IP Library › Granted Patent US 9,704,956
Granted Patent B2
US 9,704,956 · App. 14/989,470 · Granted Jul 11, 2017

Electrical devices with graphene on boron nitride

Inventors: Kenneth Shepard (Ossing, NY); Philip Kim (New York, NY); James C. Hone (New York, NY); Cory Dean (New York, NY)
Assignee: The Trustees of Columbia University in the city of New York
H01L29/1606H01L29/0665H01L29/1033H01L29/42356H01L29/518H01L29/66742H01L29/778H01L29/78603H01L29/78684
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Quick Facts
Patent No.
US 9,704,956
App. No.
14/989,470
Granted
Jul 11, 2017
Kind
B2
Abstract

Methods of forming and resulting devices are described that include graphene devices on boron nitride. Selected methods of forming and resulting devices include graphene field effect transistors (GFETs) including boron nitride.

Claims (12)

1. An electronic device comprising:

a boron nitride surface;

a graphene layer over the boron nitride surface having a non-zero degree of lattice mismatch causing misalignment; and

one or more electrical contacts on the graphene layer.

2. The electronic device of claim 1 , wherein the one or more electrical contacts include a pair of source/drain regions having a graphene channel region located therebetween, and a gate electrode located adjacent to the graphene channel region to form a transistor.

3. The electronic device of claim 1 , wherein the non-zero degree of lattice mismatch includes rotation about a line normal to an interface plane between a lattice in the graphene layer and a lattice in the boron nitride surface.

4. The electronic device of claim 1 , wherein the boron nitride surface includes a boron nitride layer over a substrate.

5. The electronic device of claim 2 , wherein the gate electrode is below the graphene channel region.

6. The electronic device of claim 5 , wherein the gate electrode is separated from the graphene channel region by the boron nitride layer.

7. The electronic device of claim 2 , wherein the gate electrode is above the graphene channel region.

8. The electronic device of claim 2 , wherein the transistor is formed on a silicon substrate.

9. The electronic device of claim 8 , wherein the transistor is formed on an SiO 2 layer on the silicon substrate.

Continuity (3)
Division 13996214
Provisional Application 61425636 · Dec 21, 2010
Related Publication 20160197148A1 · Jul 7, 2016