Plasma ion source and charged particle beam apparatus
A plasma ion source includes: a gas introduction chamber, into which raw gas is introduced; a plasma generation chamber connected to the gas introduction chamber and made of a dielectric material; a coil wound along an outer circumference of the plasma generation chamber and to which high-frequency power is applied; an envelope surrounding the gas introduction chamber, the plasma generation chamber and the coil; and insulating liquid filled inside the gas introduction chamber, the plasma generation chamber and the envelope to immerse the coil and having an dielectric strength voltage relatively greater than that of the envelope and the same dielectric dissipation factor as the plasma generation chamber.
1. A plasma ion source comprising:
a gas introduction chamber, into which raw gas is introduced;
a plasma generation chamber connected to the gas introduction chamber and made of a dielectric material;
a coil wound along an outer circumference of the plasma generation chamber and to which high-frequency power is applied;
an envelope surrounding the gas introduction chamber, the plasma generation chamber and the coil;
a liquid chamber configured between an outer wall of the gas introduction chamber and an inner wall of the envelope and between an outer wall of the plasma generation chamber and the inner wall of the envelope; and
insulating liquid filled inside the liquid chamber to immerse the coil and having a dielectric strength voltage relatively greater than that of the envelope and the same dielectric dissipation factor as the plasma generation chamber.
2. The plasma ion source according to claim 1 ,
wherein the envelope is made of copper or aluminum.
3. The plasma ion source according to claim 1 ,
wherein the insulating liquid is fluorine based inert liquid.
4. The plasma ion source according to claim 1 ,
wherein the plasma generation chamber is made of any one of quartz glass, alumina and aluminum nitride.
5. The plasma ion source according to claim 1 further comprising:
a heat dissipation fin provided in the envelope.
6. A charged particle beam apparatus comprising:
the plasma ion source according to claim 1 ;
an ion beam barrel that irradiates ion beam by ions of the raw gas generated in the plasma ion source;
a stage on which a sample is mounted; and
a controller that controls the ion beam barrel and the stage to irradiate the ion beam onto the sample and performs at least any one of observation, processing and analysis of an irradiated area of the sample.
7. The charged particle beam apparatus according to claim 6 further comprising:
an electron beam barrel that irradiates electron beam,
wherein the controller further controls the ion beam barrel and the electron beam barrel to irradiate the ion beam and the electron beam onto the same area of the sample and performs at least any one of observation, processing and analysis of the irradiated area of the sample.