IP Library › Granted Patent US 9,899,393
Granted Patent B2
US 9,899,393 · App. 14/969,778 · Granted Feb 20, 2018

Integrated circuit devices including fin shapes

Inventor: Jae-yup Chung (Yongin-si, KR)
Assignee: Samsung Electronics Co., Ltd.
H01L27/1104H01L27/0207H01L29/0649H01L29/0657H01L29/7851H01L29/7854
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 9,899,393
App. No.
14/969,778
Granted
Feb 20, 2018
Kind
B2
Abstract

Integrated circuit devices are provided. An integrated circuit device includes a substrate having first and second fin-shaped Field Effect Transistor (FinFET) bodies protruding from the substrate. The first and second FinFET bodies have different respective first and second shapes in a first region and a second region, respectively, of the integrated circuit device.

Claims (71)

1. An integrated circuit device comprising:

a substrate comprising a non-memory area and a memory area;

a first fin-shaped active area in the non-memory area and comprising a first top portion protruding a first distance from a first bottom of the first fin-shaped active area, the first bottom contacting a surface of the substrate in a direction; and

a second fin-shaped active area in the memory area and comprising a second top portion protruding a second distance from a second bottom of the second fin-shaped active area, the second bottom contacting the surface of the substrate in the direction, wherein the second distance is longer than the first distance.

2. The integrated circuit device of claim 1 , wherein a first width of the second top portion is narrower than a second width of the first top portion.

3. The integrated circuit device of claim 1 ,

wherein the first fin-shaped active area comprises a first tip active area comprising a first curvature radius and comprising a first rounded outer surface, and

wherein the second fin-shaped active area comprises a second tip active area comprising a second curvature radius that is less than the first curvature radius and comprising a second rounded outer surface.

4. The integrated circuit device of claim 1 , wherein the first top portion comprises:

a first lower section active area comprising a first inclined sidewall extending at a first inclination angle with respect to the direction;

a first middle section active area protruding from the first lower section active area in the direction and comprising a second inclined sidewall extending at a second inclination angle with respect to the direction, wherein the second inclination angle is smaller than the first inclination angle;

a first upper section active area protruding from the first middle section active area in the direction and comprising a third inclined sidewall extending at a third inclination angle with respect to the direction, wherein the third inclination angle is greater than the second inclination angle; and

a first tip active area protruding from the first upper section active area in the direction and comprising a first rounded outer surface.

5. The integrated circuit device of claim 4 , wherein the second top portion comprises:

a second lower section active area comprising a fourth inclined sidewall extending at a fourth inclination angle greater than the first inclination angle with respect to the direction;

a second middle section active area protruding from the second lower section active area in the direction and comprising a sidewall extending at a fifth inclination angle smaller than the fourth inclination angle with respect to the direction;

a second upper section active area protruding from the second middle section active area in the direction and comprising a fifth inclined sidewall extending at a sixth inclination angle greater than the fifth inclination angle with respect to the direction; and

a second tip active area protruding from the second upper section active area in the direction and comprising a second rounded outer surface.

6. The integrated circuit device of claim 5 , wherein a first thickness of the second lower section active area in the direction is thicker than a second thickness of the first lower section active area in the direction.

7. The integrated circuit device of claim 5 , wherein a first thickness of the second middle section active area in the direction is thicker than a second thickness of the first middle section active area in the direction.

8. The integrated circuit device of claim 5 , wherein a first width of the second middle section active area is narrower than a second width of the first middle section active area.

9. The integrated circuit device of claim 5 , wherein a first width of the second upper section active area is narrower than a second width of the first upper section active area.

10. An integrated circuit device comprising:

a substrate comprising a non-memory area and a memory area;

a pair of first fin-shaped active areas extending in parallel to each other in the non-memory area and spaced apart by a first distance, each of the pair of first fin-shaped active areas comprising a first top portion protruding from the substrate in a direction;

a pair of second fin-shaped active areas extending in parallel to each other in the memory area and spaced apart by a second distance longer than the first distance, each of the pair of second fin-shaped active areas comprising a second top portion protruding from the substrate in the direction;

first and second device isolation films in the non-memory and memory areas, respectively, of the substrate; and

first and second gate lines on the first and second device isolation films, respectively,

wherein the first gate line comprises an uppermost surface comprising a first width in the non-memory area,

wherein the second gate line comprises an uppermost surface comprising a second width in the memory area that is wider than the first width, and

wherein a first height of one of the pair of second fin-shaped active areas is higher than a second height of one of the pair of first fin-shaped active areas.

11. The integrated circuit device of claim 10 , wherein a third width of the second top portion is narrower than a fourth width of the first top portion.

12. An integrated circuit device comprising:

a substrate comprising first and second fin-shaped Field Effect Transistor (FinFET) bodies in a non-memory region and a memory region, respectively, of the substrate,

wherein the first FinFET body has a first base portion covered by a first device isolation film and a first top portion protruding a first distance from a top surface of the first device isolation film in a direction,

wherein the second FinFET body has a second base portion covered by a second device isolation film and a second top portion protruding a second distance from a top surface of the second device isolation film in the direction, the second distance being longer than the first distance, and

wherein a first height of the first base portion and a second height of the second base portion are substantially equal.

13. The integrated circuit device of claim 12 , further comprising first and second gates on the first and second FinFET bodies, respectively,

wherein an uppermost surface of the first gate comprises a first width in the non-memory region, and

wherein an uppermost surface of the second gate comprises a second width in the memory region that is wider than the first width.

14. The integrated circuit device of claim 12 ,

wherein the first and second FinFET bodies are included among first and second pluralities of FinFET bodies in the non-memory region and the memory region, respectively,

wherein adjacent ones of the first plurality of FinFET bodies in the non-memory region are spaced apart from each other by a third distance, and

wherein adjacent ones of the second plurality of FinFET bodies in the memory region are spaced apart from each other by a fourth distance that is longer than the third distance.

15. The integrated circuit device of claim 12 ,

wherein the first FinFET body is included among a first plurality of FinFET bodies spaced apart from each other with a fixed pitch in the non-memory region, and

wherein the second FinFET body is included among a second plurality of FinFET bodies spaced apart from each other with a variable pitch in the memory region.

16. The integrated circuit device of claim 1 , further comprising:

first and second device isolation films in the non-memory and memory areas, respectively, of the substrate,

wherein the first top portion protrudes a third distance from a top surface of the first device isolation film in the direction, and

wherein the second top portion protrudes a fourth distance from a top surface of the second device isolation film in the direction, the fourth distance being longer than the third distance.

17. The integrated circuit device of claim 1 ,

further comprising first and second gates on the first and second fin-shaped active areas, respectively,

wherein an uppermost surface of the first gate comprises a first width in the non-memory area, and

wherein an uppermost surface of the second gate comprises a second width in the memory area that is wider than the first width.

18. The integrated circuit device of claim 12 ,

wherein the second FinFET body in the memory region is narrower and taller than the first FinFET body in the non-memory region.

19. The integrated circuit device of claim 10 ,

wherein the first top portion comprises:

a first lower section active area comprising a first inclined sidewall extending at a first inclination angle with respect to the direction; and

a first middle section active area protruding from the first lower section active area in the direction and comprising a second inclined sidewall extending at a second inclination angle with respect to the direction, the second inclination angle being smaller than the first inclination angle, and

wherein the second top portion comprises:

a second lower section active area comprising a third inclined sidewall extending at a third inclination angle greater than the first inclination angle with respect to the direction; and

a second middle section active area protruding from the second lower section active area in the direction and comprising a sidewall extending at a fourth inclination angle smaller than the third inclination angle with respect to the direction, the second middle section active area comprising a third width narrower than a fourth width of the first middle section active area.

20. The integrated circuit device of claim 12 ,

wherein the first top portion comprises:

a first lower section active area comprising a first inclined sidewall extending at a first inclination angle with respect to the direction; and

a first middle section active area protruding from the first lower section active area in the direction and comprising a second inclined sidewall extending at a second inclination angle with respect to the direction, the second inclination angle being smaller than the first inclination angle, and

wherein the second top portion comprises:

a second lower section active area comprising a third inclined sidewall extending at a third inclination angle greater than the first inclination angle with respect to the direction; and

a second middle section active area protruding from the second lower section active area in the direction and comprising a sidewall extending at a fourth inclination angle smaller than the third inclination angle with respect to the direction, the second middle section active area comprising a first width narrower than a second width of the first middle section active area.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2015
From: CHUNG, JAE-YUP
To: SAMSUNG ELECTRONICS CO., LTD.
Reel/Frame 037295/0898 →
Priority Claims (1)
KR 10-2015-0029864 · Mar 3, 2015 · national
Continuity (1)
Related Publication 20160260719A1 · Sep 8, 2016