Charge storage region in non-volatile memory
Disclosed herein is a non-volatile storage system with memory cells having a charge storage region that may be configured to store a higher density of charges (e.g., electrons) in the middle than nearer to the control gate or channel. The charge storage region has a middle charge storage material that stores a higher density of charges than two outer charge storage materials that are nearer to the control gate or channel, in one aspect. The charge storage region of one aspect has oxide regions between the middle charge storage material and the two outer charge storage materials. The oxide regions of one embodiment are thin (e.g., less than one nanometer) such that during operation charges may easily pass through the oxide regions. The non-volatile memory cell programs quickly and has high data retention.
1. A non-volatile storage element, comprising:
a tunnel dielectric;
a charge storage region comprising: a first charge storage material adjacent the tunnel dielectric, a second charge storage material, a third charge storage material, the second charge storage material being between the first and third charge storage materials, a first oxide between the first charge storage material and the second charge storage material, a second oxide between the second charge storage material and the third charge storage material, the second charge storage material configured to store a higher density of charges than the first charge storage material, the second charge storage material configured to store a higher density of charges than the third charge storage material;
a control gate; and
a charge blocking region between the control gate and the charge storage region, the charge storage region being located between the tunnel dielectric and the charge blocking region, the third charge storage material being located adjacent to the charge blocking region.
2. The non-volatile storage element of claim 1 , wherein the charge storage region is a floating gate.
3. The non-volatile storage element of claim 1 , wherein the first charge storage material is a p-type semiconductor, the second charge storage material is an n-type semiconductor, and the third charge storage material is a p-type semiconductor.
4. The non-volatile storage element of claim 1 , wherein the first charge storage material is a p-type semiconductor, the second charge storage material is a metal, and the third charge storage material is a p-type semiconductor.
5. The non-volatile storage element of claim 1 , wherein the charge storage region is a charge trapping region.
6. The non-volatile storage element of claim 1 , wherein the second charge storage material has a higher density of traps than the first charge storage material, the second charge storage material has a higher density of traps than the third charge storage material.
7. The non-volatile storage element of claim 1 , wherein the first charge storage material is silicon oxy-nitride, the second charge storage material is silicon-rich silicon nitride, and the third charge storage material is silicon oxy-nitride.
8. The non-volatile storage element of claim 1 , wherein the first and second oxides are silicon oxide.
9. The non-volatile storage element of claim 1 , wherein the first and second oxides are aluminum oxide.
10. A non-volatile memory system, comprising:
a plurality of NAND strings of non-volatile storage elements, ones of the of non-volatile storage elements comprising:
a dielectric region;
a charge trapping region comprising: a first charge trapping layer, a second charge trapping layer, a third charge trapping layer, the second charge trapping layer being between the first and third charge trapping layers, a first oxide layer between the first charge trapping layer and the second charge trapping layer, a second oxide layer between the second charge trapping layer and the third charge trapping layer, the second charge trapping layer having a higher density of traps than the first charge trapping layer, the second charge trapping layer having a higher density of traps than the third charge trapping layer;
a control gate; and
a charge blocking region between the control gate and the charge trapping region, the charge trapping region being between the dielectric region and the charge blocking region, the third charge trapping layer being adjacent the charge blocking region.
11. The non-volatile memory system of claim 10 , wherein the first charge trapping layer is oxygen-rich silicon oxy-nitride, the third charge trapping layer is oxygen-rich silicon oxy-nitride.
12. The non-volatile memory system of claim 10 , the second charge trapping layer is silicon-rich silicon nitride.
13. The non-volatile memory system of claim 10 , wherein the second charge trapping layer is a high-k charge trapping material.
14. The non-volatile memory system of claim 10 , wherein the first and second oxide layers are silicon oxide having a thickness in the direction from the dielectric region to the charge blocking region of one nanometer or less.
15. The non-volatile memory system of claim 10 , wherein the first and second oxide layers are aluminum oxide.
16. The non-volatile memory system of claim 10 , further comprising a three-dimensional memory array, wherein the plurality of NAND strings reside in the three-dimensional memory array.