IP Library Granted Patent US 9,876,184
Granted Patent B2
US 9,876,184 · App. 14/012,692 · Granted Jan 23, 2018

Organic photosensitive device with an electron-blocking and hole-transport layer

Inventors: Chin-Wei Liang (Zhubei, TW); Hsing-Lien Lin (Hsin-Chu, TW); Cheng-Yuan Tsai (Hsin-Chu, TW); Chia-Shiung Tsai (Hsin-Chu, TW)
Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
H01L51/4293H01L51/4273H01L51/0037H01L51/0038H01L2251/306Y02E10/549
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Quick Facts
Patent No.
US 9,876,184
App. No.
14/012,692
Granted
Jan 23, 2018
Kind
B2
Abstract

The present disclosure provides a photosensitive device. The photosensitive device includes a donor-intermix-acceptor (PIN) structure. The PIN structure includes an organic hole transport layer; an organic electron transport layer; and an intermix layer sandwiched between the hole transport organic material layer and the electron transport organic material layer. The intermix layer includes a mixture of an n-type organic material and a p-type organic material.

Claims (42)

1. A photosensitive structure, comprising:

a donor-intermix-acceptor (PIN) structure that includes:

a hole transport layer;

an organic poly(3-hexylthiophene-2,5-diyl) (P3HT) hole transport layer disposed on the hole transport layer, wherein the organic P3HT hole transport layer has a larger bandgap than the hole transport layer;

an intermix layer disposed on the organic P3HT hole transport layer, wherein the intermix layer includes a mixture of P3HT and phenyl-C61-butyric-acid-methyl ester (PCBM);

a lithium fluorine (LiF) electron transport layer disposed over the intermix layer, wherein the intermix layer has a gradient composition that varies from the organic P3HT hole transport layer to the LiF electron transport layer, and further wherein the intermix layer has textured surfaces that interface with the organic P3HT hole transport layer and the LiF electron transport layer; and

an electrode disposed on the LiF electron transport layer.

2. The photosensitive structure of claim 1 , wherein the organic P3HT hole transport layer has:

a highest occupied molecular orbital (HOMO) ranging between 5 eV and 5.4 eV,

a lowest unoccupied molecular orbital (LUMO) ranging between 2.8 eV and 3.2 eV, and

a bandgap ranging between 2 eV and 2.4 eV.

3. The photosensitive structure of claim 1 , wherein the hole transport layer includes one of: molybdenum oxide (MoO 3 ), nickel oxide (NiO), copper oxide (CuO), vanadium oxide (V 2 O 5 ), tungsten oxide (WO 3 ) or a combination thereof.

4. The photosensitive structure of claim 1 , wherein the hole transport layer includes poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) (PEDOT:PSS).

5. The photosensitive structure of claim 1 , wherein the hole transport layer is disposed on a first electrode that includes indium tin oxide (ITO), and the electrode is a second electrode that includes aluminum (Al).

6. The photosensitive structure of claim 1 , wherein a ratio of a molecular weight of the P3HT to the PCBM is about 1:0.8.

7. A photosensitive structure, comprising:

a poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) (PEDOT:PSS) hole transport layer disposed on a first electrode;

an organic poly(3-hexylthiophene-2,5-diyl) (P3HT) electron blocking layer disposed on the PEDOT:PSS hole transport layer;

an organic photoactive layer disposed on the organic P3HT electron blocking layer, wherein the organic photoactive layer includes a mixture of P3HT and phenyl-C61-butyric-acid-methyl ester (PCBM), wherein a ratio of a molecular weight of the P3HT to the PCBM is about 1:0.8;

a lithium fluorine (LiF) hole blocking layer disposed over the organic photoactive layer; and

a second electrode disposed on the LiF hole blocking layer.

8. The photosensitive structure of claim 7 , wherein the LiF hole blocking layer is disposed on the organic photoactive layer.

9. The photosensitive structure of claim 7 , further comprising an organic hole blocking layer disposed between the organic photoactive layer and the LiF hole blocking layer.

10. The photosensitive structure of claim 7 , wherein the first electrode includes indium tin oxide and the second electrode includes aluminum.

11. The photosensitive structure of claim 9 , wherein the organic hole blocking layer includes a material that has:

a highest occupied molecular orbital (HOMO) ranging between 6.1 eV and 6.7 eV,

a lowest unoccupied molecular orbital (LUMO) ranging between 3.2 eV and 4.5 eV, and

a bandgap ranging between 1.6 eV and 3.0 eV.

12. The photosensitive structure of claim 9 , wherein the organic hole blocking layer includes a material in common with the organic photoactive layer.

13. The photosensitive structure of claim 7 , wherein the organic photoactive layer has textured surfaces that interface with the organic P3HT electron blocking layer and the LiF hole blocking layer.

14. The photosensitive structure of claim 9 , wherein the organic photoactive layer has textured surfaces that interface with the organic P3HT electron blocking layer and the organic hole blocking layer.

15. The photosensitive structure of claim 14 , wherein the organic hole blocking layer includes phenyl-C61-butyric-acid-methyl ester (PCBM).

16. The photosensitive structure of claim 7 , wherein the organic photoactive layer has a gradient composition that varies from the organic P3HT electron blocking layer to the LiF hole blocking layer.

17. A photosensitive structure, comprising:

a poly(3,4-ethylenedioxythiophene) poly(styrenesulfonate) (PEDOT:PSS) hole transport layer disposed on a first electrode;

an organic poly(3-hexylthiophene-2,5-diyl) (P3HT) hole transport layer disposed on the PEDOT:PSS hole transport layer, wherein a material of the organic P3HT hole transport layer has a larger bandgap than a material of the PEDOT:PSS hole transport layer;

an organic photoactive layer disposed on the organic P3HT hole transport layer, wherein the organic photoactive layer includes a mixture of poly (PTB7) and phenyl-C70-butyric acid methyl ester (PC70BM);

a lithium fluorine (LiF) electron transport layer disposed over the organic photoactive layer, wherein the organic photoactive layer has a gradient composition that varies from the organic P3HT hole transport layer to the LiF electron transport layer; and

a second electrode disposed on the LiF electron transport layer.

18. The photosensitive structure of claim 17 , further comprising an organic phenyl-C61-butyric-acid-methyl ester (PCBM) electron transport layer disposed between the organic photoactive layer and the LiF electron transport layer.

19. The photosensitive structure of claim 18 , wherein the organic photoactive layer has textured surfaces that interface with the organic P3HT hole transport layer and the organic PCBM electron transport layer.

20. The photosensitive structure of claim 17 , wherein the organic photoactive layer has textured surfaces that interface with the organic P3HT hole transport layer and the LiF electron transport layer.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 28, 2013
From: LIANG, CHIN-WEI; LIN, HSING-LIEN; TSAI, CHENG-YUAN; TSAI, CHIA-SHIUNG
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
Reel/Frame 031103/0757 →
Continuity (1)
Related Publication 20150060773A1 · Mar 5, 2015