IP Library › Granted Patent US 9,773,914
Granted Patent B2
US 9,773,914 · App. 15/158,042 · Granted Sep 26, 2017

Optical sensing device and fabricating method thereof

Inventors: Ching-Wen Chen (Hsin-Chu, TW); An-Thung Cho (Hsin-Chu, TW)
Assignee: AU OPTRONICS CORPORATION
H01L29/78651H01L21/0274H01L27/124H01L27/3227H01L29/66765H01L31/09H01L31/18
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Quick Facts
Patent No.
US 9,773,914
App. No.
15/158,042
Granted
Sep 26, 2017
Kind
B2
Abstract

An optical sensing device includes a thin film transistor disposed on a substrate, an optical sensor, a planar layer, and an organic light emitting diode. The optical sensor includes a metal electrode disposed on a gate dielectric layer of the thin film transistor and connecting to a drain electrode of the thin film transistor, an optical sensing layer disposed on the metal electrode, and a first transparent electrode disposed on the optical sensing layer. The planar layer covers at least a part of the thin film transistor and the optical sensor. The organic light emitting diode is disposed on the planar layer. The anode electrode and the cathode electrode of the organic light emitting diode are electrically coupled to a gate line and a data line respectively.

Claims (26)

1. An optical sensing device comprising:

a substrate;

at least one thin film transistor disposed on the substrate, the thin film transistor comprising:

a gate electrode disposed on the substrate;

a channel layer;

a gate dielectric layer disposed between the gate electrode and the channel layer;

a source electrode; and

a drain electrode, wherein the source electrode and the drain electrode disposed on the opposite sides of the channel layer respectively;

at least one optical sensor comprising:

a first metal electrode disposed on the gate dielectric layer and connected to the drain electrode;

an optical sensing layer disposed on the first metal electrode; and

a first transparent electrode disposed on the optical sensing layer;

a planar layer covering at least a portion of the thin film transistor and the optical sensor; and

at least one organic light emitting diode disposed on the planar layer, wherein an orthogonal project of the organic light emitting diode does not overlap that of the optical sensor on the substrate, the organic light emitting diode comprising:

a second metal electrode disposed on the planar layer and electrically coupled to one of a gate line and a data line;

an organic electroluminescent layer disposed on the second metal electrode; and

a second transparent electrode disposed on the organic electroluminescent layer and electrically coupled to the other one of the gate line and the data line.

2. The optical sensing device of claim 1 , wherein the drain electrode and the first metal electrode are made of the same layer and photolithographed by the same mask.

3. The optical sensing device of claim 1 , wherein the orthogonal project of the second metal electrode is overlapped with at least a portion of that of the channel layer on the substrate.

4. The optical sensing device of claim 1 , wherein the orthogonal project of the second metal electrode is substantially complementary to that of the optical sensing layer on the substrate.

5. The optical sensing device of claim 1 , wherein the number of the organic light emitting diode is more than one and the organic light emitting diodes are passive organic light emitting diodes.

6. The optical sensing device of claim 1 , wherein the material of the optical sensing layer is silicon rich oxide, silicon rich nitride or silicon rich carbide.

7. The optical sensing device of claim 1 , wherein the substrate is a flexible substrate.

8. The optical sensing device of claim 1 , wherein an edge of the optical sensing layer shrinks a distance from that of the first metal electrode, and the distance is smaller than 1.5 micrometers.

9. The optical sensing device of claim 1 , wherein an edge of the optical sensing layer is aligned with that of the first metal electrode.

10. The optical sensing device of claim 1 , wherein the edge of the optical sensing layer is protruded from that of the first metal electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 17, 2016
From: CHEN, CHING-WEN; CHO, AN-THUNG
To: AU OPTRONICS CORPORATION
Reel/Frame 039070/0210 →
Priority Claims (1)
TW 104125000 A · Jul 31, 2015 · national
Continuity (1)
Related Publication 20170032167A1 · Feb 2, 2017