IP Library › Granted Patent US 9,939,314
Granted Patent B2
US 9,939,314 · App. 14/623,081 · Granted Apr 10, 2018

Shock recording device

Inventors: Yukihiro Kaneko (Osaka, JP); Michihito Ueda (Kyoto, JP); Yu Nishitani (Kyoto, JP)
Assignee: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
G01H11/06G01L5/0052G01P1/127G01P15/036
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Quick Facts
Patent No.
US 9,939,314
App. No.
14/623,081
Granted
Apr 10, 2018
Kind
B2
Abstract

The present invention provides a shock recording device includes: an electric power source; a vibration energy harvester including a first electrode and a second electrode, the vibration energy harvester converting an energy of a shock applied thereto into a potential difference between the first electrode and the second electrode; a first transistor including a first gate electrode, a first source electrode, and a first drain electrode, the first transistor further including a stacked structure of a ferroelectric layer and a semiconductor layer; and a second transistor including a second gate electrode, a second source electrode, and a second drain electrode. The second gate electrode is electrically connected to the first electrode. The second drain electrode is electrically connected to the electric power source. The second source electrode is electrically connected to the first gate electrode. The first source electrode is electrically connected to the second electrode.

Claims (30)

1. A shock recording device consisting of:

an electric power source;

a vibration energy harvester comprising a first electrode and a second electrode, the vibration energy harvester converting an energy of a shock applied thereto into a potential difference between the first electrode and the second electrode;

a first transistor comprising a first gate electrode, a first source electrode, and a first drain electrode, the first transistor further comprising a stacked structure of a ferroelectric layer and a semiconductor layer, the semiconductor layer being connected to the first source electrode and the first drain electrode, and disposed on the ferroelectric layer; and

a second transistor comprising a second gate electrode, a second source electrode, and a second drain electrode, wherein:

the second gate electrode is electrically connected to the first electrode of the vibration energy harvester;

the second drain electrode is electrically connected to the electric power source;

the second source electrode is electrically connected to the first gate electrode; and

the first source electrode is electrically connected to the second electrode of the vibration energy harvester.

2. The shock recording device according to claim 1 , wherein

the second transistor is a CMOS inverter.

3. A method comprising:

(a) preparing the shock recording device according to claim 1 ;

(b) measuring a resistance value between the first drain electrode and the first source electrode as a resistance value of the semiconductor layer; and

(c) determining whether or not a shock was applied to the shock recording device based on the resistance value.

4. The method according to claim 3 , wherein

a magnitude of the shock applied to the shock recording device is also determined based on the resistance value of the semiconductor layer in the step (c).

5. The method according to claim 3 , further comprising:

(z1) connecting a reset voltage generation circuit comprising a DC power source and a switch in series to the shock recording device so that one end of the DC power source and one end of the switch are electrically connected to the first drain electrode and the first gate electrode, respectively; and

(z2) turning on the switch to apply a voltage difference between the first drain electrode and the first gate electrode;

wherein the steps (z1) and (z2) are conducted before the step (a).

6. A shock recording device comprising:

an electric power source;

a vibration energy harvester comprising a first electrode and a second electrode, the vibration energy harvester converting an energy of a shock applied thereto into a potential difference between the first electrode and the second electrode;

a first transistor comprising a first gate electrode, a first source electrode, and a first drain electrode, the first transistor further comprising a stacked structure of a ferroelectric layer and a semiconductor layer, the semiconductor layer being connected to the first source electrode and the first drain electrode, and disposed on the ferroelectric layer; and

a CMOS inverter comprising a first power supply terminal, a second power supply terminal, an input terminal and an output terminal, wherein:

the input terminal is electrically connected to the first electrode of the vibration energy harvester;

the first power supply terminal is electrically connected to the electric power source;

the output terminal is electrically connected to the first gate electrode; and

the first source electrode is electrically connected to the second electrode of the vibration energy harvester.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 25, 2015
From: KANEKO, YUKIHIRO; UEDA, MICHIHITO; NISHITANI, YU
To: PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Reel/Frame 035031/0953 →
Priority Claims (1)
JP 2014-033910 · Feb 25, 2014 · national
Continuity (1)
Related Publication 20150241464A1 · Aug 27, 2015