IP Library › Granted Patent US 9,888,855
Granted Patent B2
US 9,888,855 · App. 14/675,753 · Granted Feb 13, 2018

Reflection detection type measurement apparatus and method for skin autofluorescence

Inventors: Uk Kang (Seoul, KR); Garry V. Papayan (St. Petersburg, RU)
Assignee: KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
A61B5/0071A61B5/441
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Quick Facts
Patent No.
US 9,888,855
App. No.
14/675,753
Granted
Feb 13, 2018
Kind
B2
Abstract

Provided is a reflection detection type measurement method for skin fluorescence. The method includes: irradiating excitation light on a measurement target; detecting a reflected light and a skin fluorescence generated from the measurement target due to the excitation light; irradiating light with a wavelength range of the skin fluorescence on the measurement target; detecting a reflected light generated from the measurement target due to the light with a wavelength range of the skin fluorescence; and calculating a skin fluorescence value of the measurement target by correcting a calculation based on the detected reflected light and skin fluorescence.

Claims (29)

1. A reflection detection type measurement method for skin fluorescence, the method comprising:

irradiating excitation light on a measurement target;

detecting a first reflected light and a skin fluorescence generated from the measurement target due to the excitation light;

irradiating light with a same wavelength range of the skin fluorescence, which is generated from the measurement target due to the excitation light, on the measurement target;

detecting a second reflected light generated from the measurement target due to the light with a wavelength range of the skin fluorescence; and

calculating a skin fluorescence value of the measurement target by correcting a calculation based on the detected first reflected light, second reflected light and skin fluorescence.

2. The reflection detection type measurement method of claim 1 , wherein a dark time is maintained for a certain time before irradiating the excitation light on the measurement target, and a dark signal value of the measurement target compensates the skin fluorescence value during the dark time.

3. The reflection detection type measurement method of claim 1 , wherein a wavelength of the excitation light has a range of 370±20 nm.

4. The reflection detection type measurement method of claim 1 , wherein a wavelength of the skin fluorescence has a range of 440±20 nm.

5. The reflection detection type measurement method of claim 1 , wherein the excitation light and the skin fluorescence are irradiated on the same area of the measurement target.

6. The reflection detection type measurement method of claim 1 , wherein the excitation light is irradiated on the measurement target for a first time, and the skin fluorescence is irradiated on the measurement target for a second time after the first time.

7. The reflection detection type measurement method of claim 1 , wherein detecting the first reflected light and the skin fluorescence generated from the measurement target due to the excitation light comprises detecting light with a specific wavelength range of the first reflected light and the skin fluorescence.

8. The reflection detection type measurement method of claim 7 , wherein a wavelength range of the reflected light is smaller than a wavelength range of the skin fluorescence.

9. A reflection detection type measurement apparatus for skin fluorescence, the apparatus comprising:

a first light source irradiating light with a first wavelength range on a measurement target;

a second light source irradiating light with a second wavelength range on the measurement target;

a first optical detector detecting the light with a first wavelength range generated from the measurement target by the light of the first light source;

a second optical detector detecting a skin fluorescence with the second wavelength range generated from the measurement target by the light of the first light source, and detecting the light with a second wavelength range generated from the measurement target by the light of the second light source;

a light source switching controller controlling a turned on/off of the first light source and the second light source; and

an operation part for calculating a corrected skin fluorescence by correcting from a signal based on the detected light with a first wavelength range, light with a second wavelength range and skin fluorescence,

wherein the light with the second wavelength range has a same wavelength range of light which is generated from the measurement target by the light with the first wavelength range.

10. The reflection detection type measurement apparatus of claim 9 , wherein the light with a second wavelength range is longer than the light with a first wavelength range.

11. The reflection detection type measurement apparatus of claim 9 , wherein the light source switching controller turns off the first light source and the second light source so as to maintain a dark time for a certain time before irradiating the light of the first light source.

12. The reflection detection type measurement apparatus of claim 9 , wherein the light source switching controller turns off the first light source and the second light source so as to maintain a dark time for a certain time before irradiating the light of the second light source.

13. The reflection detection type measurement apparatus of claim 9 , wherein the first optical detector is turned off while the second optical detector detects the light generated from the measurement target due to the light with a second wavelength range.

14. The reflection detection type measurement apparatus of claim 11 , wherein the first optical detector and the second optical detector are turned on during a dark time maintained for a certain time before irradiating the light of the first light source.

15. The reflection detection type measurement apparatus of claim 12 , wherein the first optical detector and the second optical detector are turned on during a dark time maintained for a certain time before irradiating the light of the second light source.

16. The reflection detection type measurement apparatus of claim 9 , wherein the first wavelength range has a range of 370±20 nm.

17. The reflection detection type measurement apparatus of claim 9 , wherein the second wavelength range has a range of 440±20 nm.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 5, 2015
From: KANG, UK; PAPAYAN, GARRY V
To: KOREA ELECTROTECHNOLOGY RESEARCH INSTITUTE
Reel/Frame 035335/0352 →
Continuity (2)
Continuation In Part 13845792 · Mar 18, 2013
Related Publication 20150201839A1 · Jul 23, 2015