IP Library › Granted Patent US 9,793,433
Granted Patent B2
US 9,793,433 · App. 15/288,181 · Granted Oct 17, 2017

UV light emitting devices and systems and methods for production

Inventors: Yitao Liao (Hayward, CA); Robert Walker (Hayward, CA); Doug Collins (Hayward, CA)
Assignee: RAYVIO CORPORATION
H01L33/0075C23C14/0036C23C14/0617C23C14/0641C23C14/568C23C16/18C23C16/303C23C16/481C23C16/54H01L21/0243H01L21/0254H01L21/0262H01L21/02458H01L21/02505H01L33/007H01L33/0025H01L33/0062H01L33/06H01L33/16H01L33/18H01L33/32H01L2933/0091
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Quick Facts
Patent No.
US 9,793,433
App. No.
15/288,181
Granted
Oct 17, 2017
Kind
B2
Abstract

A method of fabricating an ultraviolet (UV) light emitting device includes receiving a UV transmissive substrate, forming a first UV transmissive layer comprising aluminum nitride upon the UV transmissive substrate using a first deposition technique at a temperature less than about 800 degrees Celsius or greater than about 1200 degrees Celsius, forming a second UV transmissive layer comprising aluminum nitride upon the first UV transmissive layer comprising aluminum nitride using a second deposition technique that is different from the first deposition technique, at a temperature within a range of about 800 degrees Celsius to about 1200 degrees Celsius, forming an n-type layer comprising aluminum gallium nitride layer upon the second UV transmissive layer, forming one or more quantum well structures comprising aluminum gallium nitride upon the n-type layer, and forming a p-type nitride layer upon the one or more quantum well structures.

Claims (19)

1. A method of fabricating an ultraviolet (UV) light emitting device comprising:

receiving a UV transmissive substrate;

forming a UV transmissive layer upon the UV transmissive substrate, comprising:

forming a first UV transmissive layer comprising aluminum nitride upon the UV transmissive substrate using a first deposition technique at a temperature less than about 800 degrees Celsius or greater than about 1200 degrees Celsius; and

forming a second UV transmissive layer comprising aluminum nitride upon the first UV transmissive layer comprising aluminum nitride using a second deposition technique that is different from the first deposition technique, at a temperature within a range of about 800 degrees Celsius to about 1200 degrees Celsius; and

forming a UV light emitting layer structure on the UV transmissive layer, comprising:

forming an n-type layer comprising aluminum gallium nitride layer upon the UV transmissive layer;

forming one or more quantum well structures comprising aluminum gallium nitride upon the n-type layer; and

forming a p-type nitride layer upon the one or more quantum well structures.

2. The method of claim 1 wherein the UV transmissive layer has a thickness within a range of about 10 nm to about 3 microns.

3. The method of claim 1 wherein the UV transmissive layer has a thickness of about 3 microns to 10 microns.

4. The method of claim 1 wherein the UV transmissive layer has transmissivity in the UV wavelength range within a transmissivity range of about 50% to about 99%.

5. The method of claim 1 wherein the method of forming the first UV transmissive layer uses a deposition process selected from a group consisting of: hydride vapor phase epitaxy, atomic layer deposition, liquid phase epitaxy, physical vapor deposition, sputtering, solid source solution epitaxy.

6. The method of claim 1 wherein the method of forming the second UV transmissive layer uses a deposition process selected from a group consisting of:

metalorganic chemical vapor deposition, metalorganic vapor phase epitaxy, molecular beam epitaxy, chemical beam epitaxy.

7. The method of claim 1

wherein the first UV transmissive layer comprises polycrystalline aluminum nitride; and

wherein the second UV transmissive layer comprises single crystal aluminum nitride.

8. The method of claim 1 wherein the receiving the UV transmissive substrate comprises receiving a substrate selected from a group consisting of: a quartz substrate, a sapphire substrate, and a free standing single crystal aluminum nitride substrate.

Continuity (3)
Division 14806370 · Jul 22, 2015
Provisional Application 62028256 · Jul 23, 2014
Related Publication 20170025565A1 · Jan 26, 2017