced with a second dummy memory cell included in second cell string and coupled to the first dummy word line.

2. The device of claim 1 , wherein each of the at least one bad memory cell is replaced with the source dummy memory cell adjacent to the first plurality of normal memory cells.

3. The device of claim 1 , further comprising a peripheral circuit configured to control the operation of the first plurality of normal word lines and the second plurality of dummy word lines.

4. The device of claim 3 , wherein, when a program operation is performed, the peripheral circuit is configured to apply a voltage to a normal word line that are electrically coupled to the at least one bad memory cell that is the same as the voltage applied to a non-selected normal word line from among the first plurality of normal word lines.

5. The device of claim 3 , wherein, when a read operation is performed, the peripheral circuit is configured to apply a voltage to a normal word line that are electrically coupled to the at least one bad memory cell that is the same as the voltage applied to a non-selected normal word line from among the first plurality of normal word lines.

6. The device of claim 3 , wherein, when an erase operation is performed, the peripheral circuit is configured to apply a ground voltage to a normal word line that are electrically coupled to the at least one bad memory cell.

7. A semiconductor memory device, comprising:

a plurality of cell strings electrically coupled to a plurality of drain select lines, respectively, the plurality of drain select lines extending in a row direction and arranged in a column direction, each of the plurality of cell strings including a first plurality of normal memory cells, a second plurality of dummy memory cells, a drain select transistor, and a source select transistor in a stacked configuration over a substrate;

a first plurality of normal word lines electrically coupled to the first plurality of normal memory cells; and

a second plurality of dummy word lines electrically coupled to the second plurality of dummy memory cells,

wherein the second plurality of dummy memory cells include a second plurality of drain dummy memory cells electrically coupled to bit lines through the drain select transistor, and a second plurality of source dummy memory cells electrically coupled to a common source line through the source select transistor,

wherein the first plurality of normal memory cells are electrically coupled between the drain dummy memory cells and the source dummy memory cells, and

wherein a first bad memory cell included in a first cell string and a first page is replaced with a first dummy memory cell included in the first cell string and a second page, and a second bad memory cell included in the first cell string and a third page is replaced with a second dummy memory cell included in a second cell string and the second page.

8. The device of claim 7 , wherein the at least one bad memory cell is included in a first cell string from among the plurality of cell strings,

a first bad memory cell from among the at least one bad memory cell is replaced with a dummy memory cell of the first cell string, and

a second bad memory cell from among the at least one bad memory cell is replaced with a dummy memory cell of a second cell string from among the plurality of cell strings.

9. The device of claim 7 , wherein the at least one bad memory cell is included in a first cell string from among the plurality of cell strings,

a first bad memory cell from among the at least one bad memory cell is replaced with a dummy memory cell of a second cell string from among the plurality of cell strings, and

a second bad memory cell among the at least one bad memory cell is replaced with a dummy memory cell of a third cell string from among the plurality of cell strings.

10. The device of claim 7 , wherein the source dummy memory cell adjacent to the first plurality of normal memory cells from among the source dummy memory cells of each cell string is provided as a spare cell for replacing the at least one bad memory cell.

11. The device of claim 10 , wherein the at least one bad memory cell is included in a first cell string from among the plurality of cell strings,

a first bad memory cell from among the at least one bad memory cell is replaced with the spare cell of the first cell string, and

a second bad memory cell from among the at least one bad memory cell is replaced with the spare cell of a second cell string from among the plurality of cell strings.

12. The device of claim 10 , wherein the at least one bad memory cell is included in a first cell string from among the plurality of cell strings,

a first bad memory cell from among the at least one bad memory cell is replaced with the spare cell of a second cell string from among the plurality of cell strings, and

a second bad memory cell among the at least one bad memory cell is replaced with the spare cell of a third cell string from among the plurality of cell strings.

13. A memory system, comprising:

a semiconductor memory device; and

a controller configured to control at least one operation of the semiconductor memory device,

wherein the semiconductor memory device comprises:

a memory cell array including a plurality of cell strings arranged in a row direction and a column direction, wherein the cell strings include a first plurality of normal memory cells, a second plurality of dummy memory cells, drain select transistors, and source select transistors in a stacked over a substrate;

a first plurality of normal word lines electrically coupled to the first plurality of normal memory cells; and

second plurality of dummy word lines electrically coupled to the second plurality of dummy memory cells,

wherein the second plurality of dummy memory cells include a second plurality of drain dummy memory cells electrically coupled to bit lines through the drain select transistors, and a second plurality of source dummy memory cells electrically coupled to a common source line through the source select transistors,

wherein the first plurality of normal memory cells are electrically coupled between the drain dummy memory cells and the source dummy memory cells, and

wherein a first bad memory cell included in a first cell string among the cell strings and coupled to a first normal word line is replaced with a first dummy memory cell included in the first cell string and coupled to a first dummy word line, and a second bad memory cell included in the first cell string and coupled to a second normal word line is replaced with a second dummy memory cell included in second cell string and coupled to the first dummy word line.

14. The system of claim 13 , wherein each of the at least one bad memory cells is replaced with the source dummy memory cell adjacent to the first plurality of normal memory cells.

15. The system of claim 13 , wherein the controller is configured to convert a logical address received from an external device into a physical address that indicates a dummy memory cell from among the drain dummy memory cells and the source dummy memory cells.