IP Library Granted Patent US 9,854,656
Granted Patent B2
US 9,854,656 · App. 14/476,808 · Granted Dec 26, 2017

Detection of X-ray radiation

Inventors: Edgar Göderer (Forchheim, DE); Steffen Kappler (Effeltrich, DE)
Assignee: SIEMENS AKTIENGESELLSCHAFT
H05G1/58A61B6/032A61B6/4241G01N23/046G01T1/17G01T1/36
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Quick Facts
Patent No.
US 9,854,656
App. No.
14/476,808
Filed
Sep 4, 2014
Granted
Dec 26, 2017
Kind
B2
Art Unit
2884
USPC
378/19
Abstract

An X-ray detector is disclosed, including a detection unit to generate a detection signal for incident X-ray radiation; a signal analysis module to determine a set of count rates for incident X-ray radiation based upon the detection signal and signal analysis parameters for X-ray radiation; and a switchover control unit for switching between first signal analysis parameters and second signal analysis parameters. When an amount of X-ray radiation is incident on the detection module, a first set of count rates is generated for a first time interval based upon first signal analysis parameters and a second set of count rates is generated for a second time interval based upon second signal analysis parameters, different from the first signal analysis parameters. An X-ray imaging system including the detector; a method for determining count rates for X-ray radiation; and a method for calibrating signal analysis parameters are also disclosed.

Claims (34)

1. An X-ray detector, comprising:

a detection unit, configured to generate a detection signal for X-ray radiation incident on the detection unit;

a signal analysis module, configured to determine a set of count rates for X-ray radiation incident on the detection unit on the basis of the detection signal and signal analysis parameters for X-ray radiation; and

a switchover control unit, configured to switch between at least first signal analysis parameters and second signal analysis parameters such that when an amount of X-ray radiation is incident on the detection module, a first set of count rates being generated for a first time interval on the basis of first signal analysis parameters, and a second set of count rates being generated for a second time interval on the basis of second signal analysis parameters, different from the first signal analysis parameters, the first and second signal analysis parameters being either signal shaping parameters or detection signal combination parameters.

2. The X-ray detector of claim 1 , wherein a start of the first time interval and a start of the second time interval are separated by a time gap of between 100 μs and 1 ms.

3. The X-ray detector of claim 2 , wherein the switchover unit is configured for cyclic switchover between the first signal analysis parameters and the second signal analysis parameters.

4. The X-ray detector of claim 3 , wherein the switchover unit is configured for alternating switchover between the first signal analysis parameters and the second signal analysis parameters.

5. The X-ray detector of claim 2 , further comprising:

a memory unit, configured to simultaneously store the first signal analysis parameters and the second signal analysis parameters.

6. An X-ray imaging system, comprising:

an X-ray source; and

the X-ray detector of claim 2 .

7. The X-ray detector of claim 1 , wherein the switchover unit is configured for cyclic switchover between the first signal analysis parameters and the second signal analysis parameters.

8. The X-ray detector of claim 7 , wherein the switchover unit is configured for alternating switchover between the first signal analysis parameters and the second signal analysis parameters.

9. The X-ray detector of claim 1 , further comprising:

a memory unit, configured to simultaneously store the first signal analysis parameters and the second signal analysis parameters.

10. The X-ray detector of claim 1 , wherein the switchover unit includes a trigger interface, configured to receive a trigger signal for triggering the switchover.

11. An X-ray imaging system, comprising:

an X-ray source; and

the X-ray detector of claim 1 .

12. The X-ray imaging system of claim 11 , wherein the X-ray imaging system is a CT system.

13. The X-ray detector of claim 1 , wherein the a switchover control unit, configured to switch between at least first signal analysis parameters and second signal analysis parameters, configures the detector to switch between the first and second signal analysis parameters to allow for a relatively more precise measurement of electrical charges or one of a relatively more precise separation of x-ray quanta and a charge summing mode.

14. A method for determining count rates for X-ray radiation of an X-ray detector including a detection unit for generating a detection signal for X-ray radiation incident on the detection unit, the method comprising:

generating, via signal analysis module, a first set of count rates for X-ray radiation incident on the detection unit on the basis of first signal analysis parameters;

performing a switchover of the signal analysis module to second signal analysis parameters, different from the first signal analysis parameters; and

determining, via the signal analysis module, a second set of count rates for X-ray radiation incident on the detection unit on the basis of the second signal analysis parameters, the first and second signal analysis parameters being either signal shaping parameters or detection signal combination parameters.

15. The method of claim 14 , wherein the switchover is performed cyclically.

16. The method of claim 15 , wherein the switchover is performed cyclically in a maximum of sixteen cycles.

17. The method of claim 16 , wherein the switchover is performed cyclically in a maximum of sixteen cycles, in an alternating manner.

18. The method of claim 14 , wherein the switchover takes place at least one of

in synchronism with the switchover of an X-ray spectrum of an X-ray source, and

in synchronism with the switchover of the focus position of an X-ray source.

19. The method of claim 14 , wherein the first signal analysis parameters are adapted to a first type of desired image characteristics, and the second signal analysis parameters are adapted to a second type of desired image characteristics, different from the first type of desired image characteristics.

20. The method of claim 14 , wherein the switchover is performed to switch between the first and second signal analysis parameters to allow for a relatively more precise measurement of electrical charges or one of a relatively more precise separation of x-ray quanta and a charge summing mode.

Assignments (4)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE PREVIOUSLY RECORDED AT REEL: 066088 FRAME: 0256. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Jan 17, 2024
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 071178/0246 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 20, 2023
From: SIEMENS HEALTHCARE GMBH
To: SIEMENS HEALTHINEERS AG
Reel/Frame 066088/0256 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Mar 9, 2018
From: SIEMENS AKTIENGESELLSCHAFT
To: SIEMENS HEALTHCARE GMBH
Reel/Frame 045161/0852 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 22, 2014
From: GOEDERER, EDGAR; KAPPLER, STEFFEN
To: SIEMENS AKTIENGESELLSCHAFT
Reel/Frame 033784/0591 →
Priority Claims (1)
DE 10 2013 218 692 · Sep 18, 2013 · national
Continuity (1)
Related Publication 20150078512A1 · Mar 19, 2015