Arrangement for light sheet microscopy
An arrangement for light sheet microscopy including illumination optics with an illumination objective for illuminating a sample, located in a medium on a sample carrier aligned with respect to a plane reference surface, with a light sheet. The arrangement also includes detection optics with a detection objective. The arrangement further includes a separating layer system with at least one layer separating the medium from the illumination and detection objectives. The separating layer system contacts the medium by a base surface aligned parallel to the reference surface. A correction lens system, with at least one correction lens serving to reduce those aberrations which occur as a result of the oblique passage of illumination light and/or of light to be detected through interfaces of the separating layer system, is arranged between illumination objective and separating layer system and/or between detection objective and separating layer system.
1. An arrangement for light sheet microscopy comprising:
illumination optics comprising:
an illumination objective configured to illuminate a sample with a light sheet via an illumination beam path, when the sample is located in a medium on a sample carrier that is aligned with respect to a plane reference surface;
wherein an optical axis of the illumination objective and the light sheet lies in a plane which forms an illumination angle not equal to zero with the normals of the plane reference surface;
detection optics comprising:
a detection objective in a detection beam path;
wherein an optical axis of the detection objective forms a detection angle not equal to zero with the normals of the reference surface;
a separating layer system comprising;
at least one layer made of a predetermined material with a predetermined thickness which separates the medium from the illumination objective and the detection objective;
wherein the separating layer system is configured to contact the medium by a base surface aligned parallel to the reference surface at least in a region which is accessible by the illumination objective and the detection objective for illumination and detection; and
a correction lens system comprising:
at least one correction lens configured to reduce aberrations that occur as a result of an oblique passage of illumination light, of light to be detected, or a combination thereof through interfaces of the separating layer system;
wherein the correction lens system is arranged between the separating layer system and the illumination objective, the detection objective, or both.
2. The arrangment according to claim 1 :
wherein the at least one correction lens of the correction lens system is arranged in both the illumination beam path and the detection beam path.
3. The arrangement according to claim 1 , further comprising:
a further detection beam path with a further detection objective;
wherein the at least one correction lens of the correction lens system is also arranged in the further detection beam path.
4. The arrangment to according to claim 1 ;
wherein the correction lens system is configured to image the sample in a magnifying manner to generate a magnified image.
5. The arrangement according to claim 1 ;
wherein the correction lens system comprising a first spherical lens and a second spherical lens;
wherein one of the first and second spherical lenses is the at leat one correction lens, or both of the first and second spherical lenses are different from the at least one correction lens.
6. The arrangement according to claim 1 ;
wherein the correction lens system comprises lens system comprises an aspherical lens with at least one aspherical surface;
wherein the aspherical lens is the at least one correction lens or is different from the at least one correction lens.