Distributed state and data functional coverage
This application discloses a computing system to implement a design verification tool and simulate a circuit design with a test bench. The computing system can identify multiple components in the circuit design to combine for distributed state coverage analysis based, at least in part, on data transactions generated during the simulation of the circuit design. The computing system can correlate information captured during simulation that corresponds to the identified components. The correlated information can identify at least one distributed state coverage event for the test bench. The computing system can generate a distributed state coverage metric based on the correlated information corresponding to the identified components. The computing system can prompt presentation of the correlated information a display window, which can graphically show how a test bench exercised the identified components during simulation.
1. A method comprising:
simulating, by a computing system, a circuit design with test stimulus from a test bench;
identifying, by the computing system, multiple components in the circuit design that became functionally-interrelated during the simulation of the circuit design based, at least in part, on data transactions generated during the simulation of the circuit design; and
correlating, by the computing system, information captured during simulation that corresponds to the identified components while the identified components were functionally-interrelated during the simulation of the circuit design, wherein the correlated information is configured to identify at least one distributed state coverage event for the test bench.
2. The method of claim 1 , further comprising generating, by the computing system, a distributed state coverage metric configured to quantify distributed state coverage for the circuit design based, at least in part, on the at least one distributed state coverage event identified by the correlated information corresponding to the identified components.
3. The method of claim 1 , further comprising prompting, by the computing system, graphical presentation of the at least one distributed state coverage event for the circuit design in a display window.
4. The method of claim 3 , wherein the display window is configured to present operational states for the identified components, the data transactions prompting transitions between the operational states for the identified components, or a relative timing between a plurality of the data transactions.
5. The method of claim 1 , wherein the identified components are multiple caches in the circuit design that store data corresponding to a common location in a memory device.
6. The method of claim 1 , wherein the identified components are hardware link lists having operational states defined by data stored in entries in the hardware link lists.
7. The method of claim 1 , further comprising capturing, by the computing system during simulation of the circuit design, operational states for the identified components, the data transactions prompting transitions between the operational states for the identified components, or a relative timing between a plurality of the data transactions.
8. An apparatus comprising at least one computer-readable memory device storing instructions configured to cause one or more processing devices to perform operations comprising:
identifying multiple components in a circuit design that became functionally-interrelated during simulation of the circuit design with test stimulus from a test bench based, at least in part, on data transactions generated during the simulation of the circuit design; and
correlating information captured during simulation that corresponds to the identified components while the identified components were functionally-interrelated during the simulation of the circuit design, wherein the correlated information is configured to identify at least one distributed state coverage event for the test bench.
9. The apparatus of claim 8 , wherein the instructions are configured to cause one or more processing devices to perform operations further comprising generating a distributed state coverage metric configured to quantify distributed state coverage for the circuit design based, at least in part, on the at least one distributed state coverage event identified by the correlated information corresponding to the identified components.
10. The apparatus of claim 8 , wherein the instructions are configured to cause one or more processing devices to perform operations further comprising prompting graphical presentation of the at least one distributed state coverage event for the circuit design in a display window.
11. The apparatus of claim 10 , wherein the display window is configured to present operational states for the identified components, the data transactions prompting transitions between the operational states for the identified components, or a relative timing between a plurality of the data transactions.
12. The apparatus of claim 8 , wherein the identified components are multiple caches in the circuit design that store data corresponding to a common location in a memory device.
13. The apparatus of claim 8 , wherein the identified components are hardware link lists having operational states defined by data stored in entries in the hardware link lists.
14. The apparatus of claim 8 , wherein the instructions are configured to cause one or more processing devices to perform operations further comprising capturing, during simulation of the circuit design, operational states for the identified components, the data transactions prompting transitions between the operational states for the identified components, or a relative timing between a plurality of the data transactions.
15. A system comprising:
a memory system configured to store computer-executable instructions; and
a computing system, in response to execution of the computer-executable instructions, is configured to:
identify multiple components in a circuit design that became functionally-interrelated during simulation of the circuit design with test stimulus from a test bench based, at least in part, on data transactions generated during the simulation of the circuit design; and
correlate information captured during simulation that corresponds to the identified components while the identified components were functionally-interrelated during the simulation of the circuit design, wherein the correlated information is configured to identify at least one distributed state coverage event for the test bench.
16. The system of claim 15 , wherein the computing system, in response to execution of the computer-executable instructions, is further configured to generate a distributed state coverage metric configured to quantify distributed state coverage for the circuit design based, at least in part, on the at least one distributed state coverage event identified by the correlated information corresponding to the identified components.
17. The system of claim 15 , wherein the computing system, in response to execution of the computer-executable instructions, is further configured to prompt graphical presentation of the at least one distributed state coverage event for the circuit design in a display window.
18. The system of claim 17 , wherein the display window is configured to present the operational states for the identified components.
19. The system of claim 17 , wherein the display window is configured to present the data transactions prompting transitions between the operational states for the identified components.
20. The system of claim 17 , wherein the display window is configured to present a relative timing between a plurality of the data transactions.