IP Library Granted Patent US 9,826,662
Granted Patent B2
US 9,826,662 · App. 14/103,868 · Granted Nov 21, 2017

Reusable phase-change thermal interface structures

Inventors: Joo Han Kim (Niskayuna, NY); Graham Charles Kirk (Milton Keynes, GB); Jay Todd Labhart (Cary, NC); Binoy Milan Shah (Queensbury, NY); Yogen Vishwas Utturkar (Niskayuna, NY); Pramod Charmarthy (Revere, MA); Tao Deng (Shanghai, CN)
Assignee: General Electric Company
H05K7/20454C09K5/063F28F21/08H01L23/4275H05K1/0203H01L2924/0002H05K7/20672
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Quick Facts
Patent No.
US 9,826,662
App. No.
14/103,868
Granted
Nov 21, 2017
Kind
B2
Abstract

A reusable phase-change thermal interface structure having a metal based foam and a fusible metal based alloy is provided. In a solid phase of the fusible metal based alloy the fusible metal based alloy is disposed at least in a portion of the metal based foam. Further, in a liquid phase of the fusible metal based alloy the fusible metal based alloy is disposed at least on a portion of one or more outer surfaces of the metal based foam.

Claims (24)

1. An electronic system, comprising:

a chassis having a pair of side walls, each said side wall defines a receptor, wherein each said receptor has a first surface and a second surface facing the first surface;

a heat frame disposed in the chassis, extending between the pair of side walls such that a portion of the heat frame is disposed in the receptor defined in one side wall of the pair of side walls and another portion of the heat frame is disposed in the receptor defined in other side wall of the pair of side walls, wherein the heat frame is disposed in the chassis in a slidable manner;

a circuit card assembly operatively coupled to the heat frame, wherein the circuit card assembly comprises:

a printed circuit board; and

at least one electronic component mounted on the printed circuit board;

a reusable phase-change thermal interface structure disposed between the portion of the heat frame and the first surface of the receptor, wherein the heat frame is configured to facilitate exchange of heat between the circuit card assembly and the chassis via the reusable phase-change thermal interface structure; and wherein the reusable phase-change thermal interface structure comprises:

a metal based foam; and

a fusible metal based alloy disposed at least in a portion of the metal based foam, wherein the fusible metal based alloy is configured to be in solid phase at an assembling temperature and in liquid phase at an operating temperature, and

a wedge lock structure disposed in the receptor between the portion of the heat frame and the second surface of the receptor.

2. The electronic system of claim 1 , wherein a thickness of the reusable phase-change thermal interface structure during operation is in a range from 10 microns to 1000 microns.

3. The electronic system of claim 1 , wherein the first surface has a surface roughness equal to or greater than 25 microns.

4. The electronic system of claim 1 , wherein the reusable phase-change thermal interface structure experiences a pressure in a range from 35 k Pa (5 psi) to 6900 k Pa (1000 psi) at the operating temperature.

5. The electronic system of claim 1 , wherein the at least one electronic component is a processor.

6. The electronic system of claim 1 , wherein the metal based foam comprises interconnected pores.

7. The electronic system of claim 1 , wherein the metal based foam comprises porous structures or an interconnected network of solid struts.

8. The electronic system of claim 1 , wherein the metal based foam comprises aluminum, tantalum, titanium, copper, or alloys or composites thereof.

9. The electronic system of claim 1 , wherein the fusible metal based alloy comprises indium, bismuth, tin, gallium, lead or alloys, or combinations thereof.

10. The electronic system of claim 1 , wherein the fusible metal based alloy is configured to be pumped out of one or more pores of the metal based foam in the liquid phase of the fusible metal based alloy.

11. The electronic system of claim 1 , wherein the fusible metal based alloy is configured to retract in the metal based foam prior to conversion from the liquid phase to the solid phase.

12. The electronic system of claim 1 , wherein the assembling temperature of the reusable phase-change thermal interface structure is less than 85° C.

13. The electronic system of claim 1 , wherein the operating temperature of the reusable phase-change thermal interface structure is greater than 30° C.

14. The electronic system of claim 1 , wherein the fusible metal based alloy is configured to exist in the liquid phase at a temperature in a range from 40° C. to 220° C.

15. The electronic system of claim 1 , wherein the reusable phase-change thermal interface structure has a thermal conductivity equal to or more than 1 W/m K.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 12, 2013
From: KIM, JOO HAN; KIRK, GRAHAM CHARLES; LABHART, JAY TODD; SHAH, BINOY MILAN; UTTURKAR, YOGEN VISHWAS; CHARMARTHY, PRAMOD; DENG, TAO
To: GENERAL ELECTRIC COMPANY
Reel/Frame 031765/0831 →
Continuity (1)
Related Publication 20150168087A1 · Jun 18, 2015