Test and measurement device for measuring integrated coherent optical receiver

1. A phase adjustor for adjusting a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT), comprising:

a laser source structured to couple to a lightwave component analyzer and to an optical phase adjustor driven by a phase adjust driver;

an output of the lightwave component analyzer adapted to couple to a first test input to the DUT;

an output of the optical phase adjustor adapted to couple to an oscillator input to the DUT; and

an monitor selector adapted to accept at least two outputs of the DUT and structured to transmit a selected output of the DUT to the phase adjust driver, in which the phase adjust driver is structured to drive the optical phase adjustor with a control signal based on the output of the DUT that is selected by the monitor selector.

2. The phase adjustor for adjusting a phase angle of a local oscillator according to claim 1 in which the optical phase adjustor comprises a fiber optic loop stretcher.

3. The phase adjustor for adjusting a phase angle of a local oscillator according to claim 1 in which a signal path from the laser source through the lightwave component analyzer to the first test input to the DUT has a length within one meter of a length of a signal path from the laser source to the oscillator input to the DUT.

4. The phase adjustor for adjusting a phase angle of a local oscillator according to claim 1 in which the control signal of the phase adjust driver causes a phase angle difference of the output of the lightwave component analyzer and the output of the optical phase adjustor to be controllably driven to approximately zero.

5. The phase adjustor for adjusting a phase angle of a local oscillator according to claim 1 in which the DUT output that is selected by the monitor selector is also a selected input to the lightwave component analyzer.

6. The phase adjustor for adjusting a phase angle of a local oscillator according to claim 1 in which the DUT output that is selected by the monitor selector is different than a selected input to the lightwave component analyzer.

7. A method for adjusting a phase angle of a local oscillator relative to a phase angle of a signal input of a Device Under Test (DUT), the method comprising:

generating a first laser signal having a fixed path length from a laser to a signal input of the DUT;

generating a second laser signal having an adjustable length path from the laser to a local oscillator input of the DUT, the adjustable length path including an optical phase adjustor;

selectively coupling an output of the DUT to a phase controller driver for the controllable loop of fiber optic cable; and

driving the optical phase adjustor with a control signal derived from the selected output of the DUT.

8. The method for adjusting a phase angle of a local oscillator according to claim 7 , in which the optical phase adjustor is a controllable loop of fiber optic cable and in which driving the optical phase adjustor comprises driving a piezo-electric loop stretcher.

9. The method for adjusting a phase angle of a local oscillator according to claim 7 , in which a length of the fixed length path is within one meter of a length of the adjustable length path.

10. The method for adjusting a phase angle of a local oscillator according to claim 7 , in which driving the optical phase adjustor causes a phase angle difference of the first laser signal and the second laser signal to be driven to approximately zero.

11. The method for adjusting a phase angle of a local oscillator according to claim 7 , in which driving the optical phase adjustor causes a phase angle difference of the first laser signal and the second laser signal to be driven to approximately π.

12. The method for adjusting a phase angle of a local oscillator according to claim 7 , further comprising:

performing tests on the selected output of the DUT.

13. The method for adjusting a phase angle of a local oscillator according to claim 7 , further comprising:

performing tests on an output of the DUT other than the selected output of the DUT.

14. A system for testing a Device Under Test (DUT), comprising:

a laser source coupled to a lightwave component analyzer and to an optical phase adjustor driven by a phase adjust driver;

an output of the lightwave component analyzer coupled to a first test input to the DUT;

an output of the phase adjust driver coupled to an oscillator input to the DUT; and

a monitor selector adapted to accept at least two outputs of the DUT and structured to transmit a selected output of the DUT to the phase adjust driver, in which the phase adjust driver is structured to drive the optical phase adjustor with a control signal based on the DUT output that is selected by the monitor selector.

15. A system for testing a Device Under Test (DUT) according to claim 14 , in which the optical phase adjustor comprises a loop stretcher for stretching a loop of fiber optic cable.

16. A system for testing a Device Under Test (DUT) according to claim 14 , in which a signal path from the laser source through the lightwave component analyzer to the first test input to the DUT has a length within one meter of a length of a signal path from the laser source to the oscillator input to the DUT.

17. A system for testing a Device Under Test (DUT) according to claim 14 , in which the control signal of the phase adjust driver causes a phase angle difference of the output of the lightwave component analyzer and the output of the optical phase adjustor to be controllable driven to approximately zero.

18. A system for testing a Device Under Test (DUT) according to claim 14 , in which the DUT output that is selected by the monitor selector is also a selected input to the lightwave component analyzer.

19. A system for testing a Device Under Test (DUT) according to claim 14 , in which the DUT output that is selected by the monitor selector is different than a selected input to the lightwave component analyzer.