Multilayer ceramic capacitor
A multilayer ceramic capacitor includes an external electrode on an end surface of a ceramic body to be connected to internal electrodes including a base layer including a sintered metal containing Cu and glass and a Cu plated layer on the base layer. The external electrode includes a principal surface portion disposed on a principal surface of the ceramic body. The Cu metal of the Cu plated layer is present in the base layer to a position of about ⅓ or more of the thickness of the base layer from a surface layer of the external electrode. The metal thickness of the external electrode is about 8.7 μm or more and about 13.9 μm or less.
1. A multilayer ceramic capacitor comprising:
a ceramic body including a plurality of ceramic layers and first and second internal electrodes stacked, the ceramic body including first and second principal surfaces opposed to each other in a height direction, side surfaces opposed to each other in a width direction, and end surfaces opposed to each other in a length direction; and
an external electrode including a base layer including metal and glass and a plated layer provided over a surface of the base layer, the external electrode provided over one of the end surfaces and a portion of the first principal surface of the ceramic body, and connected to one of the first and second internal electrodes at the one of the end surfaces; wherein
the plated layer includes a Cu plated layer including an outermost surface of the external electrode; and
Cu plated materials are present in the base layer to a position of about ⅓ or more of a thickness of the base layer from a surface layer of the external electrode; and
the external electrode is about 8.7 μm or more and about 13.9 μm or less in metal thickness on average.
2. The multilayer ceramic capacitor according to claim 1 , wherein the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, about 0.4 mm or more and about 0.6 mm or less in width dimension, and about 0.085 mm or more and about 0.15 mm or less in height dimension.
3. The multilayer ceramic capacitor according claim 1 , wherein the Cu plated layer is made through use of one of a pyrophosphoric acid Cu plating solution and a cyanide Cu plating solution.
4. The multilayer ceramic capacitor according to claim 1 , wherein the glass contained in the base layer contains BaO in an amount of about 10 weight % or more and about 50 weight % or less, SrO in an amount of about 10 weight % or more and about 50 weight % or less, B 2 O 3 in an amount of about 3 weight % or more and about 30 weight % or less, and SiO 2 in an amount of about 3weight % or more and about 30 weight % or less, and a total weight of BaO, SrO, B 2 O 3 and SiO 2 is 100 weight %.
5. The multilayer ceramic capacitor according to claim 1 , wherein
a thickness of an effective portion that is a portion of the ceramic body where the first and second internal electrodes are provided is referred to as A in the thickness direction;
a thickness of a first outer layer portion that is a portion of the ceramic body located closer to the first principal surface than the effective portion is referred to as B in the thickness direction;
a thickness of a second outer layer portion that is a portion of the ceramic body located closer to the second principal surface than the effective portion is referred to as C in the thickness direction; and
each of ratios A/B and A/C fall within a range of about 0.5 to about 16.
6. The multilayer ceramic capacitor according to claim 1 , wherein
from one of the first and second internal electrodes located closest to a first principal surface side of the ceramic body, a maximum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MAX ; and
from the one of the first and second internal electrodes located closest to the first principal surface side of the ceramic body, a minimum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MIN ;
the one of the first and second internal electrodes located closest to the first principal surface is configured such that the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, the multilayer ceramic capacitor is about 0.4 mm or more and about 0.6 mm or less in width dimension, the multilayer ceramic capacitor is about 0.085 mm or more and about 0.11 mm or less in thickness dimension; and
a ratio (T MAX −T MIN )/T is about 1.0% to about 5.0%.
7. The multilayer ceramic capacitor according to claim 1 , wherein
from one of the first and second internal electrodes located closest to a first principal surface side of the ceramic body, a maximum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MAX ; and
from the one of the first and second internal electrodes located closest to the first principal surface side of the ceramic body, a minimum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MiN ;
the one of the first and second internal electrodes located closest to the first principal surface is configured such that the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, the multilayer ceramic capacitor is about 0.4 mm or more and about 0.6 mm or less in width dimension, the multilayer ceramic capacitor is about 0.012 mm or more and about 0.15 mm or less in thickness dimension; and
a ratio (T MAX −T MIN )/T is about 1.3% to about 5.3%.
8. The multilayer ceramic capacitor according to claim 1 , wherein
from one of the first and second internal electrodes located closest to a first principal surface side of the ceramic body, a maximum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MAX ; and
from the one of the first and second internal electrodes located closest to the first principal surface side of the ceramic body, a minimum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MIN ;
the one of the first and second internal electrodes located closest to the first principal surface is configured such that the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, the multilayer ceramic capacitor is about 0.4 mm or more and about 0.6 mm or less in width dimension, the multilayer ceramic capacitor is about 0.018 mm or more and about 0.20 mm or less in thickness dimension, and
a ratio (T MAX −T MIN )/T is about 1.5% to about 5.0%.
9. The multilayer ceramic capacitor according to claim 1 , wherein
from one of the first and second internal electrodes located closest to a first principal surface side of the ceramic body, a maximum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MAX ; and
from the one of the first and second internal electrodes located closest to the first principal surface side of the ceramic body, a minimum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MIN ;
the one of the first and second internal electrodes located closest to the first principal surface is configured such that the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, the multilayer ceramic capacitor is about 0.4 mm or more and about 0.6 mm or less in width dimension, the multilayer ceramic capacitor is about 0.021 mm or more and about 0.23 mm or less in thickness dimension; and
a ratio (T MAX −T MIN )/T is about 1.8% to about 5.9%.
10. The multilayer ceramic capacitor according to claim 1 , wherein
from one of the first and second internal electrodes located closest to a first principal surface side of the ceramic body, a maximum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MAX ; and
from the one of the first and second internal electrodes located closest to the first principal surface side of the ceramic body, a minimum value of a distance to the first principal surface of the ceramic body in the thickness direction is T MIN ;
the one of the first and second internal electrodes located closest to the first principal surface is configured such that the multilayer ceramic capacitor is about 0.9 mm or more and about 1.1 mm or less in length dimension, the multilayer ceramic capacitor is about 0.4 mm or more and about 0.6 mm or less in width dimension, the multilayer ceramic capacitor is about 0.024 mm or more and about 0.30 mm or less in thickness dimension, and
a ratio (T MAX −T MIN )/T is about 1.2% to about 6.0%.
11. The multilayer ceramic capacitor according to claim 1 , wherein
a maximum thickness of a portion of the external electrode located on the one of the end surfaces is t 1 in a cross section passing through a center in the width direction and extending in the length direction and the thickness direction;
a maximum thickness of a portion of the external electrode located on the first principal surface is t 2 in a cross section passing through the center in the width direction and extending in the length direction and the thickness direction; and
a thickness of the external electrode on a line passing through a point of intersection between a tangent line on a corner of the ceramic body, and the corner and the point of intersection between a line along the first principal surface and a line along the one of the end surfaces is t 3 in a cross section passing through the center in the width direction and extending in the length direction and the thickness direction;
in the multilayer ceramic capacitor, a ratio t 2 /t 1 is about 0.7 to about 1.0, and a ratio t 3 /t 1 is about 0.4 to about 1.2.
12. The multilayer ceramic capacitor according to claim 1 , wherein
the external electrode of the multilayer ceramic capacitor is configured such that when a distance from a position of a maximum thickness on the first principal surface of the ceramic body to a position of a maximum thickness on the one of the end surfaces of the ceramic body is a dimension Ed; and
a distance from a position of a maximum thickness on the one of the end surfaces of the ceramic body to an edge end of the external electrode on the first principal surface of the ceramic body is referred to as a dimension e; and
a ratio Ed/e is about 0.243 or more and about 0.757 or less.
13. The multilayer ceramic capacitor according to claim 1 , wherein a maximum thickness and an average thickness of a portion of the external electrode located on the principal surfaces of the ceramic body are denoted respectively by D max and D ave ; and
D ave× 250% ≧D max ≧D ave× 120% is satisfied.
14. The multilayer ceramic capacitor according to claim 1 , wherein each of the plurality of ceramic layers is about 0.5 μm or more and about 10 μm or less in height.
15. The multilayer ceramic capacitor according to claim 1 , wherein each of the first internal electrode and the second internal electrode is about 0.2 μm to about 2 μm in height.
16. The multilayer ceramic capacitor according to claim 1 , wherein the base layer is about 1 μm to about 20 μm in thickness.
17. The multilayer ceramic capacitor according to claim 1 , wherein the Cu plated layer is about 1 μm to about 10 μm in thickness.
18. The multilayer ceramic capacitor according to claim 1 , wherein the Cu plated layer includes a plurality of plated films.
19. An electronic component comprising:
a multilayer printed wiring board; and
the multilayer ceramic capacitor according to claim 1 embedded in the multilayer printed wiring board.
20. The electronic component according to claim 19 , wherein a via hole is provided in the multilayer printed wiring board to provide electrical connection to the multilayer ceramic capacitor.