IP Library › Granted Patent US 9,806,099
Granted Patent B2
US 9,806,099 · App. 15/275,687 · Granted Oct 31, 2017

Semiconductor device

Inventors: Shunpei Yamazaki (Tokyo, JP); Hiroyuki Miyake (Kanagawa, JP); Hideaki Shishido (Kanagawa, JP); Jun Koyama (Kanagawa, JP)
Assignee: Semiconductor Energy Laboratory Co., Ltd.
H01L27/1225H01L27/1255H01L29/7869
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,806,099
App. No.
15/275,687
Granted
Oct 31, 2017
Kind
B2
Abstract

A semiconductor device including a capacitor whose charge capacity is increased while improving the aperture ratio is provided. Further, a semiconductor device which consumes less power is provided. A transistor which includes a light-transmitting semiconductor film, a capacitor in which a dielectric film is provided between a pair of electrodes, an insulating film which is provided over the light-transmitting semiconductor film, and a first light-transmitting conductive film which is provided over the insulating film are included. The capacitor includes the first light-transmitting conductive film which serves as one electrode, the insulating film which functions as a dielectric, and a second light-transmitting conductive film which faces the first light-transmitting conductive film with the insulating film positioned therebetween and functions as the other electrode. The second light-transmitting conductive film is formed over the same surface as the light-transmitting semiconductor film of the transistor and is a metal oxide film containing a dopant.

Claims (43)

1. A display device comprising:

a transistor comprising:

a gate electrode;

a gate insulating film over the gate electrode; and

a semiconductor film comprising a channel formation region over the gate electrode with the gate insulating film therebetween,

a conductive layer, wherein a portion of the gate insulating film is formed over the conductive layer; and

a metal oxide layer over the gate insulating film,

wherein the metal oxide layer contacts the conductive layer through an opening of the gate insulating film,

wherein the channel formation region comprises an oxide semiconductor, and

wherein the metal oxide layer contains hydrogen at a higher concentration than the semiconductor film.

2. The display device according to claim 1 , wherein the semiconductor film and the metal oxide layer are over and in contact with a surface.

3. The display device according to claim 2 , wherein the gate insulating film includes the surface.

4. The display device according to claim 1 , further comprising a capacitor line, wherein the metal oxide layer is in direct contact with the capacitor line.

5. An electronic device comprising the display device according to claim 1 .

6. A display device comprising:

a transistor comprising:

a gate electrode;

a gate insulating film over the gate electrode; and

a semiconductor film comprising a channel formation region over the gate electrode with the gate insulating film therebetween,

a conductive layer, wherein a portion of the gate insulating film is formed over the conductive layer;

a metal oxide layer over the gate insulating film; and

a nitride insulating film over and in contact with the metal oxide layer,

wherein the metal oxide layer contacts the conductive layer through an opening of the gate insulating film,

wherein the channel formation region comprises an oxide semiconductor, and

wherein the metal oxide layer contains hydrogen at a higher concentration than the semiconductor film.

7. The display device according to claim 6 , wherein the semiconductor film and the metal oxide layer are over and in contact with a surface.

8. The display device according to claim 7 , wherein the gate insulating film includes the surface.

9. The display device according to claim 6 , further comprising a capacitor line, wherein the metal oxide layer is in direct contact with the capacitor line.

10. An electronic device comprising the display device according to claim 6 .

11. A display device comprising:

a transistor comprising:

a gate electrode;

a gate insulating layer over the gate electrode; and

a semiconductor layer comprising a channel formation region over the gate electrode with the gate insulating layer therebetween,

a conductive layer, wherein a portion of the gate insulating layer is over the conductive layer; and

a metal oxide layer over the gate insulating layer,

wherein the metal oxide layer contacts the conductive layer through an opening of the gate insulating layer,

wherein the channel formation region comprises an oxide semiconductor, and

wherein the metal oxide layer contains hydrogen at a higher concentration than the semiconductor layer.

12. The display device according to claim 11 , wherein the semiconductor layer and the metal oxide layer are over and in contact with a surface.

13. The display device according to claim 12 , wherein the gate insulating layer includes the surface.

14. The display device according to claim 11 , further comprising a capacitor line, wherein the metal oxide layer is in direct contact with the capacitor line.

15. An electronic device comprising the display device according to claim 11 .

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 15, 2016
From: YAMAZAKI, SHUNPEI; MIYAKE, HIROYUKI; SHISHIDO, HIDEAKI; KOYAMA, JUN
To: SEMICONDUCTOR ENERGY LABORATORY CO., LTD.
Reel/Frame 040327/0590 →
Priority Claims (2)
JP 2012-202125 · Sep 13, 2012 · national
JP 2013-053988 · Mar 15, 2013 · national
Continuity (2)
Continuation 14023295 · Sep 10, 2013
Related Publication 20170012062A1 · Jan 12, 2017