Line structure and a method for producing the same
A multi-layer line structure including a substrate, a lower layer Cu line located on the substrate, an upper layer Cu line located on an insulating layer including an inorganic film located on the lower layer Cu line and an organic resin film located on the inorganic film, and a via connection part located in a via connection hole running in an up-down direction through the insulating layer in an area where the lower layer Cu line and the upper layer Cu line overlap each other is provided. The via connection part includes a barrier conductive layer located on a part of the lower layer Cu line exposed to a bottom part of the via connection hole and on an inner wall of the via connection hole.
1. A multi-layer line structure, comprising:
a substrate;
a lower layer Cu line located on the substrate;
an upper layer Cu line located on an insulating layer including an inorganic film located on the lower layer Cu line and an organic resin film located on the inorganic film; and
a via connection part located in a via connection hole running in an up-down direction through the insulating layer in an area where the lower layer Cu line and the upper layer Cu line overlap each other, the via connection hole having a pore diameter between 0.5 μm to 20 μm and a height between 5 μm to 20 μm;
wherein:
the via connection part includes a barrier conductive layer located on a part of the lower layer Cu line exposed to a bottom part of the via connection hole and on an inner wall of the via connection hole;
the inorganic film consisting of a first inorganic film and a second inorganic film, the first inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the second inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the second inorganic film being thicker than a thickness of the first inorganic film;
the first inorganic film wholly covers and is in contact with a side surface of the lower layer Cu line and a top surface of the lower layer Cu line other than a part of the top surface overlapping with the via connection hole, and an end of the first inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer;
the second inorganic film wholly covers and is in contact with the first inorganic film, and an end of the second inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer; and
a ratio of a thickness of the inorganic film with respect to a total of the thickness of the inorganic film and a thickness of the organic resin film is 20% or greater and 80% or less in the insulating layer presented between the top surface of the lower layer Cu line and a bottom surface of the upper layer Cu line.
2. The multi-layer line structure according to claim 1 , wherein a material of the barrier conductive layer contains a high-melting-point metal material or a compound thereof.
3. The multi-layer structure according to claim 1 , wherein a material forming the organic resin film has a dielectric constant lower than a dielectric constant of a material forming the inorganic film.
4. The multi-layer structure according to claim 1 , wherein:
the second inorganic film contains SiO 2 ; and
the second inorganic film has a compressive stress of −100 to −300 MPa as a film stress.
5. The multi-layer structure according to claim 1 further comprising:
an insulating layer including an inorganic film located on the upper layer Cu line; and
an organic resin film located on the inorganic film located on the upper layer Cu line;
wherein:
the inorganic film located on the upper layer Cu line includes a third inorganic film and a fourth inorganic film, the third inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the fourth inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the fourth inorganic film being thicker than a thickness of the third inorganic film;
the third inorganic film wholly covers and is in contact with a side surface and a top surface of the upper layer Cu line; and
the fourth inorganic film wholly covers and is in contact with the third inorganic film.
6. The multi-layer structure according to claim 5 , wherein;
the fourth inorganic film contains SiO 2 ; and
the fourth inorganic film has a compressive stress of −100 to −300 MPa as a film stress.
7. The multi-layer structure according to claim 5 , wherein a material forming the organic resin film located on the inorganic film located on the upper layer Cu line has a dielectric constant lower than a dielectric constant of a material forming the inorganic film located on the upper layer Cu line.
8. The multi-layer structure according to claim 5 , wherein a ratio of a thickness of the inorganic film located on the upper layer Cu line with respect to a total of the thickness of the inorganic film located on the upper layer Cu line and a thickness of the organic resin film located on the inorganic film located on the upper layer Cu line is 20% or greater and 80% or less.
9. A multi-layer line structure including a stack of a plurality of layers including a first layer and a second layer, wherein:
the first layer includes a first Cu line;
the second layer includes:
a second Cu line;
an insulating film located between the second Cu line and the first Cu line; and
a via connection part located in a via connection hole running in an up-down direction through the insulating layer in an area where the first Cu line and the second Cu line overlap each other, the via connection hole having a pore diameter between 0.5 μm to 20 μm and a height between 5 μm to 20 μm;
the insulating film includes an inorganic film covering at least a surface of the second Cu line facing the first Cu line, among surfaces of the second Cu line, and an organic resin film covering the inorganic film;
the via connection part includes a barrier conductive layer located on a part of the second Cu line exposed to a bottom part of the via connection hole and on an inner wall of the via connection hole;
the inorganic film consisting of a first inorganic film and a second inorganic film, the first inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the second inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the second inorganic film being thicker than a thickness of the first inorganic film;
the first inorganic film wholly covers and is in contact with a side surface with respect to the surface of the second Cu line facing the first Cu line and the surface of the second Cu line facing the first Cu line other than a part of the surface overlapping with the via connection hole, among the surfaces of the second Cu line, and an end of the first inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer;
the second inorganic film wholly covers and is in contact with the first inorganic film, and an end of the second inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer; and
a ratio of a thickness of the inorganic film with respect to a total of the thickness of the inorganic film and a thickness of the organic resin film is 20% or greater and 80% or less in the insulating layer presented between the first Cu line and the second Cu line.
10. The multi-layer line structure according to claim 9 , wherein:
a material forming the organic resin film has a dielectric constant lower than a dielectric constant of a material forming the inorganic film.
11. The multi-layer line structure according to claim 9 , wherein a material of the barrier conductive layer contains a high-melting-point metal material or a compound thereof.
12. The multi-layer line structure according to claim 9 , wherein:
the second inorganic film contains SiO 2 ; and
the second inorganic film has a compressive stress of −100 to −300 MPa as a film stress.
13. The multi-layer line structure according to claim 9 , wherein:
the organic resin film includes a first organic insulating film and a second organic insulating film stacked thereon;
the first organic insulating film and the second organic insulating film are in contact with each other; and
a third Cu line is located between the first organic insulating film and the second organic insulating film.
14. The multi-layer line structure according to claim 13 , wherein:
the third Cu line is located between the first Cu line and the second Cu line, and the via connection part includes an upper part between the first Cu line and the third Cu line and a lower part between the third Cu line and the second Cu line; and
a barrier conductive material is located between the upper part and the third Cu line.
15. The multi-layer line structure according to claim 13 , wherein the second layer includes a fourth Cu line at a position other than a position where the via connection hole is located, a layer located above the first layer includes a fifth Cu line, and the fourth Cu line and the fifth Cu line do not have a Cu line therebetween.
16. The multi-layer line structure according to claim 15 , the layer located above the first layer further including a sixth Cu line;
wherein:
the first layer further includes an insulating layer including an inorganic film located between the first Cu line and the sixth Cu line, an organic resin film located on the inorganic film located between the first Cu line and the sixth Cu line, and a via connection part located in a via connection hole running in an up-down direction through the insulating layer located between the first Cu line and the sixth Cu line in an area where the first Cu line and the sixth Cu line overlap each other;
the via connection part located in the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line includes a barrier conductive layer located on a part of the first Cu line exposed to a bottom part of the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line and on an inner wall of the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line;
the inorganic film located between the first Cu line and the sixth Cu line consisting of a third inorganic film and a fourth inorganic film, the third inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the fourth inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the fourth inorganic film being thicker than a thickness of the third inorganic film;
the third inorganic film wholly covers and is in contact with a side surface of the first Cu line and a top surface of the first Cu line other than a part of the top surface overlapping with the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line, and an end of the third inorganic film on the side of the inner wall of the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line is in contact with the barrier conductive layer; and
the fourth inorganic film wholly covers and is in contact with the third inorganic film, and an end of the fourth inorganic film on the side of the inner wall of the via connection hole running in the up-down direction through the insulating layer located between the first Cu line and the sixth Cu line is in contact with the barrier conductive layer.
17. The multi-layer line structure according to claim 16 , wherein a material forming the organic resin film located on the inorganic film located between the first Cu line and the sixth Cu line has a dielectric constant lower than a dielectric constant of a material forming the inorganic film located between the first Cu line and the sixth Cu line.
18. The multi-layer line structure according to claim 16 , wherein a ratio of a thickness of the inorganic film located between the first Cu line and the sixth Cu line with respect to a total of the thickness of the inorganic film located between the first Cu line and the sixth Cu line and a thickness of the organic resin film located on the inorganic film located between the first Cu line and the sixth Cu line is 20% or greater and 80% or less.
19. The multi-layer structure according to claim 16 , wherein;
the fourth inorganic film contains SiO 2 ; and
the fourth inorganic film has a compressive stress of −100 to −300 MPa as a film stress.
20. A method for producing a multi-layer line structure, comprising:
forming a lower layer Cu line on a substrate;
forming an inorganic film on the lower layer Cu line so as to cover a top surface and a side surface of the lower layer Cu line;
forming an organic resin film on the inorganic film to form an insulating film including the inorganic film and the organic resin film;
forming an opening reaching the lower layer Cu line in the insulating layer to form a via connection hole;
forming a barrier conductive layer at a bottom part and on an inner wall of the via connection hole;
filling the via connection hole with Cu to form a via connection part; and
forming an upper layer Cu line on the via connection part;
wherein:
forming the inorganic film consisting of forming a first inorganic film and a second inorganic film, the first inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the second inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the second inorganic film being thicker than a thickness of the first inorganic film;
the first inorganic film wholly covers and is in contact with a side surface of the lower layer Cu line and a top surface of the lower layer Cu line other than a part of the top surface overlapping with the via connection hole, and an end of the first inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer;
the second inorganic film wholly covers and is in contact with the first inorganic film, and an end of the second inorganic film on the side of the inner wall of the via connection hole is in contact with the barrier conductive layer;
the opening has a pore diameter between 0.5 μm to 20 μm and a height between 5 μm to 20μm; and
a ratio of a thickness of the inorganic film with respect to a total of the thickness of the inorganic film and a thickness of the organic resin film is 20% or greater and 80% or less in the insulating layer presented between the top surface of the lower layer Cu line and a bottom surface of the upper layer Cu line.
21. The method for producing a multi-layer line structure according to claim 20 , wherein a material of the barrier conductive layer contains a high-melting-point metal material or a compound thereof.
22. The method for producing a multi-layer line structure according to claim 20 , wherein a material forming the organic resin film has a dielectric constant lower than a dielectric constant of a material forming the inorganic film.
23. The method for producing a multi-layer line structure according to claim 20 , wherein:
the second inorganic film contains SiO 2 ; and
the second inorganic film has a compressive stress of −100 to −300 MPa as a film stress.
24. The method for producing a multi-layer line structure according to claim 20 further comprising:
forming an inorganic film on the upper layer Cu line so as to cover a top surface and a side surface of the upper layer Cu line; and
forming an organic resin film on the inorganic film formed on the upper layer Cu line;
wherein:
forming the inorganic film consisting of forming a third inorganic film and a fourth inorganic film, the third inorganic film containing an inorganic material selected from a group consisting of SiN and SiC, the fourth inorganic film containing an inorganic material selected from a group consisting of SiO 2 , SiOC and SiOF, and a thickness of the fourth inorganic film being thicker than a thickness of the third inorganic film;
the third inorganic film wholly covers and is in contact with a side surface and a top surface of the upper layer Cu line; and
the fourth inorganic film wholly covers and is in contact with the third inorganic film.
25. The method for producing a multi-layer line structure according to claim 24 , wherein a material forming the organic resin film formed on the inorganic film formed on the upper layer Cu line has a dielectric constant lower than a dielectric constant of a material forming the inorganic film formed on the upper layer Cu line.
26. The method for producing a multi-layer line structure according to claim 24 , wherein a ratio of a thickness of the inorganic film formed on the upper layer Cu line with respect to a total of the thickness of the inorganic film formed on the upper layer Cu line and a thickness of the organic resin film formed on the inorganic film formed on the upper layer Cu line is 20% or greater and 80% or less.
27. The multi-layer line structure according to claim 24 , wherein:
the fourth inorganic film contains SiO 2 ; and
the fourth inorganic film has a compressive stress of −100 to −300 MPa as a film stress.