Write method and write apparatus for storage device

1. A write method for a storage device, the method comprising:

determining n bits in the storage device, each bit corresponding to one of n numerical values to be written to the storage device, wherein the n bits include stuck-at fault bits, each stuck-at fault bit associated with a permanent numerical value, wherein types of a stuck-at fault bit comprise a stuck-at right fault and a stuck-at wrong fault, wherein a permanent numerical value of a stuck-at fault bit having a type of the stuck-at right fault corresponds to a numerical value to be written to the stuck-at fault bit of the stuck-at right fault, and wherein a permanent numerical value of a stuck-at fault bit having a type of the stuck-at wrong fault is opposite to a numerical value to be written to the stuck-at fault bit of the stuck-at wrong fault;

grouping the n bits into B groups according to the stuck-at fault bits, wherein each group comprises at most A bits, including zero or more of the stuck-at fault bits, wherein each group of the n bits is grouped with one of the types of the stuck-at fault, and wherein stuck-at fault bits in each group are of a same type corresponding to the one type of the stuck-at fault with the group; and

writing numerical values into bits of the group according to the one type of the stuck-at fault with the group; wherein n, A, and B are positive integers, and n≦A×B.

2. The write method according to claim 1 , wherein the grouping the n bits into B groups comprises:

generating an array of B rows and A columns to represent the n bits, wherein the B groups are obtained based on the array, and wherein any two of the n bits that belong to a same group are represented in different rows and columns, or any two bits that belong to a same group are represented in a same row.

3. The write method according to claim 2 , wherein the array of B rows and A columns corresponds to a two-dimensional array, wherein a location of a j th bit of an i th group in the B groups in the array of B rows and A columns is represented by a column number p i,j and a row number q i,j of the two-dimensional array, i and q i,j being positive integers not greater than B, j, and p i,j being positive integers not greater than A, wherein a location of a (j+1) th bit of the i th group in the B groups is represented by a column number p i,j+1 and a row number q i,j+1 and wherein locations of the j th bit and the (j+1) th bit are related according to:

p i,j+1 =p i,j +1 and q i,j+1 +( q i,j +k )mod B,

wherein k is a non-negative integer less than B, wherein B is a minimum prime number not less than √{square root over (n)}, and

A

=

⌈

n

B

⌉

,

and wherein the grouping comprises adjusting the k so that the quantity of the stuck-at fault bits in each group is no more than A and the stuck-at fault bits in each group are of the same type.

4. The write method according to claim 1 , wherein the writing numerical values comprises:

inverting the numerical values wherein the one type of the stuck-at fault with the group is the stuck-at wrong fault, and wherein the bits of the group are written with the inverted numerical values.

5. The write method according to claim 1 , wherein

the one type of the stuck-at fault with the group is the stuck-at right fault and wherein the bits of the group are written with the numerical values without inversion.

6. The write method according to claim 1 , wherein the writing numerical values comprises:

allocating a flag bit to the group, wherein the flag bit indicates the one type of the stuck-at fault with the group, wherein the numerical values are written

according to the flag bit.

7. The write method according to claim 6 , wherein

the flag bit represents the stuck-at wrong fault, wherein the numerical values are inverted and the inverted numerical values are written to the bits of the group.

8. A storage device, comprising:

a storage controller, and a storage medium, wherein the storage medium is configured to store numerical values, wherein the storage controller comprises a transceiver circuit and a processor,

wherein the transceiver circuit is configured to acquire n numerical values that need to be written, and wherein

the processor is configured to:

determine n bits in the storage device, each bit corresponding to one of the n numerical values to be written, wherein the n bits include stuck-at fault bits, wherein types of a stuck-at fault bit comprises a stuck-at right fault and a stuck-at wrong fault, wherein a permanent numerical value of a stuck-at fault bit having a type of the stuck-at right fault is equal to a numerical value to be written to the stuck-at fault bit of the stuck-at right fault, and wherein a permanent numerical value of a stuck-at fault bit having a type of the stuck-at wrong fault is opposite to a numerical value to be written to the stuck-at fault bit of the stuck-at wrong fault;

group the n bits into B groups according to the stuck-at fault bits, wherein each group comprises at most A bits including zero or more of the stuck-at fault bits, wherein each group of the n bits is grouped with one of the types of the stuck-at fault, and wherein stuck-at fault bits in each group are of a same type corresponding to the one type of the stuck-at fault with the group; and

write numerical values into bits of the group according to the one type of the stuck-at fault with the group; wherein n, A, and B are positive integers, and n≦A×B.

9. The storage device according to claim 8 , wherein the processor is further configured to:

generate an array of B rows and A columns to represent the n bits, wherein the B groups are obtained based on the array, and wherein any two bits that belong to a same group are represented in different rows and columns, or any two bits that belong to a same group are represented in a same row.

10. The write apparatus according to claim 9 , wherein the array of B rows and A columns corresponds to a two-dimensional array, wherein a location of a j th bit of an i th group in the B groups in the array of B rows and A columns is represented by a column number p i,j and a row number q i,j of the two-dimensional array, i and q i,j being positive integers not greater than B, j and p i,j being positive integers not greater than A, wherein a location of a (j+1) th bit of the i th group in the B groups is represented by a column number p i,j+1 and a row number q i,j+1 and wherein locations of the j th bit and the (j+1) th bit are related according to p i,j+1 =p i,j +1 and q i,j+1 =(q i,j +k)mod B, wherein k is a non-negative integer less than B, wherein B is a minimum prime number not less than √{square root over (n)}, and

A

=

⌈

n

B

⌉

and wherein the grouping comprises adjusting the k so that the quantity of the stuck-at fault bits in each group is no more than A and the stuck-at fault bits in each group are of the same type.

11. The write apparatus according to claim 8 , wherein the processor is further configured to:

invert the numerical values when the one type of the stuck-at fault with the group is the stuck-at wrong fault.

12. The write apparatus according to claim 8 , wherein processor is configured to:

write the numerical values without inversion to the group when the one type of the stuck-at fault with the group is the stuck-at right fault.

13. The write apparatus according to claim 8 , wherein the processor is further configured to:

allocate a flag bit to the group, wherein the flag bit indicates the one type of the stuck-at fault with the group wherein the numerical values are written

according to the flag bit.

14. The write apparatus according to claim 13 , wherein

when the flag bit represents the stuck-at wrong fault, the numerical values are inverted and the inverted numerical values are written to the bits of the group.