IP Library Granted Patent US 9,905,654
Granted Patent B2
US 9,905,654 · App. 15/215,414 · Granted Feb 27, 2018

Bridge diode

Inventors: Dong Yun Jung (Daejeon, KR); Hyun Soo Lee (Goyang-si, KR); Sang Choon Ko (Daejeon, KR); Minki Kim (Daejeon, KR); Jeho Na (Seoul, KR); Eun Soo Nam (Daejeon, KR); Young Rak Park (Daejeon, KR); Junbo Park (Seoul, KR); Hyung Seok Lee (Daejeon, KR); Hyun-Gyu Jang (Cheongju-si, KR); Chi Hoon Jun (Daejeon, KR)
Assignee: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
H01L29/205H01L29/66212H01L29/872H01L29/2003
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Quick Facts
Patent No.
US 9,905,654
App. No.
15/215,414
Granted
Feb 27, 2018
Kind
B2
Abstract

Provided is a bridge diode according to an embodiment of the inventive concept. The bridge diode includes a first structure including a first lower nitride film and a first upper nitride film, which are laminated on the substrate, a second structure including a second lower nitride film and a second upper nitride film, which are laminated on the substrate, a first electrode structural body disposed on the first structure, and a second electrode structural body disposed on the second structure. The first electrode structural body includes a first electrode, a second electrode, and a third electrode, which are arranged in a clockwise direction, the second electrode structural body includes a fourth electrode, a fifth electrode, and a sixth electrode, which are arranged in a clockwise direction, the first electrode and the sixth electrode, which are connected to each other, are connected to an external circuit, the third electrode and the fourth electrode, which are connected to each other, are connected to an external circuit, and each of the second electrode and the fifth electrode is connected to the external circuit.

Claims (45)

1. A bridge diode comprising:

a substrate;

a first structure comprising a first lower nitride film and a first upper nitride film, which are laminated on the substrate;

a second structure comprising a second lower nitride film and a second upper nitride film, which are laminated on the substrate;

a first electrode structural body disposed on the first structure;

a second electrode structural body disposed on the second structure; and

an isolation region disposed between the first structure and the second structure, the isolation region exposing a top surface of the substrate,

wherein the first electrode structural body comprises a first electrode, a second electrode, and a third electrode,

the second electrode structural body comprises a fourth electrode, a fifth electrode, and a sixth electrode,

the first electrode and the sixth electrode, which are connected to each other, are connected to an external circuit,

the third electrode and the fourth electrode, which are connected to each other, are connected to the external circuit, and

each of the second electrode and the fifth electrode is connected to the external circuit.

2. The bridge diode of claim 1 , wherein the first lower nitride film and the second lower nitride film comprises first and second 2-dimensional electron gas (2DEG) layers, respectively, and

the first 2DEG layer and the second 2DEG layer are spaced apart from each other.

3. The bridge diode of claim 1 , wherein the first electrode, the second electrode, the third electrode, the fourth electrode, the fifth electrode, and the sixth electrode are arranged in a clockwise direction,

the first electrode and the sixth electrode are disposed to face each other, and

the third electrode and the fourth electrode are disposed to face each other.

4. The bridge diode of claim 1 , wherein the first electrode and the third electrode have first and third extension parts each of which extends toward the second electrode, respectively, and

the second electrode has a second extension part extending toward the first electrode and the third electrode.

5. The bridge diode of claim 4 , wherein each of the first extension part, the second extension part, and the third extension part is provided in plurality to be spaced apart from each other.

6. The bridge diode of claim 1 , wherein the fourth electrode and the sixth electrode have fourth and sixth extension parts each of which extends toward the fifth electrode, respectively, and

the fifth electrode has a fifth extension part extending toward the fourth electrode and the sixth electrode.

7. The bridge diode of claim 6 , wherein each of the fourth extension part, the fifth extension part, and the sixth extension part is provided in plurality to be spaced apart from each other.

8. The bridge diode of claim 1 , wherein the first electrode, the third electrode, and the fifth electrode are anodes which form a schottky-contact with the first structure and the second structure, and

the second electrode, the fourth electrode, and the sixth electrode are cathodes which form ohmic-contact with the first structure and the second structure.

9. The bridge diode of claim 1 , wherein the first and second lower nitride films are made of gallium nitride (GaN), and

the first and second upper nitride films are made of aluminum gallium nitride (AlGaN) or aluminum nitride (AlN).

10. The bridge diode of claim 1 , further comprising a first cap layer disposed between the first structure and the first electrode structural body; and

a second cap layer disposed between the second structure and the second electrode structural body.

11. A bridge diode comprising:

a semiconductor layer disposed on a substrate; and

an electrode structural body disposed on the semiconductor layer,

wherein the electrode structural body comprises a first electrode, a second electrode, a third electrode, a fourth electrode, a fifth electrode, and a sixth electrode,

the first electrode and the sixth electrode, which are connected to each other, are connected to an external circuit,

the third electrode and the fourth electrode, which are connected to each other, are connected to the external circuit,

each of the second electrode and the fifth electrode is connected to the external circuit, and

the semiconductor layer has an isolation region configured to separate the first, second, and third electrodes from the fourth, fifth, and sixth electrodes and expose a top surface of the substrate;

wherein the first electrode, the third electrode, and the fifth electrode form a schottky-contact with the semiconductor layer, and

the second electrode, the fourth electrode, and the sixth electrode form an ohmic-contact with the semiconductor layer.

12. The bridge diode of claim 11 , wherein the isolation region is recessed from a top surface of the semiconductor layer toward the substrate.

13. The bridge diode of claim 11 , wherein the semiconductor layer comprises a lower nitride film and an upper nitride film, which are sequentially laminated on the substrate,

the lower nitride film has a 2-dimensional electron gas (2DEG) layer therein, and

the isolation region is recessed from the top surface of the semiconductor layer toward the lower nitride film to separate the 2DEG layer.

14. The bridge diode of claim 11 , further comprising a first wire configured to connect the first electrode to the sixth electrode; and

a second wire configured to connect the third electrode to the fourth electrode.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 20, 2016
From: JUNG, DONG YUN; LEE, HYUN SOO; KO, SANG CHOON; KIM, MINKI; NA, JEHO; NAM, EUN SOO; PARK, YOUNG RAK; PARK, JUNBO; LEE, HYUNG SEOK; JANG, HYUN-GYU; JUN, CHI HOON
To: ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
Reel/Frame 039202/0903 →
Priority Claims (2)
KR 10-2015-0103134 · Jul 21, 2015 · national
KR 10-2016-0007195 · Jan 20, 2016 · national
Continuity (1)
Related Publication 20170025550A1 · Jan 26, 2017