Conductive cap for metal-gate transistor

1. A semiconductor device comprising:

a gate region, wherein the gate region includes a metal gate region and a high dielectric constant (high-K) gate dielectric region;

a conductive cap disposed on a surface of the metal gate region and in direct contact with a surface of the high-K gate dielectric region; and

an interconnect disposed on the conductive cap, wherein the conductive cap includes a conductive material to electrically connect the gate region to the interconnect.

2. The semiconductor device of claim 1 , wherein the interconnect includes copper (Cu), and wherein the conductive cap substantially inhibits diffusion of the copper (Cu) from the interconnect into the gate region.

3. The semiconductor device of claim 2 , wherein the interconnect further includes a liner material that is positioned between the copper (Cu) and the conductive cap.

4. The semiconductor device of claim 1 , wherein the metal gate region includes a work function material disposed between a gate metal of the metal gate region and the high-K gate dielectric region.

5. The semiconductor device of claim 4 , wherein the conductive cap substantially inhibits diffusion of the work function material from the metal gate region into the interconnect.

6. The semiconductor device of claim 1 , wherein the conductive material of the conductive cap includes tungsten (W), cobalt (Co), or tantalum (Ta).

7. The semiconductor device of claim 1 , wherein a gate metal of the metal gate region includes aluminum (Al) or tungsten (W).

8. The semiconductor device of claim 1 , wherein the metal gate region comprises a metal gate, and wherein the conductive cap is in contact with a first surface of the metal gate and is in contact with a portion of a second surface of the metal gate.

9. The semiconductor device of claim 1 , wherein the metal gate region comprises a first work function layer and a second work function layer, wherein the first work function layer is disposed on the high-K gate dielectric region and the second work function layer is disposed on the first work function layer, and wherein the first work function layer comprises a p-type metal oxide semiconductor (PMOS) work function metal layer and the second work function layer comprises an n-type metal oxide semiconductor (NMOS) work function metal layer.

10. The semiconductor device of claim 1 , wherein the gate region is disposed within a channel of an inter-layer dielectric (ILD) layer, wherein the channel is defined by a recess in the ILD layer exposing a surface of a substrate, wherein the ILD layer is disposed on the surface of the substrate, and wherein the channel has a channel length that is less than 20 nanometers (nm).

11. The semiconductor device of claim 10 , further comprising a first spacer layer and a second spacer layer disposed on opposing sides of the gate region.

12. A semiconductor device comprising:

a gate region, wherein the gate region includes a metal gate region and a high dielectric constant (high-K) gate dielectric region, wherein the metal gate region comprises a metal gate;

a conductive cap disposed on a surface of the metal gate region and on a surface of the high-K gate dielectric region, wherein the conductive cap is in contact with a first surface of the metal gate and is in contact with a portion of a second surface of the metal gate; and

an interconnect disposed on the conductive cap, wherein the conductive cap includes a conductive material that electrically connects the gate region to the interconnect.

13. The semiconductor device of claim 12 , wherein the interconnect includes copper (Cu), and wherein the conductive cap substantially inhibits diffusion of the copper (Cu) from the interconnect into the gate region.

14. The semiconductor device of claim 13 , wherein the interconnect further includes a liner material that is positioned between the copper (Cu) and the conductive cap.

15. The semiconductor device of claim 12 , wherein the metal gate region includes a work function material disposed between a gate metal of the metal gate region and the high-K gate dielectric region.

16. The semiconductor device of claim 15 , wherein the conductive cap substantially inhibits diffusion of the work function material from the metal gate region into the interconnect.

17. The semiconductor device of claim 12 , wherein the metal gate region comprises a first work function layer and a second work function layer, wherein the first work function layer is disposed on the high-K gate dielectric region and the second work function layer is disposed on the first work function layer, and wherein the first work function layer comprises a p-type metal oxide semiconductor (PMOS) work function metal layer and the second work function layer comprises an n-type metal oxide semiconductor (NMOS) work function metal layer.

18. The semiconductor device of claim 12 , wherein the conductive material of the conductive cap includes tungsten (W), cobalt (Co), or tantalum (Ta), and wherein a gate metal of the metal gate region includes aluminum (Al) or tungsten (W).

19. The semiconductor device of claim 12 , wherein the gate region is disposed within a channel of an inter-layer dielectric (ILD) layer, wherein the channel is defined by a recess in the ILD layer exposing a surface of a substrate, wherein the ILD layer is disposed on the surface of the substrate, and wherein the channel has a channel length that is less than 20 nanometers (nm).

20. A semiconductor device comprising:

a gate region, wherein the gate region includes a metal gate region and a high dielectric constant (high-K) gate dielectric region, wherein the metal gate region comprises a first work function layer and a second work function layer, wherein the first work function layer is disposed on the high-K gate dielectric region and the second work function layer is disposed on the first work function layer;

a conductive cap disposed on a surface of the metal gate region and on a surface of the high-K gate dielectric region; and

an interconnect disposed on the conductive cap, wherein the conductive cap includes a conductive material to electrically connect the gate region to the interconnect.

21. The semiconductor device of claim 20 , wherein the interconnect includes copper (Cu), and wherein the conductive cap substantially inhibits diffusion of the copper (Cu) from the interconnect into the gate region.

22. The semiconductor device of claim 21 , wherein the interconnect further includes a liner material that is positioned between the copper (Cu) and the conductive cap.

23. The semiconductor device of claim 20 , wherein the conductive cap substantially inhibits diffusion of a work function material of the first and second work function layers from the metal gate region into the interconnect.

24. The semiconductor device of claim 20 , wherein the conductive material of the conductive cap includes tungsten (W), cobalt (Co), or tantalum (Ta), and wherein a gate metal of the metal gate region includes aluminum (Al) or tungsten (W).

25. The semiconductor device of claim 20 , wherein the first work function layer comprises a p-type metal oxide semiconductor (PMOS) work function metal layer and the second work function layer comprises an n-type metal oxide semiconductor (NMOS) work function metal layer.

26. The semiconductor device of claim 20 , wherein the gate region is disposed within a channel of an inter-layer dielectric (ILD) layer, wherein the channel is defined by a recess in the ILD layer exposing a surface of a substrate, wherein the ILD layer is disposed on the surface of the substrate, and wherein the channel has a channel length that is less than 20 nanometers (nm).