IP Library › Granted Patent US 9,924,105
Granted Patent B2
US 9,924,105 · App. 14/364,587 · Granted Mar 20, 2018

System and method for individually inspecting objects in a stream of products and a sorting apparatus comprising such system

Inventors: Dirk Adams (Tongeren, BE); Pieter Op de Beeck (Kortenaken, BE)
Assignee: Visys NV
H04N5/2353G01N21/85G01N21/8806G06T7/0004G01N21/8901G01N2021/8838
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Quick Facts
Patent No.
US 9,924,105
App. No.
14/364,587
Granted
Mar 20, 2018
Kind
B2
Abstract

A system and a method for inspecting a stream of products ( 3, 3′, 3 ″) is disclosed, comprising a scanning focused light beam ( 5 ) for scanning the product stream and a camera ( 7 ) for detecting light beams directly returned from the scanned product stream, whereby the scanning movement of the focused light beam is synchronized with the exposure time of the camera.

Claims (35)

1. An inspection system ( 1 ) for individually analyzing products ( 3 ) transported in a continuous stream, the system comprising a scanning focused light ( 5 ) beam source ( 4 ), configured to scan the width (W) of the product stream in a period of time referred to as the scan time (Tw), the width (W) being the linear direction of the product stream in a direction x substantially perpendicular to the direction y along which the product stream is transported, a camera ( 7 ) positioned to detect light beams ( 6 ) directly returned from the scanned product stream during a period of time referred to as the exposure time (Te) of the camera, thereby providing an image of the scanned product stream, and a control unit ( 12 ) configured to synchronize the scanning of the focused light beam ( 5 ) with the exposure time of the camera ( 7 ),

wherein synchronizing comprises configuring the exposure time and the scan time so that the exposure time (Te) is substantially equal to an integer ratio of the scan time (Tw), i.e. Te is substantially equal to (n/m)×Tw with n and m integers equal to or higher than 1.

2. The inspection system according to claim 1 , wherein the exposure time Te is substantially equal to an integer multiple of the scan time, i.e. Te is substantially equal to n×Tw, with n an integer equal to or higher than 1.

3. The inspection system according to claim 2 , wherein n is an integer equal to or higher than 2.

4. The inspection system ( 1 ) according to claim 1 , further comprising a start sensor ( 10 ) and stop sensor ( 11 ) positioned with respect to the light source ( 4 ) to define the angle over which the focused light beam ( 5 ) moves when scanning the product stream ( 3 ), whereby the start sensor ( 10 ) and the stop sensor ( 11 ) are configured to provide a control signal ( 8 ) to the control unit ( 12 ) indicative of respectively the start and the stop of a scan movement of the focused light beam ( 5 ).

5. The inspection system ( 1 ) according to claim 1 , further comprising a start sensor ( 10 ) positioned with respect to the light source ( 4 ) to define the angle over which the focused light beam ( 5 ) moves when scanning the product stream ( 3 ), whereby the start sensor ( 10 ) is configured to provide a control signal ( 8 ) to the control unit ( 12 ) indicative of both the start and the stop of a scan movement of the focused light beam ( 5 ).

6. A method for operating an inspection system ( 1 ) for individually analyzing products ( 3 ) transported in a continuous stream, the system comprising a scanning focused light ( 5 ) beam source ( 4 ), configured to scan the width (W) of the product stream in a period of time referred to as the scan time (Tw), the width (W) being the linear dimension of the product stream in a direction x substantially perpendicular to the direction y along which the product stream is transported, a camera ( 7 ) positioned to detect light beams ( 6 ) directly returned from the scanned product stream during a period of time referred to as the exposure time (Te) of the camera, thereby providing an image of the scanned product stream, and a control unit ( 12 ) configured to synchronize the scanning of the focused light beam ( 5 ) with the exposure time of the camera ( 7 ), the method comprising:

initiating scanning of the product stream ( 3 ) thereby generating a signal ( 8 ) to the control unit ( 12 ) to start recording the number of scans being performed and to the camera ( 7 ) to start integrating the light returned by the scanned products ( 6 ) towards the camera ( 7 ),

checking if the number of scans performed corresponds to a preset integer multiple of the scan time (Tw), and

if yes, processing the image or images taken, wherein the exposure time (Te) is substantially equal to an integer ratio of the scan time (Tw), i.e. Te=(n/m)×Tw with n and m integers equal to or higher than 1.

7. Method according to claim 6 , comprising the steps of:

initiating scanning of the product stream ( 3 ) thereby generating a signal ( 8 ) to the control unit ( 12 ) to start recording the number of scans being performed and to the camera ( 7 ) to start integrating the light returned by the scanned products ( 6 ) towards the camera ( 7 ), during one or more exposure times (Te),

checking if the number of scans performed corresponds to a preset integer multiple L of the scan time (Tw), i.e. the total scan time is substantially equal to L×Tw with L an integer equal to or higher than 1, and

if yes, instructing the camera ( 7 ) to stop detecting the returned light ( 6 ) and processing the image or images taken, wherein the exposure time (Te) is chosen so that the total exposure time when the detection is stopped is substantially equal to a integer multiple of said exposure time, i.e. total exposure time substantially equals K×Te with K equal to or higher than 1, so that K×Te substantially equals L×Tw.

8. Method according to claim 6 , wherein the exposure time Te is substantially equal to an integer multiple of the scan time, i.e. Te is substantially equal to n×Tw, with n an integer equal to or higher than 1.

9. Method according to claim 7 , wherein the exposure time Te is substantially equal to an integer multiple of the scan time, i.e. Te is substantially equal to n×Tw, with n an integer equal to or higher than 1.

10. Method according to claim 8 , wherein n is an integer equal to or higher than 2.

11. An apparatus for sorting products ( 13 ), comprising a transport system ( 2 ) configured to supply the products ( 3 ) in a continuous single layer stream to an inspection system ( 1 ) which is positioned towards the product stream ( 3 ) to allow analysis of individual products and a removal system ( 14 ) operatively coupled to the inspection system to remove products ( 15 ) analyzed by the inspection system ( 1 ), wherein the inspection system ( 1 ) is according to claim 1 .

12. A method for operating the sorting apparatus ( 13 ) according to claim 11 , comprising

providing the product stream ( 3 ),

initiating scanning of the product stream ( 3 ) thereby generating a signal ( 8 ) to the control unit ( 12 ) to start recording the number of scans being performed and to the camera ( 7 ) to start integrating the light returned by the scanned products ( 3 ) towards the camera ( 7 ),

checking if the number of scans performed corresponds to an integer multiple of the scan time (Tw),

if yes, processing the image or images taken, wherein the exposure time (Te) is substantially equal to an integer ratio of the scan time (Tw), i.e. Te is substantially equal to (n/m)×Tw with n and m integers equal to or higher than 1, and

on the basis of said processing, analysing and if necessary removing individual products from said product stream.

13. Method according to claim 12 , comprising the steps of:

initiating scanning of the product stream ( 3 ) thereby generating a signal ( 8 ) to the control unit ( 12 ) to start recording the number of scans being performed and to the camera ( 7 ) to start integrating the light returned by the scanned products ( 6 ) towards the camera ( 7 ), during one or more exposure times (Te),

checking if the number of scans performed corresponds to a preset integer multiple L of the scan time (Tw), i.e. the total scan time is equal to L×Tw with L an integer equal to or higher than 1, and

if yes, instructing the camera ( 7 ) to stop detecting the returned light ( 6 ) and processing the image or images taken, wherein the exposure time (Te) is chosen so that the total exposure time when the detection is stopped is a integer multiple of said exposure time, i.e. total exposure time equals K×Te with K equal to or higher than 1, so that K×Te substantially equals L×Tw

on the basis of said processing, analysing and if necessary removing individual products from said product stream.

14. Method according to claim 12 , wherein the exposure time Te is an integer multiple of the scan time, i.e. Te is substantially equal to n×Tw, with n an integer equal to or higher than 1.

15. Method according to claim 14 , wherein n is an integer equal to or higher than 2.

16. The inspection system according to claim 1 , wherein the focused light beam ( 5 ) is moved from one side of the product stream to an opposite side of the products stream during the scan time (Tw) to scan the width (W).

17. The inspection system according to claim 16 , wherein the spot size of the focused light beam ( 5 ), at least along the width, is less than the width (W).

18. The method according to claim 6 , wherein the focused light beam ( 5 ) is moved from one side of the product stream to an opposite side of the products stream during the scan time (Tw) to scan the width (W).

19. The method according to claim 18 , wherein the spot size of the focused light beam ( 5 ), at least along the width, is less than the width (W).

Assignments (2)
CHANGE OF NAME Recorded Dec 21, 2018
From: VISYS NV
To: KEY TECHNOLOGY
Reel/Frame 049134/0536 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 14, 2015
From: ADAMS, DIRK; OP DE BEECK, PIETER
To: VISYS NV
Reel/Frame 036081/0836 →
Priority Claims (1)
EP 11193106 · Dec 12, 2011 · regional
Continuity (1)
Related Publication 20140333755A1 · Nov 13, 2014