Semiconductor memory device for switching high voltage without potential drop
There are provided a high voltage switch circuit and a semiconductor memory device including the same. A high voltage switch circuit may include a switching circuit including a first depletion transistor and a first high voltage transistor, which are coupled in series between an input terminal and an output terminal, and a control signal generator for applying, to the first depletion transistor, a control signal having the same potential level as an input voltage applied to the input terminal, in response to a first enable signal and a second enable signal.
1. A semiconductor memory device, comprising:
a memory cell array configured to include a plurality of memory cells;
a voltage provider configured to generate a plurality of pump voltages and a plurality of operation voltages;
a high voltage switch configured to output an output voltage by switching the plurality of pumping voltages;
a block switch configured to output a block select signal by using the output voltage in response to an address signal; and
a pass circuit configured to transmit the plurality of operation voltages to the memory cell array in response to the block select signal,
wherein the high voltage switch outputs the output voltage with the same potential level as the plurality of pump voltages,
wherein the high voltage switch includes:
a first high voltage switch circuit configured to switch a program pump voltage among the plurality of pump voltages and output the switched program pump voltage as the output voltage; and
a second high voltage switch circuit configured to switch a pass pump voltage among the plurality of pump voltages and output the switched pass pump voltage as the output voltage.
2. The semiconductor memory device of claim 1 , wherein each of the first and second high voltage switch circuits includes:
a switching circuit configured to include a first depletion transistor and a first high voltage transistor, which are coupled in series between an input terminal and an output terminal; and
a control signal generator configured to apply, to the first depletion transistor, a control signal having the same potential level as an input voltage input to the input terminal, in response to an enable signal.
3. The semiconductor memory device of claim 2 , wherein the first high voltage transistor is a high voltage PMOS transistor.
4. The semiconductor memory device of claim 2 , wherein the control signal generator includes:
a second depletion transistor and a second high voltage transistor, which are coupled in series between the input terminal and a node; and
a third high voltage transistor configured to transmit the first enable signal to the node in response to a high voltage signal.
5. The semiconductor memory device of claim 4 , wherein the second high voltage transistor is a high voltage PMOS transistor.
6. The semiconductor memory device of claim 2 , wherein the switching circuit transmits, to the output terminal, the input voltage input to the input terminal without any potential drop.