Metal oxide film and method for forming metal oxide film
A metal oxide film including a crystal part and having highly stable physical properties is provided. The size of the crystal part is less than or equal to 10 nm, which allows the observation of circumferentially arranged spots in a nanobeam electron diffraction pattern of the cross section of the metal oxide film when the measurement area is greater than or equal to 5 nmφ and less than or equal to 10 nmφ.
1. A method for evaluating crystallinity of a semiconductor film containing a first metal, a second metal, and a third metal, the method comprising the steps of:
obtaining a nanobeam electron diffraction pattern of a cross-section of a film thinned from the semiconductor film, and
obtaining a selected-area electron diffraction pattern of a plane of a film thinned from the semiconductor film,
wherein the first metal is indium, the second metal is zinc, and the third metal is any one of Al, Ti, Ga, Y, Zr, La, Ce, Nd and Hf,
wherein a measurement area to obtain the nanobeam electron diffraction pattern is greater than or equal to 5 nmφ and less than or equal to 10 nmφ, and
wherein a measurement area to obtain the selected-area electron diffraction pattern is greater than or equal to an area of 300 nmφ.
2. The method according to claim 1 , further comprising the step of:
thinning the semiconductor film to a thickness larger than 10 nm and less than or equal to 50 nm before obtaining the nanobeam electron diffraction pattern.
3. A semiconductor device comprising:
an oxide semiconductor film comprising a crystalline part, the oxide semiconductor film including a channel formation region; and
a gate electrode adjacent to the channel formation region with a gate insulating layer therebetween,
wherein the oxide semiconductor film includes a first metal, a second metal, and a third metal,
wherein the first metal is indium, the second metal is zinc, and the third metal is any one of Al, Ti, Ga, Y, Zr, La, Ce, Nd and Hf,
wherein a size of the crystalline part is less than or equal to 10 nm,
wherein a plurality of circumferentially distributed spots are observable in a measurement area greater than or equal to an area with a diameter of 5 nmφ and less than or equal to an area with a diameter of 10 nmφ in a nanobeam electron diffraction pattern of a cross-section of the oxide semiconductor film,
wherein a halo pattern is observable in a selected-area electron diffraction pattern of a plane of the oxide semiconductor film,
wherein spots having order of regularity that represents a crystal state in which crystal parts are aligned with a specific plane are observable in the measurement area greater than or equal to 5 nmφ and less than or equal to 10 nmφ in the cross-sectional direction of the measurement area of a film thinned from the oxide semiconductor film to be less than or equal to 10 nm, and
wherein a crystalline peak is not observable in an XRD spectrum with respect to the oxide semiconductor film.
4. The semiconductor device according to claim 3 , wherein the third metal is gallium.
5. The semiconductor device according to claim 3 , wherein the halo pattern is observable in a measurement area greater than or equal to an area with a diameter of 300 nmφ in a selected area electron diffraction pattern.
6. The semiconductor device according to claim 3 , wherein the gate electrode is located below the oxide semiconductor film.
7. The semiconductor device according to claim 3 , wherein the gate electrode is located above the oxide semiconductor film.
8. A semiconductor device comprising:
an oxide semiconductor film comprising a crystalline part, the oxide semiconductor film including a channel formation region; and
a gate electrode adjacent to the channel formation region with a gate insulating layer therebetween,
wherein the oxide semiconductor film includes a first metal, a second metal, and a third metal,
wherein the first metal is indium, the second metal is zinc, and the third metal is any one of Al, Ti, Ga, Y, Zr, La, Ce, Nd and Hf,
wherein a size of the crystalline part is less than or equal to 5 nm,
wherein a plurality of circumferentially distributed spots are observable in a measurement area greater than or equal to an area with a diameter of 5 nmφ and less than or equal to an area with a diameter of 10 nmφ in a nanobeam electron diffraction pattern of a cross-section of the oxide semiconductor film,
wherein a halo pattern is observable in a selected-area electron diffraction pattern of a plane of the oxide semiconductor film, and
wherein spots having order of regularity that represents a crystal state in which crystal parts are aligned with a specific plane are observable in the measurement area greater than or equal to 5 nmφ and less than or equal to 10 nmφ in the cross-sectional direction of the measurement area of a film thinned from the oxide semiconductor film to be less than or equal to 10 nm, and
wherein a crystalline peak is not observable in an XRD spectrum with respect to the oxide semiconductor film.
9. The semiconductor device according to claim 8 , wherein the halo pattern is observable in a measurement area greater than or equal to 300 nmφ in a selected area electron diffraction pattern.